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Digital scale for tomography and method of using same

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专利汇可以提供Digital scale for tomography and method of using same专利检索,专利查询,专利分析的服务。并且A test object for measuring the depth of focus of an X-ray exposure. The test object is comprised of a planar surface of Xray transparent material on which are positioned a coded array of X-ray opaque elements. In use, the test object is angularly inclined to the X-ray field so that the number of coded elements in focus in the resulting X-ray exposure provides a measurement of the depth of focus of the X-ray device.,下面是Digital scale for tomography and method of using same专利的具体信息内容。

1. A digital scale for tomography comprising a planar surface of X-ray transparent material inclined at an angle with respect to an X-ray beam axis and a plurality of X-ray opaque elements mounted upon said planar surface and arranged in a continuous, descending relationship such that every horizontal plane passing through said planar surface will pass through an opaque element or intersection thereof, wherein the relationship of the angle of inclination of said transparent material and the projection of the image of said opaque elements upon a horizontal surface determines the depth of focus of an X-ray focus plane.
2. The device of claim 1 wherein said X-ray opaque elements form a rectangular outline and are arranged in a binary code.
3. The device of claim 1 used in combination with a test object for locating the focus plane of a tomographic X-ray machine.
4. The device of claim 3 in which indicating means are provided to indicate alignment of said test objects.
5. A method for predetermining the depth of focus at the focus plane for radiographs produced by a tomographic process comprising: a. locating a sheet of X-ray transparent material including X-ray opaque elements thereon arranged in a coded sequence in the path between an X-ray source and a film plane, wherein said sheet of X-ray transparent material is inclined at an angle with respect to said film plane; b. exposing said sheet containing said X-ray opaque elements to a source of X-ray energy, and projecting such exposure onto a film sensitive to X-ray radiation; c. removing said source of X-ray energy and processing said film; and d. inspecting said film to determine the continuous coded sequence which is sharply defined thereon identifying the depth of focus at the focus plane.
6. The method recited in claim 5 further comprising: a. locating a test object for determining a focus plane adjacent said inclined sheet of X-ray transparent material including X-ray opaque elements in the path between an X-ray source and a film plane; b. selecting a focus plane on said test object; c. aligning said preselected focus plane on said test object with an X-ray opaque element on said inclined sheet of X-ray transparent material; d. exposing said test object and said inclined sheet simultaneously to a source of X-ray radiation and projecting said exposure onto a film sensitive to X-ray radiation; e. removing said X-ray source and processing said film; and f. inspecting said processed film to identify said preselected focus plane and said depth of focus of said focus plane defined by variations in distinctness of the image of said X-ray opaque elements.
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