Semiconductor device

阅读:289发布:2023-03-16

专利汇可以提供Semiconductor device专利检索,专利查询,专利分析的服务。并且PURPOSE: To improve the high frequency characteristics of a semiconductor device by surrounding the bottom and side surfaces of electrode connecting wires by insulator to reduce the gate input capacity of a JFET.
CONSTITUTION: Ion is implanted to N-type silicon substrate 11, P
+ type layer 21 and N epitaxial layer 23 are laminated thereon, and Si
3 N
4 mask 25 is added thereto. Then, it is immersed in 49% HF aqueous solution, and anodized under light illumination to alter the layers 23, 21 to porous silicon 26. When the mask 25 is removed, channel forming N-type layer 14 and gate electrode connecting wire layer forming N-type layers 14a, 14b are formed with the side and bottom surfaces surrounded by porous silicon 26. Then, it is wet oxidized to alter the layer 26 to SiO
2 layers 12, 13. Then, N
+ type layers 15, 16 are formed to laminate P
+ type gate layer 17, wiring layers 17a, 17b are laminated on the layers 14, 14a, 14b. Finally, the gate layer 17 and the gate electrode connecting layers 17a, 17b are connected by aluminum wire 19. According to this configuration, the capacities of the N-type layer 14 and the substrate 11 are very low since SiO
2 is interposed so that the gate input capacity is the sum of the connecting capacity of the P
+ type layer 17 and N-type layer 14 and the floating capacity of the circuit to thereby obtain preferable high frequency semiconductor device.
COPYRIGHT: (C)1980,JPO&Japio,下面是Semiconductor device专利的具体信息内容。

高效检索全球专利

专利汇是专利免费检索,专利查询,专利分析-国家发明专利查询检索分析平台,是提供专利分析,专利查询,专利检索等数据服务功能的知识产权数据服务商。

我们的产品包含105个国家的1.26亿组数据,免费查、免费专利分析。

申请试用

分析报告

专利汇分析报告产品可以对行业情报数据进行梳理分析,涉及维度包括行业专利基本状况分析、地域分析、技术分析、发明人分析、申请人分析、专利权人分析、失效分析、核心专利分析、法律分析、研发重点分析、企业专利处境分析、技术处境分析、专利寿命分析、企业定位分析、引证分析等超过60个分析角度,系统通过AI智能系统对图表进行解读,只需1分钟,一键生成行业专利分析报告。

申请试用

QQ群二维码
意见反馈