首页 / 专利库 / 微电子学 / 外延生长 / 异质外延 / Method of manufacturing aluminium nitride crystals for semiconductor devices

Method of manufacturing aluminium nitride crystals for semiconductor devices

阅读:522发布:2022-07-03

专利汇可以提供Method of manufacturing aluminium nitride crystals for semiconductor devices专利检索,专利查询,专利分析的服务。并且A method of forming aluminum nitride single crystals of large area and silicon carbide-aluminum nitride heterojunctions using a modified Lely method. Aluminum nitride is introduced, as a vapor phase, into a furnace containing a plate-shaped monocrystal of silicon carbide at a temperature between 1800* and 2300* C. At those temperatures, aluminum nitride recrystallizes and condenses to deposit epitaxially on the silicon carbide. If the silicon carbide is of one conductivity type, the aluminum nitride can be suitably doped to be of the opposite conductivity type whereby a heterojunction is formed.,下面是Method of manufacturing aluminium nitride crystals for semiconductor devices专利的具体信息内容。

  • 2. A method as set forth in claim 1 wherein the silicon carbide monocrystal is provided by growing in the same chamber by recrystallization and condensation within a space bounded by silicon carbide and at a temperature of approximately 2,500* C.
  • 3. A method as set forth in claim 1 for the growth of aluminum nitride crystals wherein the temperature is between 1,800* and 2, 100* C.
  • 4. A method as set forth in claim 1 for the growth of mixed crystals of silicon carbide and aluminum nitride wherein the temperature is between 2,100* and 2,300* C.
  • 5. A method as set forth in claim 1 wherein the gas atmosphere includes an inert gas-containing acceptor or donor impurities for the aluminum nitride.
  • 6. A method as set forth in claim 1 wherein the silicon carbide crystal is separated from the aluminum nitride epitaxial layer.
  • 说明书全文
    高效检索全球专利

    专利汇是专利免费检索,专利查询,专利分析-国家发明专利查询检索分析平台,是提供专利分析,专利查询,专利检索等数据服务功能的知识产权数据服务商。

    我们的产品包含105个国家的1.26亿组数据,免费查、免费专利分析。

    申请试用

    分析报告

    专利汇分析报告产品可以对行业情报数据进行梳理分析,涉及维度包括行业专利基本状况分析、地域分析、技术分析、发明人分析、申请人分析、专利权人分析、失效分析、核心专利分析、法律分析、研发重点分析、企业专利处境分析、技术处境分析、专利寿命分析、企业定位分析、引证分析等超过60个分析角度,系统通过AI智能系统对图表进行解读,只需1分钟,一键生成行业专利分析报告。

    申请试用

    QQ群二维码
    意见反馈