首页 / 专利库 / 电气元件和设备 / 双极结型晶体管 / Semiconductor integrated circuit device

Semiconductor integrated circuit device

阅读:961发布:2023-04-27

专利汇可以提供Semiconductor integrated circuit device专利检索,专利查询,专利分析的服务。并且PURPOSE:To ensure the coexistence on the same chip for both the P-MOS and the bipolar transistor without impairing the high frequency characteristics of the N-MOS. CONSTITUTION:N -layer 4a and 4 are formed on P-type substrate 1 with stacking of P-epitaxial layer 23 to form N -layer 24, 25 and 26 reaching the buried layer. Then a selective diffusion is given to layer 24 and 26 to form P-layers 27-29, and furthermore N-layers 30-32 are formed selectively to layer 27 and island region 23a. The insulator thin film is provided between layer 32-33 and 28-29 with installation of gate electrode 17 and 20, and at the same time the electrodes are provided to other layers with drilling of windows to the insulator film. In such structure, it is not necessary to form channel 35 of P-MOS in an independent way, thus the manufacturing process being reduced. And layer 23a of N-MOS features the N-type inversion on the surface of the N -epitaxial layer to be directly used as the depletion- type N-MOS, featuring the stable control of the threshold voltage because of the dependence only on the density of the epitaxial layer. Thus, the N-MOS excelling in the high frequency characteristics can be manufactured with a high controlability.,下面是Semiconductor integrated circuit device专利的具体信息内容。

高效检索全球专利

专利汇是专利免费检索,专利查询,专利分析-国家发明专利查询检索分析平台,是提供专利分析,专利查询,专利检索等数据服务功能的知识产权数据服务商。

我们的产品包含105个国家的1.26亿组数据,免费查、免费专利分析。

申请试用

分析报告

专利汇分析报告产品可以对行业情报数据进行梳理分析,涉及维度包括行业专利基本状况分析、地域分析、技术分析、发明人分析、申请人分析、专利权人分析、失效分析、核心专利分析、法律分析、研发重点分析、企业专利处境分析、技术处境分析、专利寿命分析、企业定位分析、引证分析等超过60个分析角度,系统通过AI智能系统对图表进行解读,只需1分钟,一键生成行业专利分析报告。

申请试用

QQ群二维码
意见反馈