| 序号 | 专利名 | 申请号 | 申请日 | 公开（公告）号 | 公开（公告）日 | 发明人 |
|---|---|---|---|---|---|---|
| 121 | Operating method for a nassetzmaschine for the separation of minerals, particularly coal | DE2823083 | 1978-05-26 | DE2823083A1 | 1979-11-29 | WEIFFEN KARL-HEINZ |
| 122 | EQUIPMENT FOR RADIOMETRIC DETERMINATING OF INTERFACE AND MUTUAL DISTRIBUTION OF HETEROGENEOUS MINERAL RAW MATERIALS DURING THEIR WET SEPARATION | CS738674 | 1974-10-30 | CS186898B1 | 1978-12-29 | KUBICEK PETR; KUBICKOVA JARMILA |
| 123 | SEPARATOR FOR LUMP-WISE CONCENTRATION OF RAW MINERALS | SU1757168 | 1972-03-17 | SU574231A1 | 1977-09-30 | UZLOV VITALIJ A; MELNIK VIKTOR T; CHERNOV ANATOLIJ P |
| 124 | A device for irradiating flowable material. | NL7512546 | 1975-10-27 | NL7512546A | 1977-03-15 | |
| 125 | SU1757118 | 1972-03-06 | SU425654A2 | 1974-04-30 | F N DEGT REV; I LOPATIN; M DEMKO; V SUSLOV | |
| 126 | Procédé et dispositif pour le triage de minerals radioactifs | BE602337 | 1961-04-07 | BE602337A | 1961-07-31 | ANDRE LAFORET |
| 127 | Автоматический рентгеносепаратор | SU629374 | 1959-04-23 | SU126430A1 | 1959-11-30 | AKKERMAN F M; BUZHIN N K; DREMOV V I; MAKAREVICH YU S |
| 128 | X-RAY FLUORESCENCE ANALYSER COMPRISING A CRYSTAL DIFFRACTOR | SE2051301 | 2018-04-20 | SE545836C2 | 2024-02-20 | PELLI ANTTI; SIPILÄ HEIKKI; KOSKINEN TOMMI |
| An X-ray fluorescence analyzer includes an X-ray tube for emitting incident X-rays in the direction of a first optical axis. A slurry handling unit is configured to maintain a constant distance between a sample of slurry and the X-ray tube. A first crystal diffractor is located in a first direction from the slurry handling unit and configured to separate a predefined first wavelength range from fluorescent X-rays that propagate into the first direction. The first crystal diffractor is configured to direct the fluorescent X-rays in the separated predefined first wavelength range to a first radiation detector. The first crystal diffractor includes a pyrolytic graphite crystal that has a diffractive surface, which is a simply connected surface. The first radiation detector is a solid-state semiconductor detector. | ||||||
| 129 | Método para realizar análise de fluorescência de raio x e aparelho | BR122023023754 | 2018-04-20 | BR122023023754A2 | 2023-12-26 | PELLI ANTTI; SIPILÄ HEIKKI; KOSKINEN TOMMI |
| método para realizar análise de fluorescência de raio x e aparelho. um método compreende irradiar uma amostra (202) de pasta com raios x incidentes e receber raios x fluorescentes da amostra irradiada (202), separar primeiro e segundo intervalos de comprimento de onda predefinidos (1301, 1401) das respectivas primeira e segunda porções dos referidos raios x fluorescentes recebidos com os respectivos primeiro e segundo difratores de cristal (1501, 1511). o referido primeiro intervalo de comprimento de onda (1301) e o referido segundo intervalo de comprimento de onda (1401) ambos incluem radiação fluorescente característica de um mesmo elemento, e o referido primeiro intervalo de comprimento de onda (1301) é pelo menos duas vezes mais amplo que o referido segundo intervalo de comprimento de onda (1401). | ||||||
| 130 | X-RAY FLUORESCENCE ANALYSER, AND A METHOD FOR PERFORMING X-RAY FLUORESCENCE ANALYSIS | CA3097462 | 2018-04-20 | CA3097462C | 2023-09-05 | KOSKINEN TOMMI; PELLI ANTTI; SIPILA HEIKKI |
| An X-ray fluorescence analyser comprises an X-ray tube (402) for emitting incident X-rays (206) in the direction of a first optical axis (204). A slurry handling unit (201) is configured to maintain a constant distance between a sample (202) of slurry and said X-ray tube. A first crystal diffractor (601) is located in a first direction from said slurry handling unit (201), and configured to separate a predefined first wavelength range from fluorescent X-rays (207) that propagate into said first direction. It is configured to direct the fluorescent X-rays in the separated predefined first wavelength range to a first radiation detector (602, 505). The input power rating of said X-ray tube (402) is at least 400 watts. The first crystal diffractor (601) comprises a pyrolytic graphite crystal (603). The optical path between said X-ray tube (402) and said slurry handling unit (201) is direct with no diffractor therebetween. | ||||||
