| 序号 | 专利名 | 申请号 | 申请日 | 公开（公告）号 | 公开（公告）日 | 发明人 |
|---|---|---|---|---|---|---|
| 121 | Temperature detector | JP2012076985 | 2012-03-29 | JP2013205345A | 2013-10-07 | KATO HISAKAZU |
| PROBLEM TO BE SOLVED: To provide a temperature detector capable of excellently finding a failure in a configuration for AD conversion concerning a temperature detector that converts analog signals that have been output from a temperature sensor such as a thermistor in accordance with temperature into digital signals and outputs the signals.SOLUTION: A potential (corresponding to the atmospheric temperature of a thermistor 5) between the thermistor 5 and a resistor 51 is serially input to two A/D ports 11, 12 of a microcomputer 10. Potentials as analog signals input to the respective A/D ports 11, 12 are individually converted into digital signals and compared by a CPU 14 incorporated in the microcomputer 10. When the respective digital signals are coincident, it is determined that a failure due to a crack, a poor contact or the like does not occur in the A/D ports 11, 12. When the respective digital signals are not coincident, it is determined that a failure due to a crack, a poor contact or the like occurs in any one of the A/D ports 11, 12. | ||||||
| 122 | Pdm output temperature sensor | JP2008276302 | 2008-10-28 | JP5185772B2 | 2013-04-17 | 亮一 安斎 |
| 123 | Temperature measurement device of power semiconductor device | JP2011194942 | 2011-09-07 | JP2013057550A | 2013-03-28 | YOSHIMURA HIROYUKI |
| PROBLEM TO BE SOLVED: To provide a temperature measurement device of a power semiconductor device capable of easily and exactly detecting temperature when an inclination between characteristics on design and actually measured characteristics is different.SOLUTION: A chip temperature detection circuit includes: an A/D converter which outputs forward voltages on both sides of a diode for temperature detection as measurement values by performing digital conversion; and an arithmetic processing part which calculates a chip temperature on the basis of the measurement values of the A/D converter. The arithmetic processing part calculates an inclination of a segment connecting the measurement values of the A/D converter when a plurality of different known reference voltage values are applied, respectively instead of the diode for temperature detection in calibration, and stores the calculated inclination of the segment with an offset correction value which is one of the measurement values to be output from the A/D converter. The arithmetic processing part includes a chip temperature calculation part which calculates the forward voltage of the diode for temperature detection on the basis of the measurement values of the A/D converter, the inclination of the segment, and the offset correction values to calculate the chip temperature in temperature measurement. | ||||||
| 124 | Signal judgment system and temperature determination system | JP2010137275 | 2010-06-16 | JP5053421B2 | 2012-10-17 | 晋 山本; 佳浩 河村; 充昭 矢野 |
| A temperature determination apparatus includes a signal detection section having an A/D input port, a thermistor that is connected to the A/D input port and outputs an analogue signal to the A/D input port, and a switch section that shifts a level of the analogue signal to a low level. The signal detection section determines that a control signal having a priority higher than that of an output detection process of the thermistor is generated when it is detected that the analogue signal to be input to the A/D input port is in the low level. | ||||||
| 125 | Environmental information measuring device, environmental information measuring system and environmental information measuring method | JP2010208452 | 2010-09-16 | JP2012064035A | 2012-03-29 | WAKI HIROSHI; IGARASHI HAJIME; WATANABE KOTA; MAKIMURA HIDETOSHI |
| PROBLEM TO BE SOLVED: To provide an environmental information measuring device capable of measuring environmental information at a place to be measured, with a low-power-consumption circuit configuration.SOLUTION: A power supply part 20 generates electric power of a power source based on an electric wave received from an environmental information collecting device 51. A thermistor Ris a circuit element whose impedance changes according to an environment (temperature). Then, firstly, in such a state that a first switch SW1 is closed and a second switch SW2 is opened, a capacitor C is charged by the power supply part 20. Then, in such a state that the first switch SW1 is opened and the second switch SW2 is closed, the capacitor C starts discharging through the thermistor R. After that, a time measuring part 40 measures time until a potential of capacitor C reaches a predetermined reference voltage Vref (time for changing by a temperature of thermistor) as measured data. A communication part 10 transmits the measured data to the environmental information collecting device 51. | ||||||
| 126 | Sensing apparatus | JP2006165986 | 2006-06-15 | JP4799286B2 | 2011-10-26 | 雅幸 小林; 真一 板垣 |
| 127 | Temperature measuring circuit, and a method | JP2008312908 | 2008-12-09 | JP4752904B2 | 2011-08-17 | 幹浩 梶田 |
| 128 | 温度測定装置及び方法 | JP2009547961 | 2008-11-27 | JPWO2009084352A1 | 2011-05-19 | 永典 實吉; 浩一 野瀬; 幹浩 梶田; 水野 正之; 正之 水野 |
