序号 专利名 申请号 申请日 公开(公告)号 公开(公告)日 发明人
81 METHOD AND APPARATUS OF PRECISELY MEASURING INTENSITY PROFILE OF X-RAY NANOBEAM EP09840815.6 2009-03-19 EP2402789A1 2012-01-04 YAMAUCHI, Kazuto; MIMURA, Hidekazu; OKADA, Hiromi

Provided are a method and an apparatus of precisely measuring the intensity profile of an x-ray nanobeam, which can measure x-rays having different wavelengths with one knife edge and can perform optimal measurements corresponding to the depth of focus of an x-ray beam and the conditions of other measurement devices, using a dark field measurement method which enables precise measurements of the profile of an x-ray beam using a knife edge and using diffracted and transmitted x-rays. The knife edge (4) is formed of a heavy metal which advances the phase of an x-ray passing therethrough and is fabricated in such a manner that the thickness may change in the longitudinal direction continuously or in a stepwise fashion. The knife edge (4) is so set that an x-ray beam may traverse the knife edge (4) at such a thickness position as to achieve a phase shift in a range wherein a transmitted x-ray and a diffracted x-ray diffracted at the end of the knife edge may reinforce each other, and a superposed x-ray of the diffracted x-ray and the transmitted x-ray is measured by an x-ray detector.

82 Asymmetrische Schlitzblende sowie Vorrichtung und Verfahren zur Herstellung derselben EP09178329.0 2009-12-08 EP2333786A1 2011-06-15 Osterloh, Kurt, Dr. rer. nat.; Zscherpel, Uwe, Dr. rer. nat.; Ewert, Uwe, Prof. Dr.

Die Erfindung betrifft eine Schlitzblende (50, 70, 90), insbesondere für eine bildgebende Einrichtung (100), welche geeignet ist, von einer Strahlungsquelle (102) ausgehende, insbesondere hoch-energetische, Strahlung (104) zu begrenzen und entlang einer optischen Achse (x) nach dem Lochkameraprinzip auf einen Abbildungsbereich (106) zu richten, wobei die Schlitzblende (50, 70, 90) ein erstes Absorptionselement (52, 72) umfasst, welches eine erste nicht-ebene Außenfläche (54) aufweist, von der zumindest ein Teilbereich auf einer Regelfläche liegt, deren gaußsche Krümmung in dem Teilbereich nirgends verschwindet, wobei die Schlitzblende (50, 70, 90) ein zweites Absorptionselement (56, 76) umfasst, welches eine zweite nicht-ebene Außenfläche (58) aufweist, deren Oberflächenkontur zumindest teilweise komplementär zu der nicht-ebenen Außenfläche (54) des ersten Absorptionselements (52, 72) geformt ist, und wobei die beiden Absorptionselemente (52, 72; 56, 76) derart positioniert oder positionierbar sind, dass zwischen den beiden nicht-ebenen Außenflächen (54, 58) ein Spalt (60, 80, 92) vorhanden ist. Der Abstand in einer Richtung (y) senkrecht zu der optischen Achse (x) zwischen den Erzeugenden der Regelfläche verringert sich zum Abbildungsbereich (106) hin. Die Erfindung betrifft ferner eine Vorrichtung und ein Verfahren zur Herstellung einer Schlitzblende, wobei eine erste Rotationsbewegung, eine zweite Rotationsbewegung und eine Translationsbewegung miteinander gekoppelt sind.

