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Formation of semiconductor protective film

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专利汇可以提供Formation of semiconductor protective film专利检索,专利查询,专利分析的服务。并且PURPOSE: To enable to eliminate the difficulty of surface treating in the semiconductor element manufacturing process, that is caused bt the reactivity of protective films to chemicals, by a method wherein semiconductor blanks, each having a film consisting of a compound of semiconductor elements, such as an oxide film or a nitride film, on the surface thereon, are accomodated in a vacuum container and heated, and diborane gas is introduced into the vacuum container.
CONSTITUTION: Semiconductor blanks 12, each formed with an insulating protective film thereon, are placed on a cathode 3. First, the air in the interior of a vacuum container 1 is evacuated by a vacuum evacuating system 9 and after the vacuum container 1 has been brought into a high vacuum state of about 1×10
-7 Torr, an adjusting valve 10 is throttled and the evacuating speed of the evacuating system 19 is reduced, and at the same time, diborane gas is introduced into the container 1 through a gas flow controller 8 and the pressure in the interior of the container 1 is adjusted to 0.1W10Torr. The semiconductor elementary boides 12 are kept having been by a heater 5 to 300°C, for example. After then, a voltage is impressed between electrodes 2 and 3 by a DC electric power source 4 to make a glow discharge generate. As a result, the diborane gas is resolved and a boron film is respectively formed on the protective film of each of the semiconductor blanks 12.
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