序号 专利名 申请号 申请日 公开(公告)号 公开(公告)日 发明人
161 Optical image-forming mirror systems having aspherical reflecting surfaces US28891052 1952-05-20 US2819404A 1958-01-07 GUNTHER HERRNRING; WALTER WEIDNER
162 Optical image-forming plural reflecting mirror systems US37893653 1953-09-08 US2766385A 1956-10-09 GUNTHER HERRNRING; WALTER WEIDNER
163 Short-wave electromagnetic radiation catoptrics US6245248 1948-11-29 US2557662A 1951-06-19 HARMON KIRKPATRICK PAUL
164 X-RAY IRRADIATION DEVICE AND ANALYSIS DEVICE EP11762263.9 2011-03-30 EP2542035B1 2018-08-29 YAMAZUI, Hiromichi; KOBAYASHI, Keisuke; IWAI, Hideo; KOBATA, Masaaki
[Object] The present invention provides an X-ray irradiation device capable of adjusting the energy of X-rays in a wide range, and an analysis device equipped with the X-ray irradiation device. [Solving Means] An X-ray irradiation device according to an embodiment of the present invention focuses X-rays emitted from an X-ray generation mechanism to a predetermined focal position by a focusing mechanism. The X-ray generation mechanism has a structure which generates a plurality of X-rays having different wavelengths. The focusing mechanism has a structure in which the plurality of X-rays are focused to the same focal position by focusing elements having diffraction characteristics suitable for the wavelengths of the respective X-rays generated by the X-ray generation mechanism.
165 GAMMA-RAY MICROSCOPY METHODS EP13730668.4 2013-04-29 EP2992533A1 2016-03-09 TRAN, Nathaniel
This invention teaches a method of performing gamma-ray microscopy and how to build a gamma-ray microscope as well as its equivalent X-ray microscope, and neutron microscope. The method uses projection microscopy with a single-point source of radiation projecting the image of a sample onto a detector array like a film being projected onto a big screen in a movie theater. The advancement here is the creation of point source of radiation small enough to be significant because the size of this point source determines the best resolution possible. The point source of gamma rays is created by crossing a beam of electrons or just ions and a beam of positrons where both beams can be focused to be as small as their De Broglie wavelength. Similarly, a point source for X-rays is generated by crossing a beam of electrons and a beam of ions. A point source of neutrons can be created by crossing a beam of electrons and a beam of protons with sufficient energy, or a beam of protons knocking neutrons out of a beam of mercury ions. Methods for sourcing positrons and ions are taught as well as other features that are necessary to perform these microscopy methods.
166 X-ray microscope EP12164870.3 2007-10-10 EP2511844B1 2015-08-12 Birnbaum, Eva, R.; Koppisch, Andrew, T.; Baldwin, Sharon, M.; Warner, Benjamin, P.; McCleskey, Mark, T.; Berger, Jennifer, A.; Stewart, Jeffrey, J.; Harris, Michael, N.; Burrell, Anthony, K.
167 CLUSTER ANALYSIS OF UNKNOWNS IN SEM-EDS DATASET EP13810227 2013-06-28 EP2867656A4 2015-07-01 BUHOT MICHAEL; PHAN VAN HUNG; OWEN MICHAEL JAMES
The present invention discloses a method for determining the mineral content represented by the entire SEM-EDS dataset, including initially unknown data points. SEM-EDS data points are taken and compared to a set of known data points. Any data point that is not sufficiently similar to the known data point is classified as unknown and clustered with like unknown data points. After all data points are analyzed, any clusters of unknown data points with a sufficient number of data points are further analyzed to determine their characteristics. All clusters of unknown data points with an insufficient number of data points to allow further analysis are considered outliers and discarded.
168 SAMPLE-CONTAINING CELL FOR X-RAY MICROSCOPE AND METHOD FOR OBSERVING X-RAY MICROSCOPIC IMAGE EP12830348.4 2012-08-31 EP2755209A1 2014-07-16 OGURA, Toshihiko; TAKAHASHI, Toru

Observation samples 16 in a sample solution 15 are held due to absorption or the like on the rear face of a first X-ray transmission film 14a. In a mirror body, while an X-ray emission film 13 and X-ray transmission films 14a and 14b are bent to be convex outward due to the pressure difference, an X-ray transmission film 14c is bent to be convex toward the X-ray transmission film 14a side due to gas expansion in a second cavity part 11b. This bending results in widening of a gap between the first and second X-ray transmission films 14a and 14b in the center part of these more compared with a gap between the end parts of these. However, despite the fact that lengthening of the X-ray optical path length over the primary visual field region of X-ray microscope observation arises between the X-ray transmission films 14b and 14c, there is almost no change between the X-ray transmission films 14a and 14c. Accordingly, even when the X-ray emission film and the X-ray transmission films are bent inside the mirror body, lengthening of the X-ray optical path length takes place in the second cavity part 11 b (gas portion) in which X-ray absorption does not take place, this enabling absorption of the X-rays by the sample solution 15 to be suppressed.

