Aberration measuring device
专利汇可以提供Aberration measuring device专利检索，专利查询，专利分析的服务。并且PURPOSE:To make it possible to measure the abrration in a simple constitution by controlling the deflection scanning by small laser luminous flux through a microcomputer and measuring the position of luminous flux transmitted through a lens to be checked and the like quickly and highly accurately. CONSTITUTION:When optical parameters such as a focal length of the lens to be checked are set by a teletypewriter 46 and the like, a minicomputer 32 computes the corresponding intervals between measuring points and numbers of the measuring points and controls scanning devices 23 and 27 which rotate scanning mirrors 26 and 27. The incident position of the small scanning laser luminous flux to the lens 29 from a laser 20 is computed and stored in a memory. The image which has transmitted through the lens 29 is electrooptically detected by a position sensor 30 comprising many semiconductor elements, which are provided on an image plane in an arbitrary plane and cross to each other at a right angle. The position of the transmitted luminous flux is measured quickly and highly accurately by digital processing. Therefore the automatic measurement can be performed quickly and highly accurately in the simple constitution without photographing, development, and the like.，下面是Aberration measuring device专利的具体信息内容。
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