| 電流読み出し手段は、温度の変化に応じて出力電流が変化する電流源の出力電流を検出し、該出力電流に比例する値を出力する。電流源の出力電流に比例する電流読み出し手段の出力値に対応する電流源の温度を実測し、電流読み出し手段の出力値及び該出力値に対応する電流源の温度の実測値から、出力値を温度の情報に変換するための媒介変数を決定する。そして、決定した媒介変数を用いて電流読み出し手段の出力値を温度の情報に変換する。 | ||||||
| 129 | Circuit for measuring temperature, and method | JP2008312908 | 2008-12-09 | JP2010139241A | 2010-06-24 | KAJITA MIKIHIRO |
| <P>PROBLEM TO BE SOLVED: To provide a circuit for measuring temperature which enables high-accuracy measurement of temperature without enlarging a circuit scale. <P>SOLUTION: A diode 11 is connected between a power supply 41 and a connection node (potential 43) of resistances 12 and 13 and prescribed voltage is impressed on both ends of the diode 11. Since the voltage at both ends of the diode 11 is held prescribed, a current flowing through the diode 11 varies, depending on a change in temperature. A transistor 14, a capacitance 15, inverter circuits 16 and 17 and a counter 18 constitute a measuring part 19 which performs the temperature measurement, based on the current flowing through the diode 11. <P>COPYRIGHT: (C)2010,JPO&INPIT | ||||||
| 130 | A/d converter and method for a/d conversion | JP2008166153 | 2008-06-25 | JP2010010921A | 2010-01-14 | MATSUDA ATSUSHI |
| <P>PROBLEM TO BE SOLVED: To provide an A/D converter which is not affected by the offset voltage of an amplifier, when utilizing a reference voltage by a BGR circuit in analog to digital conversion. <P>SOLUTION: In the A/D converter, a band gap reference circuit includes: an operational amplifier for receiving a voltage, appearing in a temperature dependent element corresponding to the reference voltage, as an input voltage and outputting the reference voltage; a first switching circuit, capable of switching the state of replacing the inverted input and non-inverted input of the operational amplifier and the state of not replacing them; and a second switching circuit, capable of switching the state of outputting the output voltage of the operational amplifier by a positive phase and the state of outputting it by an opposite phase. An A/D conversion circuit, utilizing the reference voltage, sets the first and second switching circuits to a prescribed state to obtain a first digital value; sets the first and second switch circuits to a state which is reverse to that of the prescribed state, to obtain a second digital value; and obtains an A/D-converted result, as the average value of the first and second digital values. <P>COPYRIGHT: (C)2010,JPO&INPIT | ||||||
| 131 | Semiconductor integrated circuit | JP2006234922 | 2006-08-31 | JP2008060884A | 2008-03-13 | FUJISAWA HIROKI; TANAKA HITOSHI; KOSHIZUKA ATSUO |
| PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit by which time required for the first conversion of an A/D converter by a linear search method can be shortened. SOLUTION: The semiconductor integrated circuit is provided with a temperature detection part which detects temperature of a chip and the A/D converter 100 which performs digital conversion of analog output VBE of the temperature detection part. The A/D converter 100 is provided with an up/down counter, a D/A converter 120 which perform analog conversion of output T2 of the up/down counter, and a comparator 130 which compares analog output DAC_OUT of the D/A converter 120 with the analog output VBE (VTEMP) of the temperature detection part. The up/down counter is constituted so that an initial value different from the minimum value and the maximum value is preset. Thus, judgment time in the first conversion can be shortened though the linear search method is used. COPYRIGHT: (C)2008,JPO&INPIT | ||||||
| 132 | Sensing device | JP2006165986 | 2006-06-15 | JP2007333574A | 2007-12-27 | KOBAYASHI MASAYUKI; ITAGAKI SHINICHI |
| PROBLEM TO BE SOLVED: To provide a sensing device, taking temperature information (voltage) obtained by a plurality of thermistors in a microprocessor without complicating the configuration and without any increase in the number of parts, and simple in constitution. SOLUTION: In connecting a plurality of electric elements (thermistors) for generating an analog electric variable to the micro-processing having an A/D converting function of converting an analog electric variable applied to an A/D converting port to a digital value and taking the same in the interior, the plurality of electric elements are respectively connected to a plurality of switch ports of the microprocessor selectively grounded by an internal switch of the microprocessor, and the analog electric variables (voltage) generated in the electric elements are selectively taken into the A/D converting function of the microprocessor by selective changeover of the internal switch. COPYRIGHT: (C)2008,JPO&INPIT | ||||||
| 133 | SYSTEM AND METHOD FOR PROVIDING TEMPERATURE DATA FROM A MEMORY DEVICE HAVING A TEMPERATURE SENSOR | PCT/US2006062027 | 2006-12-13 | WO2007076276A3 | 2008-10-09 | JANZEN JEFF W; WRIGHT JEFFREY P; FARRELL TODD D |
| A circuit and method for providing temperature data indicative of a temperature measured by a temperature sensor. The circuit is coupled to the temperature sensor and configured to identify for a coarse temperature range one of a plurality of fine temperature ranges corresponding to the temperature measured by the temperature sensor and generate temperature data that is provided on an asynchronous output data path. | ||||||
