首页 / 专利库 / 电脑图像 / 细化通道 / Manufacture of semiconductor device

Manufacture of semiconductor device

阅读:592发布:2021-06-29

专利汇可以提供Manufacture of semiconductor device专利检索,专利查询,专利分析的服务。并且PURPOSE:To prevent a protrusion into an active region of an inversion preventive layer, and to obviate a narrow channel effect accompanied by the fining of an element by implanting ions to the periphery under the state in which the active region is masked in a size larger than it. CONSTITUTION:A pad oxide film 2 is attached on a P type silicon single crystal substrate 1 through thermal oxidation, a silicon nitride film 3 is deposited on the oxide film 2, and the silicon nitride film 3 is left only in the active region. A resist 4 is rotary-applied on the whole surface, the resist 4 is left only in the side wall section of the silicon nitride film 3 through etching, and the resist 4 of other sections is removed. The P inversion preventive layers 5 are formed to the surface section of the substrate 1 in an element isolation region by implanting the ions of a P type impurity such as boron B to the substrate 1 while using the resist 4 as a mask, the resist 4 is removed completely, and a field oxide film 6 is formed to the surface of the element isolation region of the substrate 1 in a wet oxygen atmosphere.,下面是Manufacture of semiconductor device专利的具体信息内容。

高效检索全球专利

专利汇是专利免费检索,专利查询,专利分析-国家发明专利查询检索分析平台,是提供专利分析,专利查询,专利检索等数据服务功能的知识产权数据服务商。

我们的产品包含105个国家的1.26亿组数据,免费查、免费专利分析。

申请试用

分析报告

专利汇分析报告产品可以对行业情报数据进行梳理分析,涉及维度包括行业专利基本状况分析、地域分析、技术分析、发明人分析、申请人分析、专利权人分析、失效分析、核心专利分析、法律分析、研发重点分析、企业专利处境分析、技术处境分析、专利寿命分析、企业定位分析、引证分析等超过60个分析角度,系统通过AI智能系统对图表进行解读,只需1分钟,一键生成行业专利分析报告。

申请试用

QQ群二维码
意见反馈