Semiconductor device
专利汇可以提供Semiconductor device专利检索，专利查询，专利分析的服务。并且PURPOSE: To secure the steady characteristics for the diode by avoiding exposure of the breakdown part of the PN junction constituting the diode onto the surface of the semiconductor substrate when the Zener diode is formed within bipolar IC.
CONSTITUTION: N
+ -type buried layer 3 is formed by diffusion on P-type Si substrate 1 with SiO
2 film 2 used as the mask, and film 2 is removed to form N
- -type layer 4 on the entire surface through the epitaxial growth. Then film 2 is used as the mask again to form by ion injection N
+ -type layer 5a to reduce the collector resistance for the transistor within layer 4 plus N
+ -type layer 5b to stop the area causing the breakdown within the semiconductor substrate. After this, an opening is formed to film 2 to form P-type isolation region 6, and at the same time both layer 5a and 5b made to reach layer 3 simultaneously through the heat treatment. Thus, the caused N
- -type region 4a and 4b are used as the Zener diode and the bipolar transistor respectively. Then P
+ -type layer 8 to be used as the P pole and P-type base layer 7 are formed by diffusion at region 4a and 4b respectively, and N
+ -type emitter region 9 is provided within layer 7.
COPYRIGHT: (C)1979,JPO&Japio，下面是Semiconductor device专利的具体信息内容。
| 标题 | 发布/更新时间 | 阅读量 |
|---|---|---|
| 一种含有背面槽栅及浮空环的逆导型IGBT | 2020-05-11 | 514 |
| 用于快速电流感测和晶体管时序控制的系统和方法 | 2020-05-08 | 313 |
| 电压检测比较器 | 2020-05-11 | 197 |
| 换流器MMC及基于MMC的直流故障隔离方法和系统 | 2020-05-08 | 92 |
| 自供电控制电路及控制方法以及开关电源电路 | 2020-05-11 | 112 |
| 一种磷化铟双异质结双极型晶体管制造方法 | 2020-05-08 | 550 |
| 变压器模型的仿真方法、控制方法、电子设备及存储介质 | 2020-05-11 | 251 |
| 单片集成式半桥功率器件模块 | 2020-05-08 | 740 |
| 一种高兼容性一拖二并联逆变感应加热系统 | 2020-05-11 | 375 |
| 一种基于产品需求的PCB板布局结构 | 2020-05-11 | 104 |
高效检索全球专利专利汇是专利免费检索,专利查询,专利分析-国家发明专利查询检索分析平台，是提供专利分析，专利查询，专利检索等数据服务功能的知识产权数据服务商。
我们的产品包含105个国家的1.26亿组数据，免费查、免费专利分析。
专利汇分析报告产品可以对行业情报数据进行梳理分析，涉及维度包括行业专利基本状况分析、地域分析、技术分析、发明人分析、申请人分析、专利权人分析、失效分析、核心专利分析、法律分析、研发重点分析、企业专利处境分析、技术处境分析、专利寿命分析、企业定位分析、引证分析等超过60个分析角度，系统通过AI智能系统对图表进行解读，只需1分钟，一键生成行业专利分析报告。
