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Detour integration type optical ct

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专利汇可以提供Detour integration type optical ct专利检索,专利查询,专利分析的服务。并且PURPOSE: To achieve a higher measuring accuracy by positioning incoming and outgoing surfaces on an intersection of detour optical paths crossing on a plane to eliminate effect of magnetic fields of other phases on an optical CT.
CONSTITUTION: One end face of a Faraday rod F1 as incoming surface 10 and one end face of a Faraday rod F1 as outgoing surface are positioned separately on an intersection of detour optical paths S crossing cubically at incoming and outgoing parts thereof. With such an arrangement, an incoming surface and an outgoing surface 12 of the optical paths S formed on the outer circumference of a conductor 3 through which a current I to be measured flows cross cubically at the incoming and outgoing sections while located on the intersection point O of the optical paths S closed in plane. There is no part diviated from a closed circuit of a detour integration and thus, this eliminates effect by a magnetic field of a current of another phase thereby enabling improvement of measuring accuracy of an optical CT (current measuring device).
COPYRIGHT: (C)1990,JPO&Japio,下面是Detour integration type optical ct专利的具体信息内容。

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