| 序号 | 专利名 | 申请号 | 申请日 | 公开（公告）号 | 公开（公告）日 | 发明人 |
|---|---|---|---|---|---|---|
| 1 | 利用像素化探测器的X射线成像 | CN201180042736.X | 2011-08-30 | CN103081024A | 2013-05-01 | K·J·恩格尔; G·福格特米尔 |
| 本发明涉及一种用于产生X射线图像的方法和成像系统（100）。该系统（100）包括至少一个X射线源，优选是X射线源（101a-101d）的阵列，以及具有敏感像素（103a-103e）阵列的X射线探测器（103）。在X射线源和探测器之间布置准直器（102），使得准直器（102）的两个开口（P）允许X射线通过而指向两个相邻像素（103a-103e），同时基本屏蔽所述像素之间的区域。像素之间对通常不敏感的区域的这种屏蔽减少了不必要的X射线曝光。可以利用多个小的X射线源（101a-101d）实现充分大的X射线强度。 | ||||||
| 2 | X射线CT装置、放射线检测器及其制造方法 | CN201110290355.5 | 2011-09-21 | CN102525526A | 2012-07-04 | 矶真知子; 八百井佳明; 松田圭史; 南部修也; 金丸俊; 谷口昭彦 |
| 本发明涉及X射线CT装置、放射线检测器及其制造方法，能够获得准直仪板的板厚和间距均匀的准直仪。本发明的X射线CT装置具备X射线检测部和准直仪部。X射线检测部检测透过被检体的X射线。准直仪部从入射至所述X射线检测部的射线中除去散射线。在此，准直仪部具备多个准直仪模块、支承部及固定部。多个准直仪模块分别具有沿相互正交的信道方向及切片方向格子状配置的多个第一准直仪板。支承部将所述多个准直仪模块排列在沿所述信道方向的多条直线上及沿所述切片方向的多条直线上并进行支承。固定部设置于所述支承部，并固定所述多个准直仪模块在所述信道方向及所述切片方向上的位置。 | ||||||
| 3 | X射线CT装置、放射线检测器及其制造方法 | CN201110290355.5 | 2011-09-21 | CN102525526B | 2016-07-06 | 矶真知子; 八百井佳明; 松田圭史; 南部修也; 金丸俊; 谷口昭彦 |
| 本发明涉及X射线CT装置、放射线检测器及其制造方法，能够获得准直仪板的板厚和间距均匀的准直仪。本发明的X射线CT装置具备X射线检测部和准直仪部。X射线检测部检测透过被检体的X射线。准直仪部从入射至所述X射线检测部的射线中除去散射线。在此，准直仪部具备多个准直仪模块、支承部及固定部。多个准直仪模块分别具有沿相互正交的信道方向及切片方向格子状配置的多个第一准直仪板。支承部将所述多个准直仪模块排列在沿所述信道方向的多条直线上及沿所述切片方向的多条直线上并进行支承。固定部设置于所述支承部，并固定所述多个准直仪模块在所述信道方向及所述切片方向上的位置。 | ||||||
| 4 | 利用像素化探测器的X射线成像 | CN201180042736.X | 2011-08-30 | CN103081024B | 2016-07-13 | K·J·恩格尔; G·福格特米尔 |
| 本发明涉及一种用于产生X射线图像的方法和成像系统（100）。该系统（100）包括至少一个X射线源，优选是X射线源（101a?101d）的阵列，以及具有敏感像素（103a?103e）阵列的X射线探测器（103）。在X射线源和探测器之间布置准直器（102），使得准直器（102）的两个开口（P）允许X射线通过而指向两个相邻像素（103a?103e），同时基本屏蔽所述像素之间的区域。像素之间对通常不敏感的区域的这种屏蔽减少了不必要的X射线曝光。可以利用多个小的X射线源（101a?101d）实现充分大的X射线强度。 | ||||||
| 5 | 放射线拍摄装置 | CN201010509084.3 | 2010-10-12 | CN102048554B | 2013-06-05 | 藤田明德 |
| 本发明提供一种放射线拍摄装置。当放射线源与放射线检测器位于标准位置时，通过用放射线网格来遮挡从放射线源照射的放射线射束，从而使得在放射线检测器的检测面显现的吸收箔的影子的排列间距成为放射线检测元件的横向的排列间距的整数倍，并且，确定放射线网格与放射线检测器的位置，以使吸收箔的影子以不跨越与放射线检测元件横向相邻的放射线检测元件的方式显现。 | ||||||
| 6 | 放射线拍摄装置 | CN201010509084.3 | 2010-10-12 | CN102048554A | 2011-05-11 | 藤田明德 |
| 本发明提供一种放射线拍摄装置。当放射线源与放射线检测器位于标准位置时，通过用放射线网格来遮挡从放射线源照射的放射线射束，从而使得在放射线检测器的检测面显现的吸收箔的影子的排列间距成为放射线检测元件的横向的排列间距的整数倍，并且，确定放射线网格与放射线检测器的位置，以使吸收箔的影子以不跨越与放射线检测元件横向相邻的放射线检测元件的方式显现。 | ||||||
| 7 | Conical Collimator for X-ray Measurements | US16295588 | 2019-03-07 | US20190204246A1 | 2019-07-04 | Petronella Emerentiana HEGEMAN; Gustaaf Christian BRONS |
| X ray apparatus includes a sample stage (4) for supporting a sample (6), an X-ray source (2) and an energy dispersive X-ray detector (8). A conical X-ray collimator (10) is provided either between the sample and the X-ray source or between the sample and the energy-dispersive X-ray detector, the conical X-ray collimator including a plurality of truncated cones arranged concentrically around a central axis, the truncated cones having a common apex defining a central measurement spot on the sample. | ||||||
| 8 | Microreactor for use in microscopy | US15582073 | 2017-04-28 | US09922797B2 | 2018-03-20 | Hendrik Willem Zandbergen |
| An improved microreactor for use in microscopy, use of said microreactor, and a microscope comprising said reactor. The present invention is in the field of microscopy, specifically in the field of electron and focused ion beam microscopy (EM and FIB), and in particular Transmission Electron Microscopy (TEM). However its application is extendable in principle to any field of microscopy, especially wherein characteristics of a (solid) specimen (or sample) are studied in detail, such as during a reaction. | ||||||
| 9 | RESOLUTION TEST CHART FOR X-RAY IMAGING SYSTEM AND METHOD OF FABRICATION | US14567722 | 2014-12-11 | US20150170779A1 | 2015-06-18 | Pierre BLEUET; Christophe CONSTANCIAS |