83 ADVANCED DRUG DEVELOPMENT AND MANUFACTURING EP07874491 2007-10-10 EP2084519A4 2010-02-24 BIRNBAUM EVA R; KOPPISCH ANDREW T; BALDWIN SHARON M; WARNER BENJAMIN P; MCCLESKEY MARK T; BERGER JENNIFER A; STEWART JEFFREY J; HARRIS MICHAEL N; BURRELL ANTHONY K
84 BLENDE FÜR EINE BILDGEBENDE EINRICHTUNG EP06777369.7 2006-06-20 EP1897095A2 2008-03-12 KNISCHEK, Heinz-Jürgen; EWERT, Uwe; OSTERLOH, Kurt
The invention relates to a diaphragm (100), especially for an imaging device (200), which is used to limit especially high-energy radiation (12) emitted from a radiation source (10) and to orient the radiation along an optical axis x towards the imaging region (14) according to the pin camera principle. The invention is characterised in that the diaphragm (100) comprises a first body (18) which at least partially absorbs the radiation (12) and comprises a first curved outer surface (20), the contour of said surface being at least partially described by a function of the form z(x,y) = f(y)*x + n, and a second body (26) which at least partially absorbs the radiation (12) and comprises a second curved outer surface (28), the contour of said surface being at least partially complementary to the curved outer surface (20) of the first absorbing body (18). According to the invention, the two absorbing bodies (18, 26) are positioned, or can be positioned, in such a way that a gap (32) or a region which only slightly absorbs the radiation is created between the two curved outer surfaces (20, 28).
85 MIRCROREACTOR FOR USE IN ELECTRON MICROSCOPY PCT/NL2015050758 2015-10-29 WO2016068710A4 2016-06-23 ZANDBERGEN HENDRIK WILLEM
The present invention is in the field of a nano- or microreactor assembly for use in microscopy, use of said reactor assembly, and a microscope comprising said reactor assembly. The present invention is in the field of microscopy, specifically in the field of electron and focused ion beam microscopy (EM and FIB), and in particular Transmission Electron Microscopy (TEM). However its application is extendable in principle to any field of microscopy, especially wherein characteristics of a (solid) specimen (or sample) are studied in detail, such as during a reaction. The reactor of the assembly comprises flexible reactor walls (11, 12) on opposite sides, at least one side with a window transparent for electrons, and capacitive plates (51, 52) arranged located or attached to the opposite sides, wherein the capacitive plates are separated from the reactor interior by a dielectric material (53, 54). The reactor assembly further comprises means to provide an electric field to the pcapacitive plate, in order to control the parallel positions of the opposite reactor walls.
86 X-RAY IMAGING SYSTEM AND METHOD PCT/US2010046377 2010-08-23 WO2011059545A2 2011-05-19 GRUBSKY VICTOR; JANNSON TOMASZ; PATTON EDWARD MATTHEW; ROMANOOV VOLODYMYR; MEDVEDKIN GENNADY; SHNITSER PAUL; SHOEMAKER KEITH
The present invention provides systems and methods for x-ray imaging. In some embodiments, an aperture, or a plurality thereof, are configured to have image transfer functions lacking a zero within a usable spatial frequency range. In further embodiments, the image transfer function is determined according to the shape of the aperture and the usable spatial frequency range is determined according to a usable signal to noise ratio.
87 COMPUTED TOMOGRAPHY SCANNERS, X-RAY FILTERS AND METHODS THEREOF PCT/US2009047797 2009-06-18 WO2009155418A3 2010-03-25 HANGARTNER THOMAS N; ALLADI SANGEETHA
A computed tomography scanner may include a component mounting assembly, an x-ray tube, a filter assembly, and a detector assembly. The filter assembly filters an x-ray fan or cone beam generated by the x-ray tube such that the x-ray beam comprises a high dose portion and one or more low dose portions. The filter assembly reduces the photon count of the low dose portions. The x-ray tube may be coupled to the component mounting assembly at a first end and the detector assembly coupled at a second end that is opposite from the first end. The component mounting assembly is rotatable about a rotation axis. The detector assembly includes an array of individual detector elements capable of detecting x-ray photons of the x-ray beam. The high dose portion strikes a high resolution region of the detector assembly and the low dose portion strikes a low resolution region of the detector assembly.
88 ADVANCED DRUG DEVELOPMENT AND MANUFACTURING PCT/US2007021888 2007-10-10 WO2008127291A2 2008-10-23 BIRNBAUM EVA R; KOPPISCH ANDREW T; BALDWIN SHARON M; WARNER BENJAMIN P; MCCLESKEY MARK T; BERGER JENNIFER A; STEWART JEFFREY J; HARRIS MICHAEL N; BURRELL ANTHONY K
X-ray fluorescence (XRF) spectrometry has been used for detecting binding events and measuring binding selectivities between chemicals and receptors. XRF may also be used for estimating the therapeutic index of a chemical, for estimating the binding selectivity of a chemical versus chemical analogs, for measuring post-translational modifications of proteins, and for drug manufacturing.
89 DIAPHRAGM FOR AN IMAGING DEVICE PCT/EP2006063330 2006-06-20 WO2006136545A3 2007-04-12 OSTERLOH KURT; EWERT UWE; KNISCHEK HEINZ-JUERGEN
The invention relates to a diaphragm (100), especially for an imaging device (200), which is used to limit especially high-energy radiation (12) emitted from a radiation source (10) and to orient the radiation along an optical axis x towards the imaging region (14) according to the pin camera principle. The invention is characterised in that the diaphragm (100) comprises a first body (18) which at least partially absorbs the radiation (12) and comprises a first curved outer surface (20), the contour of said surface being at least partially described by a function of the formz(x,y) = f(y)*x + n, and a second body (26) which at least partially absorbs the radiation (12) and comprises a second curved outer surface (28), the contour of said surface being at least partially complementary to the curved outer surface (20) of the first absorbing body (18). According to the invention, the two absorbing bodies (18, 26) are positioned, or can be positioned, in such a way that a gap (32) or a region which only slightly absorbs the radiation is created between the two curved outer surfaces (20, 28).
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