| 序号 | 专利名 | 申请号 | 申请日 | 公开（公告）号 | 公开（公告）日 | 发明人 |
|---|---|---|---|---|---|---|
| 261 | Temperature detection circuit | US12906715 | 2010-10-18 | US07969227B2 | 2011-06-28 | Ryuta Hasegawa; Ryuichi Morikawa; Nobumitsu Tada; Masami Hirata |
| According to one embodiment, a temperature detection circuit is provided which requires only a small number of additional components, thus minimizing an increase in costs and which offers an insulating property and high responsiveness. A temperature detection circuit outputs a first PWM signal corresponding to a temperature of a first temperature sensor from a photointerrupter as a signal insulated from the first temperature sensor. A temperature detection circuit outputs a second PWM signal corresponding to a temperature of a second temperature sensor from a photointerrupter as a signal insulated from the second temperature sensor. A controlling arithmetic apparatus calculates a higher one of the temperatures detected by the first and second temperature sensors based on the PWM signals output from the photointerrupter. | ||||||
| 262 | METHOD FOR MEASURING TEMPERATURE OF MOTOR FOR HYBRID ELECTRIC VEHICLE | US12796744 | 2010-06-09 | US20110134959A1 | 2011-06-09 | Chul Woo Kim; Bum Sik Kim; Tae Hwan Chung; Young Kook Lee; Jin Hwan Jung; Sang Hyeon Moon; Sung Kyu Kim; Jae Won Lee |
| The present invention provides a method for measuring the temperature of a motor for a hybrid electric vehicle. In preferred embodiments, the method of the present invention can preferably ensure the stability and reliability of motor control by extending the linearity of a temperature sensor attached to the motor within a required measurement range.The present invention preferably provides a method for measuring the temperature of a motor for a hybrid electric vehicle, in which a required measurement range of motor temperature is divided into high and low temperature ranges and a hardware gain circuit is divided into first and second gain blocks such that the first gain block measures the temperature of the high temperature range and the second gain block measures the temperature of the low temperature range. | ||||||
| 263 | Analog-digital converter and on-die thermal sensor including the same | US11819816 | 2007-06-29 | US07880661B2 | 2011-02-01 | Chun-Seok Jeong; Jae-Jin Lee; Joong-Sik Kih; Jong-Man Im; Jae-Woong Choi; Myoung-Jun Chai; Kae-Dal Kwack |
| An on-die thermal sensor includes an integrating analog-digital converter not requiring a negative reference voltage input. The on die thermal sensor includes a band gap unit, an integrating unit and a counting unit. The band gap unit senses a temperature to output a first voltage corresponding to the sensed temperature. The integrating unit integrates a difference between a reference voltage and a comparing voltage to output a second voltage wherein the comparing voltage has a voltage level higher than that of the reference voltage. The counting unit counts clocks of a clock signal input thereto until the second voltage reaches the first voltage, thereby outputting a thermal code corresponding to the voltage level of the first voltage. | ||||||
| 264 | Temperature sampling in electronic devices | US11648122 | 2006-12-29 | US07844876B2 | 2010-11-30 | David Wyatt; Christopher Cox; Howard David |
| In some embodiments the continuous measuring of temperature in remote memory devices operating within an electrically noisy environment is facilitated by coordinating the progressive approximation of temperature within quiescent periods of non-activity as known by a memory controller. | ||||||
| 265 | Curvature correction methodology | US12317314 | 2008-12-22 | US07796067B2 | 2010-09-14 | Derrick Tuten |
| A method is provided to produce an error corrected digital output from a temperature measurement system that generates digital outputs representative of the output of one or more temperature sensors. In an embodiment of the invention the method comprises: storing in a plurality of memory locations corresponding error correction data, with each memory location having a correlation to a corresponding range of the digital outputs; utilizing each digital output to identify a corresponding one of the memory locations; accessing the corresponding one memory location to obtain error correction data specific to the digital output; and utilizing the error correction data specific to the digital output to correct the digital output, whereby an error corrected digital output is generated. | ||||||
| 266 | SYSTEM AND METHOD FOR PROVIDING TEMPERATURE DATA FROM A MEMORY DEVICE HAVING A TEMPERATURE SENSOR | US12702898 | 2010-02-09 | US20100142287A1 | 2010-06-10 | Jeff W. Janzen; Jeffrey P. Wright; Todd D. Farrell |
| A circuit and method for providing temperature data indicative of a temperature measured by a temperature sensor. The circuit is coupled to the temperature sensor and configured to identify for a coarse temperature range one of a plurality of fine temperature ranges corresponding to the temperature measured by the temperature sensor and generate temperature data that is provided on an asynchronous output data path. | ||||||
| 267 | Method and apparatus of measuring temperature | US11874595 | 2007-10-18 | US07726877B1 | 2010-06-01 | Shimon Avitan |
| The disclosure provides methods and apparatuses of measuring a temperature. A method of measuring a temperature can include generating a time varying signal that varies with time in a known manner, such as having a repeating sawtooth waveform. Further, the method can include generating a first intersecting signal that intersects with the time varying signal at a first time, and generating a second intersecting signal that varies with temperature and intersects with the time varying signal at a second time. Subsequently, the method can construct a pulse signal having a first edge corresponding to the first time and a second edge corresponding to the second time, with the pulse signal having a width corresponding to the temperature. | ||||||
