| 序号 | 专利名 | 申请号 | 申请日 | 公开（公告）号 | 公开（公告）日 | 发明人 |
|---|---|---|---|---|---|---|
| 181 | METHOD OF OUTPUTTING TEMPERATURE DATA IN SEMICONDUCTOR DEVICE AND TEMPERATURE DATA OUTPUT CIRCUIT THEREFOR | US12605032 | 2009-10-23 | US20100109753A1 | 2010-05-06 | YUN-YOUNG LEE; Kyu-Chan Lee; Ho-Cheol Lee |
| A method of outputting temperature data in a semiconductor device and a temperature data output circuit are provided. A pulse signal is generated in response to a booting enable signal activated in response to a power-up signal and the generation is inactivated in response to a mode setting signal during a power-up operation. A comparison signal is generated in response to the pulse signal by comparing a reference voltage independent of temperature with a sense voltage that varies with temperature change. The temperature data is changed in response to the comparison signal. Thus, the temperature data output circuit can rapidly output the exact temperature of the semiconductor device measured during the power-up operation. | ||||||
| 182 | PDM OUTPUT TEMPERATURE SENSOR | US12582962 | 2009-10-21 | US20100103979A1 | 2010-04-29 | Ryoichi Anzai |
| To provide a PDM output temperature sensor, which is reduced in area and consumption power, provided is a PDM output temperature sensor which includes no reference voltage circuit, thereby having a smaller area and consuming less power correspondingly. | ||||||
| 183 | ON-CHIP TEMPERATURE SENSOR | US12613139 | 2009-11-05 | US20100046311A1 | 2010-02-25 | Agostino Macerola; Giulio-Giuseppe Marotta; Marco-Domenico Tiburzi |
| A temperature invariant reference voltage and a temperature variant physical quantity, such as a voltage or current, are generated. The temperature variant physical quantity changes in response to a temperature of the integrated circuit. A temperature sensor circuit generates a voltage that is linearly dependent on the temperature. A level generator circuit generates 2n−1 voltage levels from the reference voltage. A comparator circuit, such as an analog-to-digital circuit, compares the voltage from the temperature sensor to the 2n−1 voltage levels to determine which level is closest. An n-bit digital output of the resulting level is proportional to the temperature of the integrated circuit. | ||||||
| 184 | Temperature detector and recording apparatus including the same | US11955770 | 2007-12-13 | US07651191B2 | 2010-01-26 | Katsuaki Suzuki |
| A temperature detector of the present invention includes a temperature sensor, a reference signal generation circuit, a level memory which rewritably stores therein a first signal level and a second signal level, a control circuit which controls the reference signal generation circuit so as to make a level of the reference signal change from the first signal level to the second signal level, a comparator circuit which compares the level of the reference signal and a level of the output signal, and a level rewriter which rewrites at least either one of the first signal level and the second signal level. When the level of the reference signal reaches the level of the output signal, the control circuit generates a detected temperature signal, and controls the level rewriter so as to change a range where a level of the reference signal changes. | ||||||
| 185 | CMOS TEMPERATURE-TO-DIGITAL CONVERTER WITH DIGITAL CORRECTION | US12560751 | 2009-09-16 | US20100002748A1 | 2010-01-07 | Xijian Lin; Phillip J. Benzel |
| Methods and systems for producing a digital temperature reading are provided. In an embodiment, one or more current sources and one or more switches are used to selectively provide a first amount of current (I1) and a second amount of current (I2) to the emitter of a transistor (Q1), during different time slots of a time period, to thereby produce a first base-emitter voltage (Vbe1) and a second base-emitter voltage (Vbe2), where I1=I2*M, and M is a known constant. An analog-to-digital converter (ADC) digitizes analog signals representative of the magnitudes Vbe1 and Vbe2. A difference is determined between the magnitudes of Vbe1 and Vbe2. A digital calculator produces a digital temperature reading (DTR) based on the difference between the magnitudes of Vbe1 and Vbe2. | ||||||
| 186 | Thermal Sensor Device | US12164937 | 2008-06-30 | US20090323763A1 | 2009-12-31 | Arijit Raychowdhury; Hasnain Lakdawala; Yee (William) Li; Greg Taylor; Soumyanath Krishnamurthy |
| A thermal sensor is provided that includes a front-end component, an analog-to-digital converter and a digital backend. The front-end component including an array of current sources, a dynamic element matching (DEM) device, an analog chopper and two diodes to sense temperatures on the die. The front-end component to provide analog signals at two output nodes based on currents through the two diodes. The analog-to-digital converter to receive the analog signals from the front-end component and to provide an output signal. The digital backend to receive the output signal from the analog-to-digital converter and to provide a calculated temperature. | ||||||
| 187 | TEMPERATURE DETECTOR AND THE METHOD USING THE SAME | US12186672 | 2008-08-06 | US20090296779A1 | 2009-12-03 | Wen Ming Lee |
