序号 专利名 申请号 申请日 公开(公告)号 公开(公告)日 发明人
81 CHIP SUPPLY APPARATUS EP12887866.7 2012-11-07 EP2919260B1 2016-08-03 YAMASAKI Toshihiko; SHIMIZU Toshinori; OHASHI Hiroyasu; MURAI Masaki
82 TRANSFER SYSTEM, EXPOSURE APPARATUS, TRANSFER METHOD, EXPOSURE METHOD, DEVICE MANUFACTURING METHOD, AND SUCTION APPARATUS EP13859307.4 2013-11-27 EP2950329A1 2015-12-02 HARA, Hideaki

A carrier system is provided with a wafer stage (WST) which holds a mounted wafer (W) and is also movable along an XY plane, a chuck unit (153) which holds the wafer from above in a non-contact manner above a predetermined position and is vertically movable, and a plurality of vertical movement pins (140), which can support from below the wafer held by the chuck unit (153) on the wafer stage (WST) when the wafer stage (WST) is positioned at the predetermined position above and can also move vertically. Then, flatness of the wafer (W) is measured by a Z position detection system (146), and based on the measurement results, the chuck unit(153) and the vertical movement pins (140) that hold (support) the wafer (W) are independently driven.

83 SUCTION APPARATUS, CARRY-IN METHOD, CONVEYANCE SYSTEM, LIGHT EXPOSURE DEVICE, AND DEVICE PRODUCTION METHOD EP13858330.7 2013-11-27 EP2950328A1 2015-12-02 ICHINOSE, Go; IBE, Taisuke

In a carrier system, a chuck unit (153) is used to hold a placed wafer (W) from above, and vertical-motion pins (140) use suction to hold the wafer (W) from below. Then, chuck unit (153) and vertical-motion pins (140) are subsequently lowered until a bottom surface of the wafer comes into contact with a wafer table (WTB). During the lowering, the holding force exerted by chuck unit (153) and the arrangement of chuck members (124) are optimally adjusted such that, as a result of the restraint of wafer (W) by chuck unit (153) and vertical-motion pins (140), localized surplus-restraint is imparted to wafer (W), and warping does not occur.

84 CHIP SUPPLY APPARATUS EP12887866 2012-11-07 EP2919260A4 2015-10-28 YAMASAKI TOSHIHIKO; SHIMIZU TOSHINORI; OHASHI HIROYASU; MURAI MASAKI
85 ROBOT PROVIDED WITH END EFFECTOR, AND METHOD FOR OPERATING THE ROBOT EP10750632 2010-01-29 EP2408004A4 2014-08-06 HASHIMOTO YASUHIKO; YOSHIDA TETSUYA
86 Loading/unloading robot EP13187347.3 2013-10-04 EP2716416A2 2014-04-09 Ando, Hiroaki

A loading/unloading robot includes an arm unit attached to a support unit that is capable of being raised and lowered and a hand unit for conveying a loaded/unloaded object, attached to the arm unit. The support unit includes a base portion capable of revolving around a raising/lowering axis and a head portion rotatably attached to the base portion. The arm unit includes arms that are rotatably attached to the head portion. Front ends of the arms move forward and backward along a forward/backward direction that passes the head portion. The hand unit includes a loading/unloading hand rotatably attached to the arm. A center distance from the rotational axis of the head portion to the rotational axes of rear arms is shorter than a center distance from an axis of revolution of the base portion to the rotational axis of the head portion.

87 INDUSTRIAL ROBOT EP16834953.8 2016-07-25 EP3406406A1 2018-11-28 SHIRAKI, Takahiro; KITAHARA, Yasuyuki; KURIBAYASHI, Tamotsu; NAKAE, Takao; KAINO, Shigeyuki

This application is to provide an industrial robot in which a main body portion, to which the base end side of an arm is rotatably joined, can be made thin. For instance, this industrial robot is equipped with hands, on which objects-to-be-transferred are to be mounted, an arm, with which the hand is rotatably joined to the front end side thereof, and a main body portion 7, with which the base end side of the arm is rotatably joined; the main body portion 7 is provided with an elevating unit 20, to which the base end side of the arm is rotatably joined on the top surface side thereof, a housing 21, which holds the elevating unit 20 to be raised/lowered and in which at least part of the bottom end of the elevating unit 20 is housed, and an elevating mechanism 22 for raising/lowering the elevating unit 20. The elevating mechanism 22 is housed in the housing 21 such that it aligns with the elevating unit when viewed in the top-bottom direction.

