专利汇可以提供Semiconductor photo detection device专利检索,专利查询,专利分析的服务。并且PURPOSE: To obtain the light detection output with large gain through the reduced floating capacity by developing the epitaxial growth on the semiconductor substrate and forming the two resistances serving as the light derection element and load respectively within that epitaxial growth.
CONSTITUTION: On an N-type semiconductor substrate 1 developed is an epitaxial growth to form an N-type layer 2 with higher specific resistance than that of the substrate. Within the layer 2 formed are P-type zones 5 and 6 with same impurity atom concentration through the diffusion, and each zone 5 and 6 serves as a resistance R and a light detection element D respectively. Next, a terminal 8 is provided at the zone 6, a wiring 9 is connected between the zones 5 and 6, and then a terminal 10 is attached to the wiring 9. Also on the backside formed is a terminal 7. Thus, the light detection element D of PIN-type photodiode and the resistance R as load hold their positions within one substrate. After that a light L is radiated into the zone 5. By doing so, the output voltage caused by the incidence of the light into the zone 5 can be taken out through the terminals 8 and 10, and thus obtained voltage level becomes higher due to the structure where the floating capacity is reduced possibly small.
COPYRIGHT: (C)1980,JPO&Japio,下面是Semiconductor photo detection device专利的具体信息内容。
标题 | 发布/更新时间 | 阅读量 |
---|---|---|
激光测距装置和机器人 | 2020-05-08 | 864 |
一种共孔径激光测距机 | 2020-05-13 | 905 |
用于耦接电子单元及光学单元的互连结构、及光电模块 | 2020-05-14 | 158 |
一种光电功率计 | 2020-05-11 | 620 |
光刻机照度均匀度的检测方法 | 2020-05-11 | 121 |
一种光电探测器信号处理电路板及光电探测器 | 2020-05-13 | 532 |
一种阵列基板及显示装置 | 2020-05-14 | 767 |
一种集成锁定支路的平衡零拍探测器 | 2020-05-12 | 92 |
一种影像扫描装置的激光功率衰减补偿电路 | 2020-05-14 | 788 |
光收发器、光收发组件及光通信系统 | 2020-05-13 | 968 |
高效检索全球专利专利汇是专利免费检索,专利查询,专利分析-国家发明专利查询检索分析平台,是提供专利分析,专利查询,专利检索等数据服务功能的知识产权数据服务商。
我们的产品包含105个国家的1.26亿组数据,免费查、免费专利分析。
专利汇分析报告产品可以对行业情报数据进行梳理分析,涉及维度包括行业专利基本状况分析、地域分析、技术分析、发明人分析、申请人分析、专利权人分析、失效分析、核心专利分析、法律分析、研发重点分析、企业专利处境分析、技术处境分析、专利寿命分析、企业定位分析、引证分析等超过60个分析角度,系统通过AI智能系统对图表进行解读,只需1分钟,一键生成行业专利分析报告。