首页 / 国际专利分类库 / 物理 / 摄影术;电影术;电记录术;全息摄影术 / 图纹面的照相制版工艺,例如,印刷工艺、半导体器件的加工工艺;其所用材料;其所用原版;其所用专用设备 / 图纹面,例如,印刷表面的照相制版如光刻工艺;图纹面照相制版用的材料,如:含光致抗蚀剂的材料;图纹面照相制版的专用设备(用于特殊工艺的光致抗蚀剂结构见相关的位置,例如,B44C,H01L,例如,H01L21/00,H05K)
序号 专利名 申请号 申请日 公开(公告)号 公开(公告)日 发明人
201 RESIN COMPOSITION AND OPTICAL FILM USING SAME US15766262 2016-10-14 US20180305537A1 2018-10-25 Kenji HARA; Masatomi IRISAWA
Provided are: a resin composition which has excellent transparency and coating properties and exhibits low liquid crystal-contaminating properties; and an optical film using the same. The resin composition contains a polyvinyl alcohol and a polyester, and the polyester has a carboxyl group and/or a carboxyl group salt as a substituent(s). The polyvinyl alcohol is preferably a homopolymer or a copolymer that contains vinyl alcohol as an essential monomer, and it is preferred that the polyvinyl alcohol has an acetoacetate group.
202 Systems and Methods for Optimizing Focus for Imaging-Based Overlay Metrology US15574294 2017-09-14 US20180292198A1 2018-10-11 Amnon Manassen; Andrew Hill
Methods and systems for focusing and measuring by mean of an interferometer device, having an optical coherence tomography (OCT) focusing system, by separately directing an overlapped measurement and reference wavefront towards a focus sensor and towards an imaging sensor; where a predefined focusing illumination spectrum of the overlapped wavefront is directed towards the focus sensor, and where a predefined measurement illumination spectrum of the overlapped wavefront is directed towards the imaging sensor. Methods and systems for maintaining focus of an interferometer device, having an OCT focusing system, during sample's stage moves.
203 HEAT EXCHANGER US15478399 2017-04-04 US20180283810A1 2018-10-04 Sergey Mironets; Vijay Narayan Jagdale; Colette O. Fennessy
A method of manufacturing a component susceptible to multiple failure modes includes generating a stereolithography file including a geometry of the component. The geometry of the stereolithography file is divided into a plurality of layers. Each of the layers includes a first portion and a second portion of the component. Energy from an energy source is applied to a powdered material such that the powdered material fuses to form the first portion and the second portion of each of the plurality of layers. Applying energy from the energy source to form the first portion of the plurality of layers includes operating the energy source with a first set of parameters and applying energy from the energy source to form the second portion of the plurality of layers includes operating the energy source with a second set of parameters. The first set and second set of parameters are different.
204 METHODS AND APPARATUSES FOR ETCH PROFILE OPTIMIZATION BY REFLECTANCE SPECTRA MATCHING AND SURFACE KINETIC MODEL OPTIMIZATION US15972063 2018-05-04 US20180260509A1 2018-09-13 Mehmet Derya Tetiker; Saravanapriyan Sriraman; Andrew D. Bailey, III; Alex Paterson; Richard A. Gottscho
Disclosed are methods of optimizing a computer model which relates the etch profile of a feature on a semiconductor substrate to a set of independent input parameters (A), via the use of a plurality of model parameters (B). In some embodiments, the methods may include modifying one or more values of B so as to reduce a metric indicative of the differences between computed reflectance spectra generated from the model and corresponding experimental reflectance spectra with respect to one or more sets of values of A. In some embodiments, calculating the metric may include an operation of projecting the computed and corresponding experimental reflectance spectra onto a reduced-dimensional subspace and calculating the difference between the reflectance spectra as projected onto the subspace. Also disclosed are etch systems implementing such optimized computer models.