88 TRANSFER SYSTEM, EXPOSURE APPARATUS, TRANSFER METHOD, EXPOSURE METHOD, DEVICE MANUFACTURING METHOD, AND SUCTION APPARATUS EP13859307 2013-11-27 EP2950329A4 2016-10-12 HARA HIDEAKI
A carrier system is provided with a wafer stage (WST) which holds a mounted wafer (W) and is also movable along an XY plane, a chuck unit (153) which holds the wafer from above in a non-contact manner above a predetermined position and is vertically movable, and a plurality of vertical movement pins (140), which can support from below the wafer held by the chuck unit (153) on the wafer stage (WST) when the wafer stage (WST) is positioned at the predetermined position above and can also move vertically. Then, flatness of the wafer (W) is measured by a Z position detection system (146), and based on the measurement results, the chuck unit(153) and the vertical movement pins (140) that hold (support) the wafer (W) are independently driven.
89 MULTIFUNCTION WAFER AND FILM FRAME HANDLING SYSTEM EP13832999 2013-09-02 EP2891173A4 2016-03-30 JIN JIAN PING; LEE LENG KHEAM
A wafer table structure providing a single wafer table surface suitable for handling both wafers and film frames includes a base tray having a set of compartments formed therein by way of a set of ridges formed in or on an interior base tray surface; a hardenable fluid permeable compartment material disposed within the set of base tray compartments; and a set of openings formed in the base tray interior surface by which the hardened compartment material is exposable to negative or positive pressures. The base tray includes a first ceramic material (e.g., porcelain), and the hardenable compartment material includes a second ceramic material. The base tray and the compartment material are simultaneously machinable by way of a standard machining process to thereby planarize exposed outer surfaces of the base tray and the hardened compartment material at an essentially identical rate for forming a highly or ultra-planar wafer table surface.
90 SYSTEM AND METHOD FOR AUTOMATICALLY CORRECTING FOR ROTATIONAL MISALIGNMENT OF WAFERS ON FILM FRAMES EP13833578 2013-09-02 EP2891174A4 2016-03-02 LIN JING
A wafer table structure providing a single wafer table surface suitable for handling both wafers and film frames includes a base tray having a set of compartments formed therein by way of a set of ridges formed in or on an interior base tray surface; a hardenable fluid permeable compartment material disposed within the set of base tray compartments; and a set of openings formed in the base tray interior surface by which the hardened compartment material is exposable to negative or positive pressures. The base tray includes a first ceramic material (e.g., porcelain), and the hardenable compartment material includes a second ceramic material. The base tray and the compartment material are simultaneously machinable by way of a standard machining process to thereby planarize exposed outer surfaces of the base tray and the hardened compartment material at an essentially identical rate for forming a highly or ultra-planar wafer table surface.
91 ACCOMMODATING CONTAINER, SHUTTER OPENING AND CLOSING UNIT FOR ACCOMMODATING CONTAINER, AND WAFER STOCKER USING SAME EP13778995 2013-04-10 EP2840599A4 2015-11-18 SAKIYA FUMIO; SAKATA KATSUNORI
Provided is a wafer stocker that can prevent the inflow of an external atmosphere, maintain a wafer storage space at a desired atmosphere with a relatively small amount of gas, and prevent dust from being attached to a wafer surface. A shutter portion, including multiple shield plates having the same height as an interval between shelf plates disposed in a storage container, is disposed with a slight space from a body portion, and by supplying clean gas into the storage container, a clean atmosphere of a higher pressure than an external environment is maintained, and a shutter portion is opened and closed by moving up and down the shield plate independently from the shelf plate that supports a wafer.
92 APPARATUS AND METHODS FOR RETICLE HANDLING IN AN EUV RETICLE INSPECTION TOOL EP13769488 2013-03-25 EP2831673A4 2015-11-11 CHILESE FRANCIS CHARLES; POHLMANN ULRICH; WOLTER DETLEF; WALSH JOSEPH FLEMING
Systems and methods to control particle generation in a reticle inspection system are presented. The number of particles added to a reticle during an entire load-inspect-unload sequence of a reticle inspection system is reduced by performing all reticle contact events in a controlled, flowing air environment. In one embodiment, the reticle is fixed to a carrier by clamping outside of the vacuum environment, and the carrier, rather than the reticle, is coupled to the reticle stage of the inspection system. In this manner, the high levels of back-side particulation associated with electrostatic chucking are avoided. In addition, the carrier is configured to be coupled to the reticle stage in any of four different orientations separated by ninety degrees.
93 END-EFFECTOR DEVICE EP13868539.1 2013-12-25 EP2940723A1 2015-11-04 HASHIMOTO, Yasuhiko; FUKUSHIMA, Takayuki; KANAMARU, Ryosuke; MIYAGAWA, Daiki

