Apparatus for ionization analysis专利检索-脉冲电场电场物理专利检索查询-专利查询网

Apparatus for ionization analysis

阅读：700发布：2023-08-03

专利汇可以提供Apparatus for ionization analysis专利检索，专利查询，专利分析的服务。并且Apparatus for ionization analysis comprising generally concentric outer and inner tubular shaped electrodes between which a d-c potential is applied so as to produce an electric field therebetween. Adjacent scintillating and photoemissive members are mounted inside the inner electrode, and generally aligned front and rear apertures are formed in the electrodes. Positive ions from a source of ions are directed through the front apertures and onto the scintillating member for the production of light pulses therein. Light from the light pulses striking the photoemissive member produces photoelectrons which are directed outwardly from the electrodes through the rear apertures therein. Electron multiplying means may be positioned to receive the photoelectrons for amplifying the same. With this arrangement the d-c potential which produces the electric field functions to accelerate both the incident positive ion beam and the photoelectrons produced by the photoemissive member.，下面是Apparatus for ionization analysis专利的具体信息内容。

权利要求

1. Apparatus for analyzing positive ions comprising inner and outer hollow electrodes, means for applying a potential difference between said electrodes, means for converting positive ions to electrons within the inner electrode, inlet and outlet apertures in the electrodes to allow positive ions to pass to the converting means from outside the outer electrode and electrons to pass from the converting means and out of the outer electrode, respectively, said means for converting positive ions to electrons comprising a scintillation device and a photoemissive member adjacent thereto, with the scintillation device positioned to receive positive ions through the inlet apertures and the photoemissive member positioned to direct electrons therefrom through the outlet apertures.

2. The apparatus for analyzing positive ions as defined in claim 1 wherein the inner electrode is rendered negative with respect to the outer electrode by the potential difference therebetween whereby the positive ions are accelerated toward said scintillation device and the electrons are accelerated from the photoemissive member by said potential difference between the electrodes.

3. The apparatus for ionization analysis as defined in claim 2 wherein said first and second eLectrodes are spherically shaped and generally coaxially positioned.

4. Apparatus for ionization analysis comprising: a scintillating member, a photoemissive member adjacent the scintillating member, means for directing ions onto the scintillating member to produce pulses of light therein for illumination of the photoemissive member, means for attracting electrons emitted from the photoemissive member, and said means for directing ions onto said scintillating member and said means for attracting electrons emitted from said photoemissive member comprises means for producing a spherically shaped electric field around said scintillating member and said photoemissive member.

5. The apparatus for ionization analysis as defined in claim 4 wherein said means for producing an electric field comprise first and second electrodes which are generally coaxially spaced and which generally have an O-shaped cross section, each of said electrodes being formed with front and rear apertures to receive ions and pass electrons, respectively, and means for applying a d-c potential across said electrodes.

6. The apparatus for ionization analysis as defined in claim 4 wherein said means for producing an electric field comprises first and second spaced electrodes of spherical shape, and means for applying a d-c potential across said electrodes, said electrodes being generally coaxially positioned, each of said electrodes having an entrance passage and an exit passage, and each of said passages being substantially centered on a common axis.

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