| A temperature detector includes a plurality of comparators, an electronic component and a controller. Each of the comparators is responsible for detecting different temperature ranges. The electronic component has a temperature-dependent threshold voltage and an output connected to inputs of the plurality of comparators. The controller is configured to enable only one of the comparators at one time and to generate a value to the other inputs of the plurality of comparators. | ||||||
| 188 | Curvature correction methodolgy | US12317314 | 2008-12-22 | US20090251343A1 | 2009-10-08 | Derrick Tuten |
| A method is provided to produce an error corrected digital output from a temperature measurement system that generates digital outputs representative of the output of one or more temperature sensors. In an embodiment of the invention the method comprises: storing in a plurality of memory locations corresponding error correction data, with each memory location having a correlation to a corresponding range of the digital outputs; utilizing each digital output to identify a corresponding one of the memory locations; accessing the corresponding one memory location to obtain error correction data specific to the digital output; and utilizing the error correction data specific to the digital output to correct the digital output, whereby an error corrected digital output is generated. | ||||||
| 189 | Detection Circuit | US12172047 | 2008-07-11 | US20090015240A1 | 2009-01-15 | Kazuyuki Kobayashi |
| A detection circuit includes: a control signal updating circuit configured to update a digital control signal for controlling drive of a sensor based on a clock having a predetermined frequency; a digital to analog converter configured to convert the digital control signal output from the control signal updating circuit to an analog control signal for driving the sensor; a comparator configured to compare a voltage level of a detection signal from the sensor which changes depending on the analog control signal with a reference voltage having a predetermined voltage level to output a comparison result signal; and a counter configured to count to measure a time period depending on the detection signal based on the comparison result signal output from the comparator and a clock having a predetermined frequency. | ||||||
| 190 | System and method for providing temperature data from a memory device having a temperature sensor | US11303680 | 2005-12-16 | US07441949B2 | 2008-10-28 | Jeff W. Janzen; Jeffrey P. Wright; Todd D. Farrell |
| A circuit and method for providing temperature data indicative of a temperature measured by a temperature sensor. The circuit is coupled to the temperature sensor and configured to identify for a coarse temperature range one of a plurality of fine temperature ranges corresponding to the temperature measured by the temperature sensor and generate temperature data that is provided on an asynchronous output data path. | ||||||
| 191 | On-chip temperature sensor | US11891949 | 2007-08-14 | US20080144415A1 | 2008-06-19 | Agostino Macerola; Giulio-Giuseppe Marotta; Marco-Domenico Tiburzi |
| A temperature invariant reference voltage and a temperature variant physical quantity, such as a voltage or current, are generated. The temperature variant physical quantity changes in response to a temperature of the integrated circuit. A temperature sensor circuit generates a voltage that is linearly dependent on the temperature. A level generator circuit generates 2n−1 voltage levels from the reference voltage. A comparator circuit, such as an analog-to-digital circuit, compares the voltage from the temperature sensor to the 2n−1 voltage levels to determine which level is closest. An n-bit digital output of the resulting level is proportional to the temperature of the integrated circuit. | ||||||
| 192 | Sensors and sensor circuits which convert sense currents to digital values | US10954516 | 2004-09-30 | US07372448B2 | 2008-05-13 | Gyeong-nam Kim |
| A sensor circuit, e.g., a circuit for use with a sensor that develops a current responsive to temperature, includes a digital to analog (D/A) comparison circuit having an analog sense current input and a digital input, the D/A comparison circuit operative to compare a digital value at the digital input to a sense current at the sense current input and to responsively generate a comparison signal. The sensor circuit further includes a control circuit configured to provide digital values to the digital input of the D/A comparison circuit responsive to the comparison signal and to generate a digital output corresponding to the sense current. | ||||||
| 193 | CMOS temperature-to-digital converter with digital correction | US11584421 | 2006-10-21 | US20080095213A1 | 2008-04-24 | Xijian Lin; Phillip J. Benzel |
| Methods and systems for producing a digital temperature reading are provided. In an embodiment, one or more current sources and one or more switches are used to selectively provide a first amount of current (I1) and a second amount of current (I2) to the emitter of a transistor (Q1), during different time slots of a time period, to thereby produce a first base-emitter voltage (Vbe1) and a second base-emitter voltage (Vbe2), where I1=I2*M, and M is a known constant. An analog-to-digital converter (ADC) digitizes analog signals representative of the magnitudes Vbe1 and Vbe2. A difference is determined between the magnitudes of Vbe1 and Vbe2. A digital calculator produces a digital temperature reading (DTR) based on the difference between the magnitudes of Vbe1 and Vbe2. | ||||||
