首页 / 专利库 / 核能 / 临界状态 / 缓发临界 / Process for epitaxially growing semiconductor crystals

Process for epitaxially growing semiconductor crystals

阅读:178发布:2022-02-16

专利汇可以提供Process for epitaxially growing semiconductor crystals专利检索,专利查询,专利分析的服务。并且A semiconductor with a P/N junction, adapted to be used as a detector or emitter of luminous radiation, is grown from a bath consisting of a liquefied mixture of three elements which are the constituents of two alloys or solid solutions taken from Groups II/VI and/or IV/VI of the Periodic Table. The proportions of the three elements in the mixture are so chosen that the solidus curve of the temperature/composition diagram intersects the stoichiometric line at a point lying along the boundary between the solid and the solid/liquid phase on the side of the lower concentrations of the element common to the two alloys. In a state of thermodynamic equilibrium for the liquid/solid phase, the bath is slowly cooled in a temperature range above or below a critical temperature corresponding to the point of intersection with resulting growth of an N-type or P-type layer on a substrate immersed in the bath. By a change in the composition, with or without a shift in temperature, the conductivity type of the layer is altered with formation of a P/N junction.,下面是Process for epitaxially growing semiconductor crystals专利的具体信息内容。

  • 2. A process as defined in claim 1 wherein, following termination of controlled cooling and prior to removal of said substrate, the proportion of said constituents is modified in said bath to reverse said conductivity type, with subsequent continuation of controlled cooling and formation of another layer of opposite conductivity type on said substrate.
  • 3. A process as defined in claim 2 wherein the modification of the bath composition involves a diminution of the proportion of said common element with reference to the combined proportion of the other two elements, with substantially no change in the relative proportion of said other two elements and with resulting reliquefaction of the mixture at said final temperature above a fourth point on said liquidus curve which is spaced from said second point in a direction opposite said third point and consistent with said opposite conductivity type, the bath temperature being lowered to said fourth point prior to resumption of controlled cooling to form said other layer.
  • 4. A process as defined in claim 2 wherein the modification of the bath composition involves the substantial maintenance of the original proportion of said common element with reference to the combined proportion of the other two elements, with a change in the relative proportion of said other two elements resulting in a shifting of said boundary and corresponding displacement of said first point sufficient to move said second point onto the opposite side of said third point, controlled cooling being resumed without reliquefaction of the mixture.
  • 5. A process as defined in claim 1 wherein said common element is tellurium or selenium aNd the other two elements are lead and tin.
  • 6. A process as defined in claim 5 wherein the initial bath composition is substantially (Pb0.70Sn0.30)0.95Te0.05.
  • 7. A process as defined in claim 5 wherein the initial bath composition is substantially (Pb0.89Sn0.11)0.95Se0.05.
  • 8. A process as defined in claim 1 wherein said common element is tellurium and the other two elements are cadmium and mercury.
  • 9. A process as defined in claim 1 wherein said common element is zinc and the other two elements are selenium and tellurium.
  • 说明书全文
    高效检索全球专利

    专利汇是专利免费检索,专利查询,专利分析-国家发明专利查询检索分析平台,是提供专利分析,专利查询,专利检索等数据服务功能的知识产权数据服务商。

    我们的产品包含105个国家的1.26亿组数据,免费查、免费专利分析。

    申请试用

    分析报告

    专利汇分析报告产品可以对行业情报数据进行梳理分析,涉及维度包括行业专利基本状况分析、地域分析、技术分析、发明人分析、申请人分析、专利权人分析、失效分析、核心专利分析、法律分析、研发重点分析、企业专利处境分析、技术处境分析、专利寿命分析、企业定位分析、引证分析等超过60个分析角度,系统通过AI智能系统对图表进行解读,只需1分钟,一键生成行业专利分析报告。

    申请试用

    QQ群二维码
    意见反馈