Fixed point probe card and an assembly and repair fixture therefor专利检索-集成电路卡集成电路专利检索查询-专利查询网

Fixed point probe card and an assembly and repair fixture therefor

阅读：157发布：2023-12-11

专利汇可以提供Fixed point probe card and an assembly and repair fixture therefor专利检索，专利查询，专利分析的服务。并且A probe card for testing integrated circuit patterns having contacts deployed thereon, the patterns being formed in a microelectronic substrate. The card includes an opening providing access to a pattern and a ring of spaced conductive pads surrounding the opening. Anchored on selected pads are needleholders having needles extending therefrom to engage the contacts in the pattern being tested, all needle extensions being of the same length and all needle points lying in a common plane. In order to facilitate attachment of each needle-holder to its pad on the card and to orient the holder before such attachment so that the needle point is precisely aligned with the related contact, an assembly fixture is provided.，下面是Fixed point probe card and an assembly and repair fixture therefor专利的具体信息内容。

权利要求

1. A fixed point probe card for testing integrated circuiT patterns formed on a substrate, each pattern having contacts deployed thereon at diverse points, said card comprising: A. a planar printed circuit board having an opening providing access to an integrated circuit pattern, said board being subject to slight warpage, B. an array of spaced conductive pads surrounding said opening, said pads being connected by said printed circuit to terminals, and C. probes cantilevered from selected pads to provide connections between said integrated circuit contacts and said terminals, each probe being constituted by a rigid needle-holder formed of a thin strip of metal lying in the vertical plane and slightly raised above a respective pad, said holder being soldered to said pad to maintain the position thereof, and a resilient needle directly attached to the holder and extending therefrom, the needle extensions of all probes being of the same lengths, the raised holders being soldered to said pads at oriented positions relative thereto whereby regardless of board warpage, the points of all needles extending from the holder lie in a common plane and are disposed to engage said contacts, the needle holders being cantilevered from their respective pads to a degree necessary to bring the points into engagement with the contacts deployed at diverse points on the pattern.

2. A probe card as set forth in claim 1, wherein said opening is reinforced by a wafer placed on the side of the card opposite the ring of pads.

3. A probe card as set forth in claim 1, wherein said printed circuit connects even-numbered pads to terminals placed on the edge of the card on one side thereof, and connects odd-numbered pads to terminals placed on the edge of the card on the other side thereof.

4. A probe card as set forth in claim 1, wherein said pads are equi-spaced and are wedge-shaped.

5. A probe card as set forth in claim 1, wherein said strip is contoured to define an arm whose lower edge is soldered to the pad, the free end of the arm terminating in a downwardly extending tooth.

6. A probe card as set forth in claim 5, wherein said tooth is provided with a slot adjacent the lower edge to accommodate the shank of the needle which is soldered thereto.

7. A probe card as set forth in claim 5, wherein the shank of said needle is soldered to the lower edge of said tooth.

8. A probe card as set forth in claim 5, wherein said arm is provided with a break-away tab.

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Fixed point probe card and an assembly and repair fixture therefor

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