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Junction field effect transistor

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专利汇可以提供Junction field effect transistor专利检索,专利查询,专利分析的服务。并且PURPOSE: To increase withstanding voltage easily by forming a low concentration channel region between a source and a drain regions.
CONSTITUTION: An N-type silicon epitaxial layer 21 as a semiconductor layer is formed on a sapphire substrate 20, and then boron and phosphor diffusion processes are executed to form P
+ high concentration diffusion regions 23 and 25 for source and drain electrodes and an N
+ high concentration diffusion region 24 for a gate electrode. After that, a low concentration channel region layer 22 is formed by implanting boron ions using a photoresist mask via a silicon oxide film formed by heat oxidation. Further, the entire surface of the wafer is covered with a silicon dioxide film to protect the surface and the wafer is annealed in a nitrogen atmosphere to activate the implanted ions. Finally, contact holes are made in the source, gate and drain diffusion regions 23, 24 and 25 respectively and aluminium wiring 27 is applied.
COPYRIGHT: (C)1980,JPO&Japio,下面是Junction field effect transistor专利的具体信息内容。

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