Interference fringe movement detector
阅读：107发布：2023-07-28
专利汇可以提供Interference fringe movement detector专利检索，专利查询，专利分析的服务。并且An improved fringe movement detector in which a radiation interference pattern is deflected by a galvanometer mirror to illuminate two photoelectric cells with selected portions of the interference pattern. As the interference pattern shifts, the change in output of the photoelectric detectors is differentially amplified and applied to the galvanometer coil to deflect the interference pattern back to the original or reference position on the photoelectric detectors. The magnitude of the electrical signal required to return the galvanometer mirror to the reference position is proportional to the amount of shift of the interference pattern. After a shift of a predetermined amount, reset means are used to return the galvanometer mirror to approximately its original position to illuminate the photoelectric detectors with selected portions of the next following fringe.，下面是Interference fringe movement detector专利的具体信息内容。
1. An apparatus for measuring the shift of a radiation interference pattern having a series of similar portions comprising: a. first and second radiation detectors for generating first and second electrical signals when illuminated by the radiation; b. optical means positioned to receive the radiation interference pattern and operable to maintain substantially constant illumination of said detectors by selected portions of the radiation interference pattern, in response to an electrical control signal, during the shift of the radiation interference pattern; c. control signal generating means responsive to the first and second electrical signals and generating an electrical control signal proportional to the shift of the radiation interference pattern; and d. recycle means, electrically coupled to said control signal generating means and to said optical means, responsive to a predetermined magnitude of the electrical control signal to cause said optical means to maintain substantially constant illumination of said detectors by succeeding similar selected portions of the radiation interference pattern.
2. The apparatus as claimed in claim 1 wherein said optical means comprises: a. galvanometer means including an electromagnetic coil coupled to said control signal generating means and a radiation deflection means positioned to receive the radiation interference pattern and moveably responsive to the energization of said coil by the control signal to direct the radiation interference pattern toward said first and second radiation detectors; and b. image definition means positioned to receive the radiation interference pattern from said radiation deflection means and adjustable to permit only selected portions of the radiation interference pattern to illuminate said first and second radiation detectors.
3. The apparatus as claimed in claim 2 wherein said image definition means comprises: a. beamsplitter means positioned to receive the radiation interference pattern from said radiation deflection means and adapted to direct an image of the radiation interference pattern to each of the first and second radiation detectors; and b. aperture defining means positioned between said beamsplitter means and said first and second radiation detectors adjustably adapted to pass selected portions of the radiation interference pattern images to said first and second radiation detectors.
4. An apparatus for measuring the shift of a radiation interference pattern having a series of successive fringe elements of varying intensity comprising: a. first and second radiation detectors for generating first and second electrical signals when illuminated by the radiation; b. optical means including moveable deflection means positioned to receive the radiation interference pattern and moveably adapted to maintain substantially constant illumination of said detectors by selecteD elements of the radiation interference pattern, in response to an electrical control signal, during a predetermined shift of the radiation interference pattern from a reference position; c. control signal generating means responsive to the first and second electrical signals and generating an electrical control signal proportional to the shift of the radiation interference pattern from the reference position; and d. recycle means, electrically coupled to said control signal generating means and to said optical means, operative after the predetermined shift of the radiation interference pattern from the reference position to move said deflection means to illuminate said radiation detectors by succeeding similar elements of the radiation interference pattern at a new reference position.
5. The apparatus as claimed in claim 4 wherein said optical means comprises: a. galvanometer means including an electromagnetic coil coupled to said control signal generating means and a mirror positioned to receive the radiation interference pattern and rotatably responsive to the energization of said coil by the control signal to direct the radiation interference pattern toward said radiation detectors; b. beamsplitter means positioned to receive the radiation interference pattern from said mirror and adapted to direct an image of the radiation interference pattern to each of the radiation detectors; and c. aperture defining means positioned between said beamsplitter means and said radiation detectors adjustably adapted to pass selected portions of the radiation interference pattern images to illuminate said radiation detectors.
6. The apparatus as claimed in claim 5 wherein said aperture defining means are adjusted to provide an increased intensity of illumination of one radiation detector and a decreased intensity of illumination of the other radiation detector with a shift of the radiation interference pattern from the reference position.
7. An apparatus for measuring the shift of a radiation interference pattern having fringe elements of minimum and maximum intensity formed by destructive and constructive interference comprising: a. first and second radiation detectors for generating first and second electrical signals when illuminated by the radiation; b. rotatable deflection means intercepting the radiation interference pattern and rotatably positioned to illuminate said detectors with selected portions of the radiation interference pattern between different adjacent elements of minimum and maximum intensity; c. control signal means including a difference amplifier connected to said detectors and generating a control signal proportional to the change in the first and second electrical signals due to the shift in the radiation interference pattern; d. means for rotating said deflection means responsive to the control signal to restore the illumination of the detectors with the selected portions of the radiation interference pattern during a predetermined shift of the pattern; e. signal output means connected to said control signal means for providing an output signal proportional to the rotational displacement of said deflection means; and f. recycle means, electrically connected to said control signal means and to said means for rotating said deflection means, operative after the predetermined shift of the pattern to rotatably position said deflection means to illuminate said detectors with similarly selected next following portions of the radiation interference pattern.
8. The apparatus as claimed in claim 7 wherein the predetermined shift of the radiation interference pattern corresponds to one fringe shift.
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