205 Methods and systems for spectroscopic beam profile metrology having a first two dimensional detector to detect collected light transmitted by a first wavelength dispersive element US14960121 2015-12-04 US10072921B2 2018-09-11 Jiyou Fu; Noam Sapiens; Kevin A. Peterlinz; Stilian Ivanov Pandev
A spectroscopic beam profile metrology system simultaneously detects measurement signals over a large wavelength range and a large range of angles of incidence (AOI). In one aspect, a multiple wavelength illumination beam is reshaped to a narrow line shaped beam of light before projection onto a specimen by a high numerical aperture objective. After interaction with the specimen, the collected light is passes through a wavelength dispersive element that projects the range of AOIs along one direction and wavelength components along another direction of a two-dimensional detector. Thus, the measurement signals detected at each pixel of the detector each represent a scatterometry signal for a particular AOI and a particular wavelength. In another aspect, a hyperspectral detector is employed to simultaneously detect measurement signals over a large wavelength range, range of AOIs, and range of azimuth angles.
206 SURFACE TREATMENT METHOD AND SURFACE TREATMENT LIQUID US15909183 2018-03-01 US20180254182A1 2018-09-06 Yuriko SHIRAI; Daijiro MORI; Akira KUMAZAWA
To provide a surface treatment method capable of highly hydrophobizing (silylating) a surface of a treatment target while deterioration of polyvinyl chloride is suppressed when surface treatment of the treatment target such as an inorganic pattern and a resin pattern is carried out using a device having a liquid contact portion provided with a member made of polyvinyl chloride, and also provide a surface treatment liquid suitably used for the surface treatment method. A surface treatment liquid used for the surface treatment method includes a silylating agent (A) and a solvent (S), the silylating agent (A) does not have an alkoxy group bonded to a silicon atom, and the solvent (S) does not have a hydroxyl group bonded to a carbon atom. A value of dH in Hansen solubility parameters (HSP) in the solvent (S) is 3.2 MPa1/2 or less or 10.5 MPa1/2 or more. Relative Energy Difference represented by Ra/R0 is 1.2 or more, where the interaction radius of polyvinyl chloride in the Hansen space is defined as R0 and a distance between the HSP of the polyvinyl chloride and HSP of the solvent (S) is defined as Ra.
207 PHOTOSENSITIVE RESIN COMPOSITION FOR RELIEF PRINTING ORIGINAL PLATE AND RELIEF PRINTING ORIGINAL PLATE OBTAINED THEREFROM US15754398 2016-08-02 US20180236804A1 2018-08-23 Kazuya Yoshimoto; Atsushi Tatsuyama; Jun Hasuike
The present invention provides a photosensitive resin composition for a relief printing original plate which can achieve both of a printing reproducibility of gradation of a highlight part and a printing durability, and can further achieve a low plate surface tackiness. A photosensitive resin composition for a relief printing original plate containing water-soluble or water-dispersible polyamide, a photopolymerizable unsaturated compound and a photopolymerization initiator as essential ingredients, characterized in that a total of a content of an alicyclic structural unit obtained from diamine and a content of an alicyclic structural unit obtained from dicarboxylic acid in the polyamide is 30 to 90 molar %, and the content of the alicyclic structural unit obtained from dicarboxylic acid in the polyamide is 20 molar % or more.
208 Porosity measurement of semiconductor structures US15582331 2017-04-28 US10041873B2 2018-08-07 Shankar Krishnan
Methods and systems for performing optical measurements of the porosity of geometric structures filled with a fill material by a capillary condensation process are presented herein. Measurements are performed while the structure under measurement is treated with a flow of purge gas that includes a controlled amount of vaporized fill material. A portion of the fill material condenses and fills openings in the structural features such as pores of a planar film, spaces between structural features, small volumes such as notches, trenches, slits, contact holes, etc. In one aspect, the desired degree of saturation of vaporized material in the gaseous flow is determined based on the maximum feature size to be filled. In another aspect, measurement data is collected when a structure is unfilled and when the structure is filled. The collected data is combined in a multi-target model based measurement to estimate values of porosity and critical dimensions.
209 PHOTOCURABLE RESIN COMPOSITION AND METHOD OF FORMING PATTERNS USING THE SAME US15312883 2016-10-05 US20180215850A1 2018-08-02 Hyung-Jong LEE; Nam Seob BAEK; Jonghwi LEE; Yun Jung SEO; Hyun Jin YOO
The present invention relates to a photocurable resin composition usable in a nanoimprint process which is capable of overcoming low productivity of conventional semiconductor processes for optical devices and electronic devices, and a method of forming patterns using the same. Specifically, the present invention relates to a photocurable resin composition including a specific perfluorinated acrylic compound for improving release property between a nanoimprint mold and the photocurable resin composition, and a method of forming patterns using the same.