| 268 | Detection circuit | US12172047 | 2008-07-11 | US07701239B2 | 2010-04-20 | Kazuyuki Kobayashi |
| A detection circuit includes: a control signal updating circuit configured to update a digital control signal for controlling drive of a sensor based on a clock having a predetermined frequency; a digital to analog converter configured to convert the digital control signal output from the control signal updating circuit to an analog control signal for driving the sensor; a comparator configured to compare a voltage level of a detection signal from the sensor which changes depending on the analog control signal with a reference voltage having a predetermined voltage level to output a comparison result signal; and a counter configured to count to measure a time period depending on the detection signal based on the comparison result signal output from the comparator and a clock having a predetermined frequency. | ||||||
| 269 | Systems and methods for temperature measurement using n-factor coefficient correction | US11738595 | 2007-04-23 | US07648271B2 | 2010-01-19 | Jerry L. Doorenbos; Marco A. Gardner |
| Various systems and methods for temperature measurement are disclosed. For example, some embodiments of the present invention provide temperature measurement systems. Such temperature measurement systems include a variable current source and a diode connected transistor. The variable current source is capable of applying two or more distinct currents to the diode connected transistor. The currents result in a different base-emitter voltage on the diode connected transistor. The systems further include an n-factor coefficient register and an analog to digital converter. The analog to digital converter is operable to receive two of the base-emitter voltages created by applying the different currents, and to provide a digital output based at least in part on a value stored in the n-factor coefficient register and the two base-emitter voltages. | ||||||
| 270 | SYSTEM AND METHOD FOR N'TH ORDER DIGITAL PIECE-WISE LINEAR COMPENSATION OF THE VARIATIONS WITH TEMPERATURE OF THE NON-LINEARITIES FOR HIGH ACCURACY DIGITAL TEMPERATURE SENSORS IN AN EXTENDED TEMPERATURE RANGE | US12167613 | 2008-07-03 | US20100002747A1 | 2010-01-07 | Enrique Company BOSCH; Alberto Sanchez PENARANDA; Javier Calpe Maravilla; Alberto Carbajo Galve; John Anthony CLEARY; Colin LYDEN |
| A system and method is provided for a high accuracy digital temperature sensor (DTS). The system includes a differential analog temperature sensor based on bipolar junctions, providing an output signal obtained as the difference between the VBE of two bipolar junctions. This signal is converted into the digital domain and compared to N−1 threshold digital values for providing piece-wise linear error correction for the variations with temperature of the different error sources within the DTS. This system and method advantageously improve the accuracy of a DTS over an extended temperature range. | ||||||
| 271 | APPARATUS AND METHOD FOR DETECTING TEMPERATURE/VOLTAGE VARIATION OF SEMICONDUCTOR INTEGRATED CIRCUIT | US12346547 | 2008-12-30 | US20090326843A1 | 2009-12-31 | Choung Ki Song |
| An apparatus for detecting temperature/voltage variations of a semiconductor integrated circuit includes an oscillator configured to generate an oscillation signal whose frequency is varied according to temperature/voltage variations, and a code generator configured to generate a code signal using the oscillation signal, wherein the code signal is used as a criterion for detecting the temperature/voltage variations in a circuit construction exterior of the apparatus for detecting the temperature/voltage variations. | ||||||
| 272 | APPARATUS AND METHOD FOR A/D CONVERSION | US12434352 | 2009-05-01 | US20090322579A1 | 2009-12-31 | Atsushi MATSUDA |
| An A/D conversion apparatus includes an A/D conversion circuit and a reference voltage generating circuit which includes a first switch circuit configured to switch between a state in which the inputs of an operational amplifier are swapped and a state in which these inputs are not swapped, and a second switch circuit configured to switch between a state in which the output voltage of the operational amplifier is output as having a normal phase and a state in which the output voltage is output as having a reversed phase. The A/D conversion circuit obtains a first digital value by setting the first and second switch circuits to a first state, and obtains a second digital value by setting the first and second switch circuits to a second state different from the first state, followed by producing a result of A/D conversion computed from the first and second digital values. | ||||||
| 273 | TIME DOMAIN DIGITAL TEMPERATURE SENSING SYSTEM AND METHOD THEREOF | US12185976 | 2008-08-05 | US20090141770A1 | 2009-06-04 | Poki Chen; Chun-chi Chen; Tuo-kuang Chen |
| A digital temperature sensing system and method for converting a test temperature into a digital output signal are disclosed. The system comprises a temperature-to-time circuit for generating a thermally sensitive time signal of which a width varies with the test temperature; an adjustable time reference circuit for generating a time reference signal of which a width changes with the digital set value; a time comparator for generating a time comparison signal according to a width difference between the thermally sensitive time signal and the time reference signal; a logic control circuit for adjusting the digital set value of the adjustable time reference circuit according to the time comparison signal so that the width of the thermally sensitive time signal and the width of time reference signal are close enough or substantially equal. | ||||||
| 274 | Devices and methods for reducing effects of device mismatch in temperature sensor circuits | US11986334 | 2007-11-20 | US20090129438A1 | 2009-05-21 | Dong Pan |