The end effector device (1) includes a hand (3) having a storing space, and a plurality of holding portions (4A, 4B) provided to the hand (3) and configured to respectively peripheral portions of each plate member. Each holding portion (4A, 4B) includes a plurality of receiving portions (42) which respectively receive a plurality of plate members keeping vertical pitches among them, and a pitch changing mechanism (7) configured to change intervals by vertically moving the plurality of receiving portions (42) respectively. A plurality of linearly moving portions (41A) configured to respectively move linearly integrally with the plurality of receiving portions (42) are provided to the hand (3) being exposed outside of the hand (3), and a plurality of drive portions configured to drive the plurality of linearly moving portions (41A) of the pitch changing mechanism (7) are stored in the storing space of the hand (3).

94 SUBSTRATE PROCESSING APPARATUS AND RESIST REMOVING UNIT EP15160453.5 2015-03-24 EP2924720A1 2015-09-30 Kobayashi, Kenichi; Sekimoto, Masahiko; Yokohama, Toshio; Akazawa, Kenichi; Kurashina, Keiichi; Mitsuya, Takashi

A substrate processing apparatus capable of inhibiting diffusion of a chemical solution atmosphere around a processing bath. The substrate processing apparatus has a processing bath for storing a substrate holder holding a substrate and for processing the substrate, a lifter configured to support the substrate holder, store the substrate holder in the processing bath, and take out the substrate holder from the processing bath, and a cover configured to cover the periphery of the substrate holder taken out from the processing bath by the lifter.

95 CHIP SUPPLY APPARATUS EP12887866.7 2012-11-07 EP2919260A1 2015-09-16 YAMASAKI Toshihiko; SHIMIZU Toshinori; OHASHI Hiroyasu; MURAI Masaki

In this specification, a chip supplying apparatus which supplies a chip to a mounting machine which mounts the chip on a substrate is disclosed. The chip supplying apparatus is provided with a wafer table which holds a wafer sheet at a position where an operation head of the mounting machine can receive the chip. In the chip supplying apparatus, the wafer table is provided with a frame, a stopper which is fixed to the center of a front portion of the frame and abuts against a front end of the wafer sheet, and a pair of clamp mechanisms which is supported by the frame and which clamps both side ends of the wafer sheet. In the chip supplying apparatus, a position of the pair of clamp mechanisms in a right-and-left direction with respect to the frame can be changed in multiple steps.

