首页 / 专利库 / 数学与统计 / 傅立叶变换 / 离散傅立叶变换 / Testing method for fourier transforming device

Testing method for fourier transforming device

阅读:631发布:2022-08-31

专利汇可以提供Testing method for fourier transforming device专利检索,专利查询,专利分析的服务。并且PURPOSE:To achieve a test with high accuracy only with some additional circuits without requiring a large scale external device, by inputting a testing data stored in an input side storage element group to a transformation circuit after being copied in an output side storage element group. CONSTITUTION:Discrete Fourier transformation DFT circuits 14, 20 via time series conversion storage circuits 12, 18 are connected in cascade for the DFT of number of points of products for the DFT circuits. In a testing method for a device, a testing data having a known spectrum distribution is sequentially stored in an input side storage element group F1 of the circuits 12, 18 with a low speed write-in clock, and it is transferred to an output side storage element group F2 of the circuit at a bundle. Thereafter, the output side storage element group F2 is sequentially read out with a real time clock of a high speed DFT circuit and the output is inputted to the transformation circuit for the test.,下面是Testing method for fourier transforming device专利的具体信息内容。

高效检索全球专利

专利汇是专利免费检索,专利查询,专利分析-国家发明专利查询检索分析平台,是提供专利分析,专利查询,专利检索等数据服务功能的知识产权数据服务商。

我们的产品包含105个国家的1.26亿组数据,免费查、免费专利分析。

申请试用

分析报告

专利汇分析报告产品可以对行业情报数据进行梳理分析,涉及维度包括行业专利基本状况分析、地域分析、技术分析、发明人分析、申请人分析、专利权人分析、失效分析、核心专利分析、法律分析、研发重点分析、企业专利处境分析、技术处境分析、专利寿命分析、企业定位分析、引证分析等超过60个分析角度,系统通过AI智能系统对图表进行解读,只需1分钟,一键生成行业专利分析报告。

申请试用

QQ群二维码
意见反馈