| In the field of resolution test charts for analysis of the resolution of X-ray tomography systems, a test chart comprises a substrate bearing X-ray absorbent zones, with widths and spacings to allow measurement of the system resolution. To avoid shadow effects when the X-ray illumination beam is divergent and when the absorbent zones have a large height/width ratio (from 2 to 5 for example), the absorbent zones in the diverse points of the pattern have a shape of which a general direction of elevation with respect to the surface of the substrate is rotated toward a point of convergence which is the same for all absorbent zones. The X-ray source is placed at the convergence point, eliminating shadow effects. The oblique elevation can be obtained by specific etching steps, or curvature of the substrate after fabrication of the absorbent patterns, or else by use of two superimposed partial test charts. | ||||||
| 10 | Method and apparatus of precisely measuring intensity profile of X-ray nanobeam | US13203095 | 2009-03-19 | US08744046B2 | 2014-06-03 | Kazuto Yamauchi; Hidekazu Mimura; Hiromi Okada |
| Provided are a method and an apparatus of precisely measuring the intensity profile of an x-ray nanobeam, which can measure x-rays having different wavelengths with one knife edge and can perform optimal measurements corresponding to the depth of focus of an x-ray beam and the conditions of other measurement devices, using a dark field measurement method which enables precise measurements of the profile of an x-ray beam using a knife edge and using diffracted and transmitted x-rays. The knife edge (4) is formed of a heavy metal which advances the phase of an x-ray passing therethrough and is fabricated in such a manner that the thickness may change in the longitudinal direction continuously or in a stepwise fashion. The knife edge (4) is so set that an x-ray beam may traverse the knife edge (4) at such a thickness position as to achieve a phase shift in a range wherein a transmitted x-ray and a diffracted x-ray diffracted at the end of the knife edge may reinforce each other, and a superposed x-ray of the diffracted x-ray and the transmitted x-ray is measured by an x-ray detector. | ||||||
| 11 | Computed tomography scanners, x-ray filters and methods thereof | US12999657 | 2009-06-18 | US08553835B2 | 2013-10-08 | Thomas N. Hangartner; Sangeetha Alladi |
| A computed tomography scanner may include a component mounting assembly, an x-ray tube, a filter assembly, and a detector assembly. The filter assembly filters an x-ray fan or cone beam generated by the x-ray tube such that the x-ray beam comprises a high dose portion and one or more low dose portions. The filter assembly reduces the photon count of the low dose portions. The x-ray tube may be coupled to the component mounting assembly at a first end and the detector assembly coupled at a second end that is opposite from the first end. The component mounting assembly is rotatable about a rotation axis. The detector assembly includes an array of individual detector elements capable of detecting x-ray photons of the x-ray beam. The high dose portion strikes a high resolution region of the detector assembly and the low dose portion strikes a low resolution region of the detector assembly. | ||||||
| 12 | Radiographic apparatus | US12765373 | 2010-04-22 | US08160202B2 | 2012-04-17 | Ken Hirooka; Shouji Kuwabara |
| A radiographic apparatus includes a radiation source for emitting radiation, a radiation detecting device with detecting elements arranged two-dimensionally, a radiation grid with absorbing foil strips for removing scattered radiation, a physical quantity acquiring device for calculating predetermined physical quantities based on outputs of the radiation detecting device, a physical quantity map generating device for generating a physical quantity map by mapping the predetermined physical quantities, and a physical quantity map smoothing device for smoothing the physical quantities arranged on the physical quantity map in a direction of extension of the absorbing foil strips, thereby to generate an average value map. | ||||||