| 134 | SENSING DEVICE FOR SENSING A PHYSICAL PARAMETER | PCT/EP2004003666 | 2004-04-06 | WO2004090570A3 | 2005-01-06 | SUNTKEN ARTUR WILHELM |
| The sensing device for sensing a physical parameter such as radiation, temperature or the like, comprises an analogue sensor element sensitive for the physical parameter to be sensed and outputting an analogue signal and an analogue two-digital converter (ADC) having an MOS input stage for receiving the analogue output signal of the sensor element so as to convert the analogue output signal to a digital output signal. | ||||||
| 135 | DIGITAL TEMPERATURE SENSOR WITH INTEGRATED TIMER AND BURST MODE | PCT/US2014069224 | 2014-12-09 | WO2015099995A8 | 2016-08-11 | ABERRA EZANA; RICHARDS PATRICK |
| An integrated temperature sensor device has a temperature sensor providing an analog signal corresponding to an ambient temperature, an analog-to-digital converter coupled to the sensor conditioning circuit and receiving the analog temperature signal, and a timer and control circuit which is operable to be configured to control the temperature sensor device to perform a sequence of temperature measurements and shut-down time periods, wherein multiple temperature measurements are taken during the measurement period, wherein the timer and control circuit is further operable to be programmed to set the number of temperature measurements and the length of the shut-down period. | ||||||
| 136 | CIRCUIT ARRANGEMENT AND METHOD FOR TEMPERATURE MEASUREMENT | PCT/EP2010056119 | 2010-05-05 | WO2010136310A9 | 2012-01-19 | JESSENIG THOMAS |
| A circuit arrangement for temperature measurement comprises an input for connecting a temperature-sensitive element (T) that is connected to a first input of a comparator (C). A reference voltage (Vref) is connected to a second input of the comparator (C). Furthermore, the arrangement comprises a sequential logic (SL) that is coupled to an output of the comparator (C) and that comprises a first output (A1) and a second output (A2). A digitally controllable switch element (DS) for providing a superposition signal is connected to the output (A1) of the sequential logic and the first input of the comparator (C). | ||||||
| 137 | Non-Linear Converter to Linearize the Non-Linear Output of Measurement Devices | US16167374 | 2018-10-22 | US20190058485A1 | 2019-02-21 | Robert Mark Englekirk |
| A non-linear converter comprising a non-linear voltage divider having a plurality of resistors representing a non-linear transfer function, an analog multiplexer having analog multiplexer inputs coupled to the non-linear voltage divider and configured to output an analog multiplexer output, the analog multiplexer chooses one of the plurality of resistors based on a logic signal and the non-linear transfer function, an analog comparator having an analog comparator first input configured to receive an analog input voltage, an analog comparator second input configured to receive the analog multiplexer output and the analog comparator configured to output a comparator voltage output and a logic loop coupled to the analog comparator and configured to receive the comparator voltage output and configured to output the logic signal, wherein the logic signal represents a linearized digital word. | ||||||
| 138 | APPARATUS AND METHOD FOR SINGLE TEMPERATURE SUBTHRESHOLD FACTOR TRIMMING FOR HYBRID THERMAL SENSOR | US15891092 | 2018-02-07 | US20190044528A1 | 2019-02-07 | Cho-Ying Lu; Hyung-Jin Lee |
| An apparatus is provided which comprises: a thermal sensor comprising one or more n-type devices or p-type devices that suffer from subthreshold factor variation, wherein the thermal sensor is to generate an output digital code representing a temperature; and a calibration circuitry coupled to the thermal sensor, wherein the calibration circuitry is to trim the effects of subthreshold factor variation from the output digital code. | ||||||
| 139 | Corrected temperature sensor measurement | US14710802 | 2015-05-13 | US10088855B2 | 2018-10-02 | Fan Yung Ma |
| Representative implementations of devices and techniques provide correction for temperature sensor measurement error. In an example, the temperature sensor includes an analog-to-digital converter (ADC). The ADC output is error corrected using an iterative digital post-processing technique. | ||||||
| 140 | SEMICONDUCTOR DEVICE | US15818357 | 2017-11-20 | US20180073935A1 | 2018-03-15 | Naoya ARISAKA; Masataka MINAMI; Takahiro MIKI |
| A method of sensing a temperature of a semiconductor device, includes: measuring, by a time measuring circuit, time until a count value, which is obtained from a counter by counting a first signal having a frequency corresponding to a first voltage, reaches a largest count value which can be counted by the counter; and obtaining, by the counter, a piece of digital information corresponding to the first voltage based on a count value obtained by counting a second signal having a frequency corresponding to a second voltage, which is different from the first voltage, based on the time measured by the time measuring circuit, the first voltage depending upon the temperature of the semiconductor device. | ||||||
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