首页 / 专利库 / 微电子学 / 自对准硅化物 / Manufacture of semiconductor device

Manufacture of semiconductor device

阅读:881发布:2022-01-19

专利汇可以提供Manufacture of semiconductor device专利检索,专利查询,专利分析的服务。并且PURPOSE:To form CMOS using homopolar poly Si easily by a method wherein the metallic silicide is formed on the N type poly Si wiring provided on the P type diffused layer of CMOS to make this metallic silicide react to the said N type poly Si. CONSTITUTION:An N type Si is used as a gate electrode 103 and a wiring layer 104 of both the N channel MOS and P channel MOS formed on an N type Si substrate 101 and the metal 108 such as Ni and the like is provided on the section where the said N type poly Si is in contact with the P type diffused layer 107 to perform the heat treatment for 120min at 400 deg.C in the N2 atmosphere making the said metal 108 react to the N type poly Si 104 to be in ohmic contact with each other forming the said metal silicide. Through these procedures, the contact self alignment process may be utilized to form the microstructure easily when CMOS is formed using the synchronous polarity Si.,下面是Manufacture of semiconductor device专利的具体信息内容。

高效检索全球专利

专利汇是专利免费检索,专利查询,专利分析-国家发明专利查询检索分析平台,是提供专利分析,专利查询,专利检索等数据服务功能的知识产权数据服务商。

我们的产品包含105个国家的1.26亿组数据,免费查、免费专利分析。

申请试用

分析报告

专利汇分析报告产品可以对行业情报数据进行梳理分析,涉及维度包括行业专利基本状况分析、地域分析、技术分析、发明人分析、申请人分析、专利权人分析、失效分析、核心专利分析、法律分析、研发重点分析、企业专利处境分析、技术处境分析、专利寿命分析、企业定位分析、引证分析等超过60个分析角度,系统通过AI智能系统对图表进行解读,只需1分钟,一键生成行业专利分析报告。

申请试用

QQ群二维码
意见反馈