| 13 | X-RAY COMPUTED TOMOGRAPHY APPARATUS, RADIATION DETECTOR, AND METHOD OF MANUFACTURING RADIATION DETECTOR | US13239843 | 2011-09-22 | US20120069954A1 | 2012-03-22 | Machiko Iso; Yoshiaki Yaoi; Keiji Matsuda; Shuya Nambu; Takashi Kanemaru; Akihiko Taniguchi |
| An X-ray CT apparatus according to an embodiment includes an X-ray detector and a collimator unit. The X-ray detector detects X-rays that have passed through a subject. The collimator unit eliminates scattered radiation from X-rays that are incident on the X-ray detector. The collimator unit includes a plurality of collimator modules, a supporter, and a fixing unit. The plurality of collimator modules each includes a plurality of first collimator plates arranged in a grid along a channel direction and a slice direction that are orthogonal to each other. The supporter supports the collimator modules such that the collimator modules are aligned in a plurality of straight lines along the channel direction and in a plurality of straight lines along the slice direction. The fixing unit is provided to the supporter and fixes positions of the collimator modules in the channel direction and the slice direction. | ||||||
| 14 | Radiation imaging system and collimator unit | US13137069 | 2011-07-19 | US20120020454A1 | 2012-01-26 | Dai Murakoshi |
| A collimator unit includes a filter set for regulating a spectrum of X-rays emitted from an X-ray source, and a source grating having plural X-ray shielding portions and X-ray transmitting portions. The X-ray shielding portions and X-ray transmitting portions extend in a y direction parallel to a rotational axis of a rotating anode of the X-ray source, and are alternately arranged in an x direction orthogonal to an optical axis direction (z direction) of the X-rays. The intensity of the X-rays is reduced in the y direction by a heel effect. However, further reduction in the intensity of the X-rays by vignetting does not occur in the y direction. Since the filter set is disposed upstream from the source grating in an application direction of the X-rays, the source grating forms arrayed narrow focuses of X-ray beams from the X-rays disturbed by a filter element. | ||||||
| 15 | METHOD AND APPARATUS OF PRECISELY MEASURING INTENSITY PROFILE OF X-RAY NANOBEAM | US13203095 | 2009-03-19 | US20110305317A1 | 2011-12-15 | Kazuto Yamauchi; Hidekazu Mimura; Hiromi Okada |
| Provided are a method and an apparatus of precisely measuring the intensity profile of an x-ray nanobeam, which can measure x-rays having different wavelengths with one knife edge and can perform optimal measurements corresponding to the depth of focus of an x-ray beam and the conditions of other measurement devices, using a dark field measurement method which enables precise measurements of the profile of an x-ray beam using a knife edge and using diffracted and transmitted x-rays. The knife edge (4) is formed of a heavy metal which advances the phase of an x-ray passing therethrough and is fabricated in such a manner that the thickness may change in the longitudinal direction continuously or in a stepwise fashion. The knife edge (4) is so set that an x-ray beam may traverse the knife edge (4) at such a thickness position as to achieve a phase shift in a range wherein a transmitted x-ray and a diffracted x-ray diffracted at the end of the knife edge may reinforce each other, and a superposed x-ray of the diffracted x-ray and the transmitted x-ray is measured by an x-ray detector. | ||||||
| 16 | SYSTEM AND METHOD FOR FILTRATION REDUCED EQUALIZED EXPOSURE COMPUTED TOMOGRAPHY | US13011789 | 2011-01-21 | US20110206259A1 | 2011-08-25 | Charles A. MISTRETTA; Charles M. Strother |