| 131 | X-ray fluorescence analyzer with a plurality of measurement channels, and a method for performing x-ray fluorescence analysis | SE2051352 | 2018-04-20 | SE544472C2 | 2022-06-14 | PELLI ANTTI; SIPILÄ HEIKKI; KOSKINEN TOMMI |
| An X-ray fluorescence analyzer comprises an X-ray tube (402). A slurry handling unit (201) is configured to maintain a constant distance between a sample (202) of slurry and said X-ray tube. A first crystal diffractor (601, 1501) comprises a first crystal (603, 1502) and a first radiation detector (602, 1505) configured to detect fluorescent X-rays diffracted by said first crystal (603, 1502) at a first energy resolution. A second crystal diffractor (1511) comprises a second crystal (1512) and a second radiation detector (1515) configured to detect fluorescent X-rays diffracted by said second crystal (1512) at a second energy resolution. Said first crystal (603, 1502) is a pyrolytic graphite crystal, said second crystal (1512) is of a material other than pyrolytic graphite, and said first and second crystal diffractors are configured to direct to their respective radiation detectors characteristic fluorescent radiation of a same element. | ||||||
| 132 | X-ray fluorescence analyzer for analysis of small concentrations of element in slurry | SE2051351 | 2018-04-20 | SE544318C2 | 2022-04-05 | PELLI ANTTI; SIPILÄ HEIKKI; KOSKINEN TOMMI |
| An X-ray fluorescence analyzer comprises an X-ray tube (402) for emitting incident X-rays (206) in the direction of a first optical axis (204). A slurry handling unit (201) is configured to maintain a constant distance between a sample (202) of slurry and said X-ray tube. A first crystal diffractor (601) is located in a first direction from said slurry handling unit (201), and configured to separate a predefined first wavelength range from fluorescent X-rays (207) that propagate into said first direction. It is configured to direct the fluorescent X-rays in the separated predefined first wavelength range to a first radiation detector (602, 1505). The input power rating of said X-ray tube (402) is at least 400 watts. The first crystal diffractor (601) comprises a pyrolytic graphite crystal (603). The optical path between said X-ray tube (402) and said slurry handling unit (201) is direct with no diffractor therebetween. | ||||||
| 133 | X-ray fluorescence analyzer with a plurality of measurement channels, and a method for performing X-ray fluorescence analysis | AU2018419253 | 2018-04-20 | AU2018419253B2 | 2022-03-03 | KOSKINEN TOMMI; PELLI ANTTI; SIPILÄ HEIKKI |
| An X-ray fluorescence analyzer comprises an X-ray tube (402) for emitting incident X-rays (206) in the direction of a first optical axis (204). A slurry handling unit (201) is configured to maintain a constant distance between a sample (202) of slurry and said X-ray tube. A first crystal diffractor (601, 1501) is located in a first direction from said slurry handling unit (201). It comprises a first crystal (603, 1502) and a first radiation detector (602, 1505) configured to detect fluorescent X-rays diffracted by said first crystal (603, 1502) at a first energy resolution. A second crystal diffractor (1511) is located in a second direction from said slurry handling unit (201). It comprises a second crystal (1512) and a second radiation detector (1515) configured to detect fluorescent X-rays diffracted by said second crystal (1512) at a second energy resolution. Said first crystal (603, 1502) is a pyrolytic graphite crystal, said second crystal (1512) is of a material other than pyrolytic graphite, and said first and second crystal diffractors are configured to direct to their respective radiation detectors characteristic fluorescent radiation of a same element. | ||||||
| 134 | X-ray fluorescence analyzer, and a method for performing X-ray fluorescence analysis | AU2018419252 | 2018-04-20 | AU2018419252B2 | 2022-02-24 | KOSKINEN TOMMI; PELLI ANTTI; SIPILÄ HEIKKI |