| 194 | Sensing device for sensing a physical parameter | US10552129 | 2004-04-06 | US07348561B2 | 2008-03-25 | Artur Wilhelm Suntken |
| The sensing device for sensing a physical parameter such as radiation, temperature or the like, comprises an analogue sensor element sensitive for the physical parameter to be sensed and outputting an analogue signal and an analogue two-digital converter (ADC) having an MOS input stage for receiving the analogue output signal of the sensor element so as to convert the analogue output signal to a digital output signal. | ||||||
| 195 | Temperature sensor providing a temperature signal in digital form | US11894303 | 2007-08-20 | US20080043810A1 | 2008-02-21 | Lionel Vogt; Youness Chara |
| An embodiment of a temperature sensor providing a digital signal representative of temperature comprises a measurement unit providing a first measurement current equal to the sum of at least a first current proportional to temperature and of a second current; a comparator capable of providing a comparison signal which depends on the comparison between the first current and the difference between a third current and the second current; a coding unit receiving the comparison signal and providing said digital signal; a digital-to-analog converter capable of providing the second current and the third current, said difference corresponding to the conversion of said digital signal; and a unit for providing a reference voltage. | ||||||
| 196 | Sensing apparatus | US11808817 | 2007-06-13 | US20070290905A1 | 2007-12-20 | Masayuki Kobayashi; Shinichi Itagaki |
| A sensing apparatus includes a microprocessor having an A/D converting function of digital-converting an analog electric quantity supplied to an A/D conversion port and taking in a conversion result, and a plurality of electrical elements that are connected with the microprocessor and generate analog electric quantities. The plurality of electrical elements are respectively connected with a plurality of switch ports in the microprocessor that can be selectively grounded by internal switches of the microprocessor. Analog electric quantities generated in the electrical elements can be selectively taken into the A/D converting function of the microprocessor by selectively switching the internal switches. | ||||||
| 197 | Self-calibrating temperature sensors and methods thereof | US11790174 | 2007-04-24 | US20070286259A1 | 2007-12-13 | Duk-Min Kwon; Kee-Won Kwon |
| A self-calibrating temperature sensor and a method thereof are provided. The self-calibrating temperature sensor may include a reference voltage generator to generate a reference voltage based on temperature, a digital-to-analog converter to convert a first digital signal into an analog sensing voltage, a comparator to compare the reference voltage with the analog sensing voltage, and to generate a comparison result signal, a digital signal generator to generate and update the first digital signal based on the comparison result signal, a first storage circuit to store the first digital signal based on a first temperature, a data output unit to output data corresponding to a second temperature based on the first digital signal and a second digital signal output from the first storage circuit. | ||||||
| 198 | System and method for providing temperature data from a memory device having a temperature sensor | US11303680 | 2005-12-16 | US20070140315A1 | 2007-06-21 | Jeff Janzen; Jeffrey Wright; Todd Farrell |
| A circuit and method for providing temperature data indicative of a temperature measured by a temperature sensor. The circuit is coupled to the temperature sensor and configured to identify for a coarse temperature range one of a plurality of fine temperature ranges corresponding to the temperature measured by the temperature sensor and generate temperature data that is provided on an asynchronous output data path. | ||||||
| 199 | Digital temperature detection circuit for semiconductor device | US11599433 | 2006-11-15 | US20070110123A1 | 2007-05-17 | Jeong Sik Nam; Chul Woo Park |
| A digital temperature detection circuit for a semiconductor circuit comprises a digital temperature defection block and a data conversion block. The digital temperature detection block is adapted to detect an internal temperature of the semiconductor device and generate detection data having a data value that varies according to the detected internal temperature. The data conversion block is adapted to convert the detection data into standard data with a predetermined response interval using first and second sample data having respective data values that are determined by input from an external source. | ||||||
| 200 | DIGITAL MEASURING SYSTEM AND METHOD FOR INTEGRATED CIRCUIT CHIP OPERATING PARAMETERS | US11557745 | 2006-11-08 | US20070101227A1 | 2007-05-03 | Herschel Ainspan; Philip Emma; Rick Rand; Arthur Zingher |
| This invention relates to digitally measuring operating parameters, for example, temperature, within a semiconductor chip and making those measurements internally available to hardware, firmware, and software. | ||||||
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