专利汇可以提供Semiconductor electronic device专利检索,专利查询,专利分析的服务。并且PURPOSE: To realize the miniature and high-performance circuit element by drawing out plural number of electrodes close to each other through one small hole provided to the insulator film on the surface of the semiconductor substrate and at the same time securing an automatic setting of the inner region's position and the electrode's contact position via the hole edge.
CONSTITUTION: SiO
2 2 and poly Si electrode layer 3a are laminated on substrate 1 and the opening is drilled by etching in order to form the eaves part. Then poly Si3b is laminated to be left only at the lower part of the eaves through the ion milling process. The oxidation is then given to form a thick oxide film over Si3b, and then hydrofluoric acid treatment is given to form selectively SiO
2 film on film 3a and 3b by the difference of the etching speeds. Then the heat treatment is given to form by diffusion p
+ -collector connection layer 14 from the electrode layer through part of p-layer 6. Thus, layer 14 is formed over the entire circumference with automatic setting via the opening and with an extremely small width with no use of the mask. The base diffusion with the collector is possible with just one sheet of the mask and using film 5 used as the master. Thus, the manufacture can be facilitated with a miniature structure as well as reduced serial resistance parasitic capacity.
COPYRIGHT: (C)1979,JPO&Japio,下面是Semiconductor electronic device专利的具体信息内容。
标题 | 发布/更新时间 | 阅读量 |
---|---|---|
绝缘体上半导体结构以及制备方法 | 2020-05-08 | 674 |
半导体器件及其制造方法 | 2020-05-08 | 571 |
用于管腔内超声成像换能器的埋入式沟槽以及相关的设备、系统和方法 | 2020-05-08 | 813 |
用于制备用于微组装的GaN及相关材料的系统及方法 | 2020-05-08 | 48 |
绝缘体上半导体元器件及其制造方法 | 2020-05-08 | 670 |
电容性微结构 | 2020-05-08 | 606 |
带有梳状传输线的单片电光调制器 | 2020-05-08 | 963 |
半导体装置 | 2020-05-11 | 961 |
一种基于压电材料的压力传感器及制备方法 | 2020-05-11 | 184 |
硅基光耦合结构、硅基单片集成光器件 | 2020-05-12 | 63 |
高效检索全球专利专利汇是专利免费检索,专利查询,专利分析-国家发明专利查询检索分析平台,是提供专利分析,专利查询,专利检索等数据服务功能的知识产权数据服务商。
我们的产品包含105个国家的1.26亿组数据,免费查、免费专利分析。
专利汇分析报告产品可以对行业情报数据进行梳理分析,涉及维度包括行业专利基本状况分析、地域分析、技术分析、发明人分析、申请人分析、专利权人分析、失效分析、核心专利分析、法律分析、研发重点分析、企业专利处境分析、技术处境分析、专利寿命分析、企业定位分析、引证分析等超过60个分析角度,系统通过AI智能系统对图表进行解读,只需1分钟,一键生成行业专利分析报告。