| A temperature sensor having one or more mirror circuits output temperature dependent output signals is disclosed in one embodiment. The temperature sensor includes a sampling circuit coupled to receive a clock signal that samples the output signals for a duration of a predetermined number of clock cycles. The temperature sensor additionally includes a phase control circuit that receives the clock signal and generates a control signal that enables subsequent sampling operations. Each subsequent sampling operation has a duration of the predetermined number of clock cycles. The control signal from the phase control circuit further enables input and output terminals of respective circuit components in the mirror circuits to be switched for each subsequent sampling operation. | ||||||
| 275 | Digital temperature sensor, and system and method for measuring temperature | US11188007 | 2005-07-25 | US07497615B2 | 2009-03-03 | Dong-kyun Kim; Ja-nam Ku |
| A digital temperature sensor and a system and a method for measuring a temperature are provided. The system includes a reference signal generator including one or more resistance elements; a temperature sensor including a plurality of discrete resistance elements arranged parallel with one another; a multiplexer multiplexing the plurality of discrete resistance elements and the reference resistance element so that the plurality of discrete resistance elements sequentially distribute a power voltage together with the reference resistance element; a comparator having the voltages distributed by the reference resistance element and a discrete resistance element selected by the multiplexer; and a counter counting sequential switchings of the multiplexer. The counter information of the output level transit time of the comparator is provided to the controller, and the system obtains temperature information according to temperature change information from turn information of the discrete resistance elements according to the counter information. | ||||||
| 276 | SYSTEM AND METHOD FOR PROVIDING TEMPERATURE DATA FROM A MEMORY DEVICE HAVING A TEMPERATURE SENSOR | US12256315 | 2008-10-22 | US20090052268A1 | 2009-02-26 | Jeff W. Janzen; Jeffrey P. Wright; Todd D. Farrell |
| A circuit and method for providing temperature data indicative of a temperature measured by a temperature sensor. The circuit is coupled to the temperature sensor and configured to identify for a coarse temperature range one of a plurality of fine temperature ranges corresponding to the temperature measured by the temperature sensor and generate temperature data that is provided on an asynchronous output data path. | ||||||
| 277 | Dram temperature measurement system | US12220577 | 2008-07-25 | US20090028212A1 | 2009-01-29 | Sugato Mukherjee |
| A converter comprising a comparator having a first input operable to receive a first signal, a second input operable to receive a second signal, and an output, a switch for sinking a portion of the first signal, wherein the switch is responsive to the output, and an integrator connected to the first input, wherein the first signal is a voltage developed by the integrator when a current proportional to the absolute temperature is applied thereto. A method for measuring temperature of a device using a comparator and converting the bitstream of the comparator to a digital output is also given. Because of the rules governing abstracts, this abstract should not be used to construe the claims. | ||||||
| 278 | Systems and Methods for Temperature Measurement Using N-Factor Coefficient Correction | US11738595 | 2007-04-23 | US20080259989A1 | 2008-10-23 | Jerry L. Doorenbos; Marco A. Gardner |
| Various systems and methods for temperature measurement are disclosed. For example, some embodiments of the present invention provide temperature measurement systems. Such temperature measurement systems include a variable current source and a diode connected transistor. The variable current source is capable of applying two or more distinct currents to the diode connected transistor. The currents result in a different base-emitter voltage on the diode connected transistor. The systems further include an n-factor coefficient register and an analog to digital converter. The analog to digital converter is operable to receive two of the base-emitter voltages created by applying the different currents, and to provide a digital output based at least in part on a value stored in the n-factor coefficient register and the two base-emitter voltages. | ||||||
| 279 | Digital temperature detection circuit for semiconductor device | US11599433 | 2006-11-15 | US07414455B2 | 2008-08-19 | Jeong Sik Nam; Chul Woo Park |
| A digital temperature detection circuit for a semiconductor circuit comprises a digital temperature defection block and a data conversion block. The digital temperature detection block is adapted to detect an internal temperature of the semiconductor device and generate detection data having a data value that varies according to the detected internal temperature. The data conversion block is adapted to convert the detection data into standard data with a predetermined response interval using first and second sample data having respective data values that are determined by input from an external source. | ||||||
| 280 | DRAM temperature measurement system | US11063173 | 2005-02-22 | US07413342B2 | 2008-08-19 | Sugato Mukherjee |
| A converter comprising a comparator having a first input operable to receive a first signal, a second input operable to receive a second signal, and an output, a switch for sinking a portion of the first signal, wherein the switch is responsive to the output, and an integrator connected to the first input, wherein the first signal is a voltage developed by the integrator when a current proportional to the absolute temperature is applied thereto. A method for measuring temperature of a device using a comparator and converting the bitstream of the comparator to a digital output is also given. Because of the rules governing abstracts, this abstract should not be used to construe the claims. | ||||||
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