| A method is disclosed for producing a computed tomographic image of a subject, the method including: using a radiation source and detector, obtaining radiation transmission information relating to a region of interest in the subject; using the source and detector; obtaining a series of projection images of the region of interest. Each projection image is obtained by: directing an imaging beam of radiation from the source through the region of interest onto the detector along a respective direction; the detector having a detection area. | ||||||
| 17 | COLLIMATOR AND RELATED METHODS | US12479731 | 2009-06-05 | US20100308226A1 | 2010-12-09 | Gengsheng Lawrence Zeng |
| A collimator and related methods are shown and described. The collimator can be a multi-divergent-beam collimator having a plurality of inverted, ordered sections of a cone-beam collimator reassembled in a substantially reversed order relative to the ordering of the cone-beam collimator. | ||||||
| 18 | RADIOGRAPHIC APPARATUS | US12765373 | 2010-04-22 | US20100272236A1 | 2010-10-28 | Ken Hirooka; Shouji Kuwabara |
| A radiographic apparatus includes a radiation source for emitting radiation, a radiation detecting device with detecting elements arranged two-dimensionally, a radiation grid with absorbing foil strips for removing scattered radiation, a physical quantity acquiring device for calculating predetermined physical quantities based on outputs of the radiation detecting device, a physical quantity map generating device for generating a physical quantity map by mapping the predetermined physical quantities, and a physical quantity map smoothing device for smoothing the physical quantities arranged on the physical quantity map in a direction of extension of the absorbing foil strips, thereby to generate an average value map. | ||||||
| 19 | X-ray imaging with pixelated detector | US13818696 | 2011-08-30 | US09599577B2 | 2017-03-21 | Klaus Juergen Engel; Gereon Vogtmeier |
| The invention relates to a method and an imaging system (100) for generating X-ray images. The system (100) comprises at least one X-ray source, preferably an array of X-ray sources (101a-101d), and an X-ray detector (103) with an array of sensitive pixels (103a-103e). A collimator (102) is arranged between the X-ray source and the detector such that two openings (P) of the collimator (102) allow the passage of X-rays towards two neighboring pixels (103a-103e) while the region between said pixels is substantially shielded. This shielding of the usually insensitive regions between pixels reduces unnecessary X-ray exposure. A sufficiently large X-ray intensity can be achieved by using a plurality of small X-ray sources (101a-101d). | ||||||
| 20 | Inspection Apparatus, Inspection Method and Manufacturing Method | US15230937 | 2016-08-08 | US20170045823A1 | 2017-02-16 | Richard QUINTANILHA |
| A product structure (407, 330′) is formed with defects (360-366). A spot (S) of EUV radiation which is at least partially coherent is provided on the product structure (604) to capture at least one diffraction pattern (606) formed by the radiation after scattering by the product structure. Reference data (612) describes a nominal product structure. At least one synthetic image (616) of the product structure is calculated from the captured image data. Data from the synthetic image is compared with the reference data to identify defects (660-666) in the product structure. In one embodiment, a plurality of diffraction patterns are obtained using a series overlapping spots (S(1)-S(N)), and the synthetic image is calculated using the diffraction patterns and knowledge of the relative displacement. The EUV radiation may have wavelengths in the range 5 to 50 nm, close to dimensions of the structures of interest. | ||||||
QQ群二维码
意见反馈
意见反馈