210 Guide pattern data correcting method, pattern forming method, and computer readable record medium US15377472 2016-12-13 US10019547B2 2018-07-10 Hiroki Yonemitsu
According to one embodiment, a guide pattern data correcting method is for correcting guide pattern data of a physical guide for formation of a polymer material to be microphase-separated. The physical guide has a plurality of concave portions in the guide pattern data, and at least two concave portions out of the plurality of concave portions are connected to each other. The guide pattern data is subjected to correction by shifting or rotation of at least either of the two connected concave portions.
211 FLEXOGRAPHIC PRINTING PLATE US15904894 2018-02-26 US20180186161A1 2018-07-05 Seiichiro MORIKAWA; Yusuke NAMBA
An object of the present invention is to provide a flexographic printing plate having excellent ink transferability in a solid portion and the like and having good printing quality in a halftone portion. The flexographic printing plate of the present invention is a flexographic printing plate having a relief layer including a non-image area and an image area, in which the image area has a halftone dot portion having a halftone dot area ratio of more than 0% and less than 100%, and a solid portion having a halftone dot area ratio of 100%, small dots in the halftone dot portion and the solid portion or small dots in the halftone dot portion have two or more recessed portions having different depths according to a halftone dot area ratio, and the two or more recessed portions having different depths are recessed portions whose depth becomes deeper as the halftone dot area ratio increases.
212 MEMBRANE BONDING WITH PHOTORESIST US15902570 2018-02-22 US20180179053A1 2018-06-28 Andrew Joyce; Sean Taffler; Paul Reynolds; Nicholas Lavada Nemeth; Adam Stephen Elhadad; Boozarjomehr Faraji
Systems and techniques are provided for membrane bonding. A photoresist may be applied to an ultrasonic device. A portion of the photoresist may be removed. A bonding agent may be applied a portion of the photoresist that is not removed. A membrane may be placed on the ultrasonic device such that the membrane is in contact with the ultrasonic device through the bonding agent and the photoresist. The membrane and the ultrasonic device may be placed in between a first flat plate and a second flat plate, such that the second flat plate rests on top of the membrane. Light pressure may be applied to the membrane. The light pressure may be applied by one or more of the weight of the second flat plate and a pressure providing device applying pressure to either or both of the first flat plate and the second flat plate.
213 Resist Having Tuned Interface Hardmask Layer For EUV Exposure US15825250 2017-11-29 US20180166277A1 2018-06-14 Michael P. Belyansky; Ravi K. Bonam; Anuja Desilva; Scott Halle
A method is disclosed to prepare a substrate for photolithography. The method includes forming an underlayer over a surface of the substrate; depositing an interface hardmask layer on the underlayer using one of a vapor phase deposition process or an atomic layer deposition process; and forming a layer of extreme UV (EUV) resist on the interface hardmask layer, where the interface hardmask layer is comprised of material having a composition and properties tuned to achieve a certain secondary electron yield from the interface hardmask layer. Also disclosed is a structure configured for photolithography. The structure includes a substrate; an underlayer over a surface of the substrate; an interface hardmask layer disposed on the underlayer; and a layer of EUV resist disposed on the interface hardmask layer. The interface hardmask layer contains material having a composition and properties tuned to achieve a certain secondary electron yield from the interface hardmask layer.
214 INTEGRATED CASTING CORE-SHELL STRUCTURE WITH PRINTED TUBES FOR MAKING CAST COMPONENT US15377673 2016-12-13 US20180161852A1 2018-06-14 Michael John MCCARREN; James Herbert DEINES; Xi YANG; Brian David PRZESLAWSKI
The present disclosure generally relates to integrated core-shell investment casting molds that provide filament structures corresponding to cooling hole patterns on the surface of the turbine blade or stator vane, which provide a leaching pathway for the core portion after metal casting. The invention also relates to core filaments that can be used to supplement the leaching pathway, for example in a core tip portion of the mold.
