Test system of digital-analog converter
专利汇可以提供Test system of digital-analog converter专利检索，专利查询，专利分析的服务。并且PURPOSE: To test the dynamic characteristic of a D/A converter to be tested around the highest converting speed with high accuracy by using a clock being a frequency division of a conversion clock of the D/A converter to be tested as the conversion clock for an A/D converter.
CONSTITUTION: A reference frequency f
0 of a low phase noise specifying the conversion speed of the D/A converter 4 to be tested is generated by a frequency synthesizer 6 and a clock generator 2 generates the conversion clock of low jitter synchronously with the reference frequency f
0 . A pattern generator 7 generates a digital test data corresponding to the bit number of the D/A converter 4 to be tested and an output analog signal of the D/A converter 4 to be tested is A/D-converted by a reference A/D converter 5 having a higher resolution than that of the D/A converter to be tested. Further, the conversion clock has a frequency f
0 /M being 1/M frequency division of the output frequency f
0 of the clock generator 2 by the frequency divider 10. The A/D converter 5 applies A/D conversion to an output data of the D/A converter 4 to be tested at M-period of the reference frequency and its output data is analyzed by a computer 11.
COPYRIGHT: (C)1987,JPO&Japio，下面是Test system of digital-analog converter专利的具体信息内容。
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