96 SYSTEM AND METHOD FOR AUTOMATICALLY CORRECTING FOR ROTATIONAL MISALIGNMENT OF WAFERS ON FILM FRAMES EP13833578.1 2013-09-02 EP2891174A1 2015-07-08 LIN, Jing
A wafer table structure providing a single wafer table surface suitable for handling both wafers and film frames includes a base tray having a set of compartments formed therein by way of a set of ridges formed in or on an interior base tray surface; a hardenable fluid permeable compartment material disposed within the set of base tray compartments; and a set of openings formed in the base tray interior surface by which the hardened compartment material is exposable to negative or positive pressures. The base tray includes a first ceramic material (e.g., porcelain), and the hardenable compartment material includes a second ceramic material. The base tray and the compartment material are simultaneously machinable by way of a standard machining process to thereby planarize exposed outer surfaces of the base tray and the hardened compartment material at an essentially identical rate for forming a highly or ultra-planar wafer table surface.
97 MULTIFUNCTION WAFER AND FILM FRAME HANDLING SYSTEM EP13832999.0 2013-09-02 EP2891173A1 2015-07-08 JIN, Jian Ping; LEE, Leng Kheam
A wafer table structure providing a single wafer table surface suitable for handling both wafers and film frames includes a base tray having a set of compartments formed therein by way of a set of ridges formed in or on an interior base tray surface; a hardenable fluid permeable compartment material disposed within the set of base tray compartments; and a set of openings formed in the base tray interior surface by which the hardened compartment material is exposable to negative or positive pressures. The base tray includes a first ceramic material (e.g., porcelain), and the hardenable compartment material includes a second ceramic material. The base tray and the compartment material are simultaneously machinable by way of a standard machining process to thereby planarize exposed outer surfaces of the base tray and the hardened compartment material at an essentially identical rate for forming a highly or ultra-planar wafer table surface.
98 INTERFACING WITH A MOBILE TELEPRESENCE ROBOT EP12738731.4 2012-01-27 EP2668008A2 2013-12-04 WANG, Yulun; JORDAN, Charles S.; WRIGHT, Tim; CHAN, Michael; PINTER, Marco; HANRAHAN, Kevin; SANCHEZ, Daniel; BALLANTYNE, James; HERZOG, Cody; WHITNEY, Blair; LAI, Fuji; TEMBY, Kelton; RAUHUT, Eben Christopher; KEARNS, Justin H.; WONG, Cheuk Wah; FARLOW, Timothy Sturtevant
A telepresence robot may include a drive system, a control system, an imaging system, and a mapping module. The mapping module may access a plan view map of an area and tags associated with the area. In various embodiments, each tag may include tag coordinates and tag information, which may include a tag annotation. A tag identification system may identify tags within a predetermined range of the current position and the control system may execute an action based on an identified tag whose tag information comprises a telepresence robot action modifier. The telepresence robot may rotate an upper portion independent from a lower portion. A remote terminal may allow an operator to control the telepresence robot using any combination of control methods, including by selecting a destination in a live video feed, by selecting a destination on a plan view map, or by using a joystick or other peripheral device.
99 SUBSTRATE PROCESSING TOOL PCT/US2012028790 2012-03-12 WO2012125572A4 2013-10-03 GILCHRIST ULYSSES; CAVENEY ROBERT T; KRISHNASAMY JAYARAMAN; DREW MITCHELL; MOURA JAIRO T
A substrate processing apparatus including a frame, a first SCARA arm connected to the frame, including an end effector, configured to extend and retract along a first radial axis; a second SCARA arm connected to the frame, including an end effector, configured to extend and retract along a second radial axis, the SCARA arms having a common shoulder axis of rotation; and a drive section coupled to the SCARA arms is configured to independently extend each SCARA arm along a respective radial axis and rotate each SCARA arm about the common shoulder axis of rotation where the first radial axis is angled relative to the second radial axis and the end effector of a respective arm is aligned with a respective radial axis, wherein each end effector is configured to hold at least one substrate and the end effectors are located on a common transfer plane.
100 SUBSTRATE PROCESSING TOOL PCT/US2012028790 2012-03-12 WO2012125572A3 2013-07-04 GILCHRIST ULYSSES; CAVENEY ROBERT T; KRISHNASAMY JAYARAMAN; DREW MITCHELL; MOURA JAIRO T
A substrate processing apparatus including a frame, a first SCARA arm connected to the frame, including an end effector, configured to extend and retract along a first radial axis; a second SCARA arm connected to the frame, including an end effector, configured to extend and retract along a second radial axis, the SCARA arms having a common shoulder axis of rotation; and a drive section coupled to the SCARA arms is configured to independently extend each SCARA arm along a respective radial axis and rotate each SCARA arm about the common shoulder axis of rotation where the first radial axis is angled relative to the second radial axis and the end effector of a respective arm is aligned with a respective radial axis, wherein each end effector is configured to hold at least one substrate and the end effectors are located on a common transfer plane.
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