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COLOR IMAGING FOR CMP MONITORING

阅读:1033发布:2020-08-01

专利汇可以提供COLOR IMAGING FOR CMP MONITORING专利检索,专利查询,专利分析的服务。并且A polishing system includes a polishing station including a platen to support a polishing pad, a support to hold a substrate, an in-line metrology station to measure the substrate before or after polishing of a surface of the substrate in the polishing station, and a controller. The in-line metrology station includes a color line-scan camera, a white light source, a frame supporting the light source and the camera, and a motor to cause relative motion between the camera and the support along a second axis perpendicular to the first axis to cause the light source and the camera to scan across the substrate. The controller is configured to receive a color data from the camera, to generate a 2-dimensional color image from the color data, and to control polishing at the polishing station based on the color image.,下面是COLOR IMAGING FOR CMP MONITORING专利的具体信息内容。

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