169 Advanced drug development and manufacturing EP12164870.3 2007-10-10 EP2511844A3 2013-03-27 Birnbaum, Eva, R.; Koppisch, Andrew, T.; Baldwin, Sharon, M.; Warner, Benjamin, P.; McCleskey, Mark, T.; Berger, Jennifer, A.; Stewart, Jeffrey, J.; Harris, Michael, N.; Burrell, Anthony, K.

There is described an apparatus for measuring protein characteristics comprising an X-ray fluorescence (XRF) spectrometer comprising a source of polychromatic X-rays, an X-ray detector, a protein, a molecule that has been exposed to and at least weakly binds to the protein, a plurality of X-ray fluorescence signal data obtained by irradiating chemical elements in the protein and molecule with the polychromatic X-rays and a security system for maintaining records for the data from the plurality of X-ray fluorescence signal measurements. There is also described an x-ray microscope for measuring a sample.

170 X-RAY IRRADIATION DEVICE AND ANALYSIS DEVICE EP11762263.9 2011-03-30 EP2542035A1 2013-01-02 YAMAZUI, Hiromichi; KOBAYASHI, Keisuke; IWAI, Hideo; KOBATA, Masaaki

[Object] The present invention provides an X-ray irradiation device capable of adjusting the energy of X-rays in a wide range, and an analysis device equipped with the X-ray irradiation device.

[Solving Means] An X-ray irradiation device according to an embodiment of the present invention focuses X-rays emitted from an X-ray generation mechanism to a predetermined focal position by a focusing mechanism. The X-ray generation mechanism has a structure which generates a plurality of X-rays having different wavelengths. The focusing mechanism has a structure in which the plurality of X-rays are focused to the same focal position by focusing elements having diffraction characteristics suitable for the wavelengths of the respective X-rays generated by the X-ray generation mechanism.

171 X-RAY FLUORESCENCE ANALYSIS METHOD EP07874491.9 2007-10-10 EP2084519B1 2012-08-01 BIRNBAUM, Eva, R.; KOPPISCH, Andrew, T.; BALDWIN, Sharon, M.; WARNER, Benjamin, P.; MCCLESKEY, Mark, T.; BERGER, Jennifer, A.; STEWART, Jeffrey, J.; HARRIS, Michael, N.; BURRELL, Anthony, K.
X-ray fluorescence (XRF) spectrometry has been used for detecting binding events and measuring binding selectivities between chemicals and receptors. XRF may also be used for estimating the therapeutic index of a chemical, for estimating the binding selectivity of a chemical versus chemical analogs, for measuring post-translational modifications of proteins, and for drug manufacturing.
172 MULTIPLE GAS INJECTION SYSTEM FOR CHARGED PARTICLE BEAM INSTRUMENTS EP05810798 2005-07-21 EP1774538A4 2012-06-06 MOORE THOMAS M
173 DIFFERENTIAL PHASE-CONTRAST IMAGING WITH CIRCULAR GRATINGS EP10710906.8 2010-03-15 EP2410921A1 2012-02-01 ROESSL, Ewald; KOEHLER, Thomas; MARTENS, Gerhard
The invention relates to an X-ray differential phase-contrast imaging system which has three circular gratings. The circular gratings are aligned with the optical axis of the radiation beam and a phase stepping is performed along the optical axis with the focal spot, the phase grating and/or the absorber grating. The signal measured is the phase-gradient in radial direction away from the optical axis.
174 Method of imaging an object EP10161444.4 2010-04-29 EP2383767A1 2011-11-02 Boughorbel, Faysal; Kooijman, Cornelis; Lich, Berend

The invention relates to a method of acquiring two images with e.g. a Scanning Electron Microscope (SEM), and combine the images to form a combined image in which information of the surface layer or a subsurface layer is enhanced. To that end the probe parameters of the electron beam (110,120,140) of the SEM are different for the two images, one image is made at a lower energy than the other image. By reducing the mutual information between the two images, the combined image shows enhanced information of a subsurface layer.

