首页 / 专利库 / 集成电路 / 集成电路卡 / System for automatically checking boards bearing integrated circuits

System for automatically checking boards bearing integrated circuits

阅读:293发布:2023-12-22

专利汇可以提供System for automatically checking boards bearing integrated circuits专利检索,专利查询,专利分析的服务。并且A system for checking boards bearing integrated circuits, wherein a program card is read automatically to provide both test input signals to the board and simulation output signals representative of the correct output signals which should be delivered by the board in response to the test input signals, and wherein the actual output signals delivered by the board are compared with the simulation output signals for generating indicia representing any defects which may exist in the board.,下面是System for automatically checking boards bearing integrated circuits专利的具体信息内容。

1. A system for testing digital electric circuits having input terminals to receive input signal patterns and output terminals to deliver output signal patterns wherein a predetermined succession of test signal patterns is applied to the input terminals of a circuit under test and wherein each of the output signals patterns at the output terminals of said circuit is compared with a simulation signal pattern comprising: a. a system terminal for each input and output terminal of the circuit under test, b. a plurality of comparing means, one for each system terminal, having first and second inputs to receive binary signals to be compared, a third clock input, a first output signal dependent on a comparison result upon reception of a clock signal and second output showing a binary signal equal to the one received at the first input, c. a plurality of displaying means responsive to output signals from said comparing means for displaying the result of said comparison, d. a support member bearing indicia representing said succession of test signal patterns and said simulation signal patterns, e. reading means to read out said indicia and to deliver a successioN of test signal patterns and simulation signal patterns to the first inputs of said plurality of comparing means, f. timing means to deliver a clock signal to said third clock inputs of said plurality of comparing means, g. means for connecting each second input of said plurality of comparing means to a respective system terminal, and h. switching means to selectively connect selected ones of said system terminals corresponding to input terminals of the circuit under test with corresponding second outputs of said comparing means, whereby test signal patterns are applied to the input terminals of the circuit under test through selected ones of said switching means and output patterns are delivered to said comparing means through selected ones of said connection means.
2. The system of claim 1, wherein said support member comprises a substantially rigid card provided with said indicia arranged in a geometrical matrix, each column of said matrix corresponding to one of said comparing means.
3. The system of claim 1 wherein said displaying means further comprise a timing input to display a comparison result only upon reception of a timing signal and wherein said timing means further delivers a timing signal to said displaying means.
4. The system of claim 1 wherein said support member further bears indicia giving a representation of the test input terminals and the output terminals of the circuit under test thus providing the system with self setting capability by means of said displaying means, said comparing means and said connection means comprised in the system.
说明书全文
高效检索全球专利

专利汇是专利免费检索,专利查询,专利分析-国家发明专利查询检索分析平台,是提供专利分析,专利查询,专利检索等数据服务功能的知识产权数据服务商。

我们的产品包含105个国家的1.26亿组数据,免费查、免费专利分析。

申请试用

分析报告

专利汇分析报告产品可以对行业情报数据进行梳理分析,涉及维度包括行业专利基本状况分析、地域分析、技术分析、发明人分析、申请人分析、专利权人分析、失效分析、核心专利分析、法律分析、研发重点分析、企业专利处境分析、技术处境分析、专利寿命分析、企业定位分析、引证分析等超过60个分析角度,系统通过AI智能系统对图表进行解读,只需1分钟,一键生成行业专利分析报告。

申请试用

QQ群二维码
意见反馈