215 PLANOGRAPHIC PRINTING PLATE PRECURSOR AND PLATE-MAKING METHOD US15882019 2018-01-29 US20180154671A1 2018-06-07 Takeshi INASAKI; Hiroaki IDEI; Atsuyasu NOZAKI
A planographic printing plate precursor includes: a support; and an image recording layer on the support, and the image recording layer contains a polymer having any group selected from a sulfonamide group, an amide group, an imide group and a carbonate group in a main chain and having a group represented by the following Formula (1): X—Ran  (1) wherein X represents a single bond or an oxygen atom, Ra represents an alkylene group having 6 to 40 carbon atoms in a case where X represents a single bond and Ra represents an alkylene group having 2 to 20 carbon atoms in a case where X represents an oxygen atom, and n represents an integer of 1 to 90
216 Post exposure processing apparatus US15435007 2017-02-16 US09964863B1 2018-05-08 Viachslav Babayan; Ludovic Godet; Kyle M. Hanson; Robert B. Moore
Implementations described herein relate to apparatus for post exposure processing. More specifically, implementations described herein relate to field-guided post exposure process chambers and cool down/development chambers used on process platforms. In one implementation, a plurality of post exposure process chamber and cool/down development chamber pairs are positioned on a process platform in a stacked arrangement and utilize a shared plumbing module. In another implementation, a plurality of post exposure process chamber and cool down/development chambers are positioned on a process platform in a linear arrangement and each of the chambers utilize an individually dedicated plumbing module.
217 WALLET-SIZED COMB US15822277 2017-11-27 US20180070697A1 2018-03-15 Heather Burkman
A wallet-sized comb is produced by a method of processing a metal substrate having a thickness similar to a credit card. The method includes receiving a comb design including a top portion and a teeth portion, the teeth portion including a plurality of spaced-apart teeth for combing hair and cutting the metal substrate based on the comb design, the cutting performed using a chemical etching technique, where the metal substrate has a thickness at or below 1.2 millimeter. The method further includes extracting a metal comb from the metal substrate generated from the chemical etching technique and de-burring the metal comb, as well as applying a powder coat finish to the metal comb to generate the wallet comb. The comb design may include a design and/or letters in the top portion, such top portion elements cut also using the chemical etching process.
218 FLEXO PRINTING PLATE US15789606 2017-10-20 US20180056699A1 2018-03-01 Hiroshi TASHIRO
Provided is a flexo printing plate which makes it possible to perform printing in which the discontinuity of density is not visually recognized by inhibiting the enlargement of halftone dots in the boundary between an image area having a low halftone dot rate and a non-image area. The flexo printing plate has a constitution in which the image area has a highlight halftone dot area having a halftone dot rate higher than 0% and equal to or lower than 10%, and within the highlight halftone dot area, among small dots constituting the highlight halftone dot area, at least one of the small dots adjacent to the non-image area that continues 10 mm or further from the edge of the highlight halftone dot area in a direction orthogonal to the edge has a distal end diameter smaller than the average of distal end diameters of the small dots in the highlight halftone dot area.
219 Reference Image Contour Generation US15285925 2016-10-05 US20180053291A1 2018-02-22 Weimin Ma; Zongqiang Yu
A method for reference image contour generation includes generating a mask pattern based on design target information, generating a reference image based on a simulation of photolithographic effects on the mask pattern, generating a reference image contour pattern based on edge detection in the reference image, and generating a scanned image contour pattern as a function of the reference image contour pattern and a scanned image of an integrated circuit.
220 RESIN COMPOSITION FOR FORMING A PHASE-SEPARATED STRUCTURE, AND METHOD OF PRODUCING STRUCTURE CONTAINING PHASE-SEPARATED STRUCTURE US15185899 2016-06-17 US20170362460A1 2017-12-21 Akiya KAWAUE; Takehiro SESHIMO; Takaya MAEHASHI; Tasuku MATSUMIYA; Ken MIYAGI; Hitoshi YAMANO; Xuanxuan CHEN; Paul Franklin NEALEY
A resin composition for forming a phase-separated structure, including: a block copolymer, and an ion liquid containing a compound (IL) having a cation moiety and an anion moiety, the energy of the LUMO of the cation moiety being −4.5 eV or more, and the energy difference between the LUMO and the HOMO of the cation moiety being 10.0 ev or more, or the Log P value of the anion moiety being 1 to 3.
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