| An X-ray fluorescence analyzer comprises an X-ray tube (402) for emitting incident X-rays (206) in the direction of a first optical axis (204). A slurry handling unit (201) is configured to maintain a constant distance between a sample (202) of slurry and said X-ray tube. A first crystal diffractor (601) is located in a first direction from said slurry handling unit (201),and configured to separate a predefined first wavelength range from fluorescent X-rays (207) that propagate into said first direction. The first crystal diffractor is configured to direct the fluorescent X-rays in the separated predefined first wavelength range to a first radiation detector (602, 1505). The first crystal diffractor (601) comprises a pyrolytic graphite crystal (603, 802, 804) that has a diffractive surface (801, 803, 805),which is a simply connected surface. Said first radiation detector (602) is a solid-state semiconductor detector. | ||||||
| 135 | X-ray fluorescence analyser, and a method for performing X-ray fluorescence analysis | AU2018419251 | 2018-04-20 | AU2018419251B2 | 2022-02-17 | KOSKINEN TOMMI; PELLI ANTTI; SIPILÄ HEIKKI |
| An X-ray fluorescence analyser comprises an X-ray tube (402) for emitting incident X-rays (206) in the direction of a first optical axis (204). A slurry handling unit (201) is configured to maintain a constant distance between a sample (202) of slurry and said X-ray tube. A first crystal diffractor (601) is located in a first direction from said slurry handling unit (201), and configured to separate a predefined first wavelength range from fluorescent X-rays (207) that propagate into said first direction. It is configured to direct the fluorescent X-rays in the separated predefined first wavelength range to a first radiation detector (602, 505). The input power rating of said X-ray tube (402) is at least 400 watts. The first crystal diffractor (601) comprises a pyrolytic graphite crystal (603). The optical path between said X-ray tube (402) and said slurry handling unit (201) is direct with no diffractor therebetween. | ||||||
| 136 | СПОСОБ РЕНТГЕНОРАДИОМЕТРИЧЕСКОГО ОБОГАЩЕНИЯ МАРГАНЦЕВЫХ РУД | RU2020138515 | 2020-11-23 | RU2764394C1 | 2022-01-17 | FEDOROV YURIJ OLIMPOVICH; VISHNYAKOV ALEKSEJ VIKTOROVICH; MAKAROV SERGEJ AFANASEVICH; KULIKOV VADIM IVANOVICH |
| Использование: длярентгенорадиометрическойсепарациимарганцевыхруд. Сущностьизобретениязаключаетсяв том, чтопоследовательнопропускаюткускипереддатчиком, облучаюткускипервичнымрентгеновскимизлучением, возбуждаютв кускахвторичноерентгеновскоеизлучениеоткаждогокуска, одновременноизмеряютхарактеристическоефлуоресцентноерентгеновскоеизлучение (ХРИ) марганца, железаи рассеянноеизлучениепропорциональнымидетекторами, приэтомв критерииобогащенияучитываютвлияниежелезанаопределениемарганцапоотношениюХРИмарганцак рассеянномурентгеновскомуизлучениюв суммес ХРИжелеза, интенсивностькоторогоберутс определеннымспектральнымкоэффициентом. Техническийрезультат: повышениестепениобогащениямарганцевыхрудприрентгенорадиометрическойсепарации. 3 з.п. ф-лы, 4 ил. | ||||||
| 137 | X-RAY FLUORESCENCE ANALYZER, AND A METHOD FOR PERFORMING X-RAY FLUORESCENCE ANALYSIS | AU2021107550 | 2021-09-13 | AU2021107550A4 | 2022-01-06 | SIPILA HEIKKI; KOSKINEN TOMMI; PELLI ANTTI |
| An X-ray fluorescence analyzer is disclosed comprising an X-ray tube (402) for emitting incident X-rays (206) in the direction of a first optical axis (204). A slurry handling unit (201) is configured to maintain a constant distance between a sample (202) of slurry and said X-ray tube. A first crystal diffractor (601) extends in a first direction from said slurry handling unit (201), and is configured to separate a predefined first wavelength range from fluorescent X-rays (207) and direct the fluorescent X rays to a first radiation detector (602, 1505). The first crystal diffractor (601) comprises a pyrolytic graphite crystal (603, 802, 804) that has a diffractive surface (801, 803, 805), which is a simply connected surface. Said first radiation detector (602) is a solid-state semiconductor detector. (FIG. 8) 303__ -------- 40650 Fig. 4 FFig.6 | ||||||