175 SOURCE GRATING FOR X-RAYS, IMAGING APPARATUS FOR X-RAY PHASE CONTRAST IMAGE AND X-RAY COMPUTED TOMOGRAPHY SYSTEM EP09733319.9 2009-04-13 EP2248135A1 2010-11-10 ITOH, Hidenosuke; ICHIMURA, Yoshikatsu; NAKAMURA, Takashi; IMADA, Aya
A source grating for X-rays and the like which can enhance spatial coherence and is used for X-ray phase contrast imaging is provided. The source grating for X-rays is disposed between an X-ray source and a test object and is used for X-ray phase contrast imaging. The source grating for X-rays includes a plurality of sub-gratings (130,120) formed by periodically arranging projection parts each having a thickness (140) shielding an X-ray (110) at constant intervals (A'). The plurality of sub-gratings are stacked in layers by being shifted (1/2 A').
176 X-RAY IMAGE MAGNIFYING DEVICE EP03712806 2003-03-20 EP1492129A4 2007-12-05 OHBA AKIRA; SUGIYAMA MASARU; ONODA SHINOBU
An X-ray image magnifying device characterized by comprising an illuminating optical system (3) for illuminating a sample (4) with an X-ray emitted from a radiation source (1), an object lens (5) composed of an oblique incident mirror consisting of a paraboloid of revolution and an ellipsoid of revolution to allow an X-ray passed through the sample (4) to be magnified and imaged at a specified position, an X-ray image detecting means (6) for detecting a formed X-ray image, and an imaging magnification regulating means for moving at least one of the detecting means (6), the sample (4) and the optical system (3) along an optical-axis direction to regulate the imaging magnification of an X-ray image. Consequently, an X-ray image magnifying device that uses an oblique incident mirror as an object lens enables changing of imaging magnification without interchanging an oblique incident mirror.
177 X-RAY MICROSCOPE EP02736310 2002-03-05 EP1482520A4 2007-11-07 KUMAKHOV MURADIN ABUBEKIROVICH
The inventive X-ray microscope comprises an extended X-ray source, a unit for placing a studied object (3), a recording unit and an X-ray capillary lens disposed therebetween. The channels of said lens are divergent in the direction of the recording unit. The unit for placing the studied object is disposed between the extended X-ray source and the smallest end of the X-ray capillary lens. The inventive device is characterised in that the walls of the channels (14, 16) for transmitting radiation are coated with or made of a material which absorbs or scatters X-ray radiation, and are shaped in the form of the lateral surface of a frustum of cone or pyramid, or of a truncated cylinder or prism. Said material excludes the effect of total external reflection. The straightness of the longitudinal axes of the channels makes it possible to use said channels as collimators. The resolution capability totally depends on technological capabilities to reduce the input size of the channels. The use of the extended X-ray source makes it possible to significantly reduce the time of exposure and the power of an X-ray tube.
178 MULTIPLE GAS INJECTION SYSTEM FOR CHARGED PARTICLE BEAM INSTRUMENTS EP05810798.8 2005-07-21 EP1774538A2 2007-04-18 Moore, Thomas, M.
We disclose a gas injection system having at least one crucible, each crucible holding at least one deposition constituent; at least one transfer tube, the number of transfer tubes corresponding to the number of crucibles, each transfer tube being connected to a corresponding crucible. There is at least one metering valve, the number of metering valves corresponding to the number of transfer tubes, each metering valve being connected to a corresponding transfer tube so that the metering valve can measure and adjust vapor flow in the corresponding transfer tube. A sensor is provided capable of sensing reactions between deposition constituents and a focused ion beam A computer is connected to receive the output of the sensor; the computer is also connected to each metering valve to control the operation of the valve, and the computer is programmed to send control signals to each metering valve to control the operation of the valve; the control signals being computed responsive to feedback from the output of the sensor.
179 Soft X-ray microscope EP06254454.9 2006-08-25 EP1760725A2 2007-03-07 Yoon, Kwon-ha; Kim, Kyong-woo

A soft X-ray microscope includes a table (10); a housing (20) installed to the upper side of the table (10) and having a partition (22); a light source chamber (30) installed lower than the partition (22) of the housing (20) to project a light to liquid jetted under a high pressure to generate plasma; a mirror chamber (40), installed above the partition (22) of the housing (20), in which first and second mirror (410 and 430) are respectively installed to upper and lower sides of a holder (420) for storing a living sample, the soft X-ray generated by the plasma generated in the light source chamber (30) illuminates the living sample, and the soft X-ray penetrated the living sample is amplified to obtain an image in an image capturing chamber; and an image capturing chamber (50) installed to the upper side of the housing (20) to amplify a light image signal amplified through the mirror chamber (40) and to capture the light image on an external screen to allow distinguishing the light image from exterior.

180 Abbildungssystem für ein, auf extrem ultravioletter (EUV) Strahlung basierendem Mikroskop EP03016371.1 2003-07-19 EP1471539B1 2006-08-23 Dobschal, Hans-Jürgen; Greif-Wüstenbecker, Jörn; Brunner, Robert; Rosenkranz, Norbert; Scherübl, Thomas
QQ群二维码
意见反馈