| 138 | РЕНТГЕНОВСКИЙ ФЛУОРЕСЦЕНТНЫЙ АНАЛИЗАТОР И СПОСОБ ВЫПОЛНЕНИЯ РЕНТГЕНОВСКОГО ФЛУОРЕСЦЕНТНОГО АНАЛИЗА | EA202092311 | 2018-04-20 | EA202092311A1 | 2021-03-09 | |
| Рентгеновскийфлуоресцентныйанализаторсодержитрентгеновскуютрубку (402) дляиспусканияпадающегорентгеновскогоизлучения (206) внаправлениипервойоптическойоси (204). Блок (201) обработкипульпывыполненс возможностьюподдержанияпостоянногорасстояниямеждупробой (202) пульпыи указаннойрентгеновскойтрубкой. Первыйкристаллическийдифрактор (601) расположенв первомнаправленииотуказанногоблока (201) обработкипульпыи выполненс возможностьювыделениязаданногопервогодиапазонадлинволнизфлуоресцентногорентгеновскогоизлучения (207), котороераспространяетсяв указанномпервомнаправлении. Первыйкристаллическийдифракторвыполненс возможностьюнаправленияфлуоресцентногорентгеновскогоизлученияв выделенномзаданномпервомдиапазонедлинволннапервыйдетектор (602, 1505) излучения. Первыйкристаллическийдифрактор (601) содержиткристалл (603, 802, 804) пиролитическогографита, имеющийдифракционнуюповерхность (801, 803, 805), котораяявляетсяодносвязнойповерхностью. Указанныйпервыйдетектор (602) излученияпредставляетсобойтвердотельныйполупроводниковыйдетектор. | ||||||
| 139 | ANALIZADOR DE FLUORESCENCIA DE RAYOS X Y UN MÉTODO PARA REALIZAR EL ANÁLISIS DE FLUORESCENCIA DE RAYOS X. | MX2020011022 | 2018-04-20 | MX2020011022A | 2021-01-29 | KOSKINEN TOMMI; PELLI ANTTI; SIPILÄ HEIKKI |
| El analizador de fluorescencia de rayos X comprende un tubo de rayos X para emitir rayos X incidentes (206) en la dirección de un primer eje óptico (204). Una unidad de manejo de suspensión espesa (201) se configura para mantener una distancia constante entre una muestra (202) de suspensión espesa y el tubo de rayos X. Un primer difractor de cristal (601) se ubica en una primera dirección de la unidad de manejo de suspensión espesa (201), y se configura para separar un primer intervalo de longitud de onda predefinido de rayos X fluorescentes (207) que se propagan en la primera dirección. El primer difractor de cristal se configura para dirigir los rayos X fluorescentes en el primer intervalo de longitud de onda predefinido separado a un primer detector de radiación (602, 1505). El primer difractor de cristal (601) comprende un cristal de grafito pirolítico (603, 802, 804) que tiene una superficie difractiva (801, 803, 805), que es una superficie conectada de manera simple. el primer detector de radiación (602) es un detector semiconductor de estado sólido. | ||||||
| 140 | ANALIZADOR DE FLUORESCENCIA DE RAYOS X CON UNA PLURALIDAD DE CANALES DE MEDICIÓN, Y UN MÉTODO PARA REALIZAR EL ANÁLISIS DE FLUORESCENCIA DE RAYOS X. | MX2020011066 | 2018-04-20 | MX2020011066A | 2021-01-15 | KOSKINEN TOMMI; PELLI ANTTI; SIPILÄ HEIKKI |
| El analizador de fluorescencia de rayos X comprende un tubo de rayos X para emitir rayos X incidentes (206) en la dirección de un primer eje óptico (204). Una unidad de manejo de suspensión espesa (201) se configura para mantener una distancia constante entre una muestra (202) de suspensión espesa y el tubo de rayos X. Un primer difractor de cristal (601, 1501) se ubica en una primera dirección de la unidad de manejo de suspensión espesa (201). Comprende un primer cristal (603, 1502) y un primer detector de radiación (602, 1505) configurado para detectar rayos X fluorescentes difractados por el primer cristal (603, 1502) a una primera resolución de energía. Un segundo difractor de cristal (1511) se ubica en una segunda dirección de la unidad de manejo de suspensión espesa (201). Comprende un segundo cristal (1512) y un segundo detector de radiación (1515) configurado para detectar rayos X fluorescentes difractados por el segundo cristal (1512) a una segunda resolución de energía. -ese primer cristal (603, 1502) es un cristal de grafito pirolítico, el segundo cristal (1512) es de un material que no es grafito pirolítico, y el primero y segundo difractores de cristal se configuran para dirigir a sus respectivos detectores de radiación la radiación fluorescente característica de un mismo elemento. | ||||||
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