首页 / 专利库 / 微电子学 / 离子注入机 / Manufacture of semiconductor device

Manufacture of semiconductor device

阅读:260发布:2021-10-22

专利汇可以提供Manufacture of semiconductor device专利检索,专利查询,专利分析的服务。并且PURPOSE:To contrive the improvement in safety and in operating efficiency of an ion implanter by a method wherein an LLD structure is formed by twice of phosphorus ion implantation. CONSTITUTION:A gate oxide film 2 and a field oxide film 3 are formed on a P type Si substrate 1 by thermal oxidation. After a polycrystalline Si film is formed on these films 2 and 3, a gate electrode 4 is formed by etching the polycrystalline film. The region unmasked with the gate electrode 4 is removed by etching. Next, an N type impurity of phosphorus is diffused into the Si substrate 1 by using the gate electrode 4 and the field oxide film 3 as a mask, resulting in the formation of source and drain regions 10. An insulation film 6 such as an oxide film is formed. Then, an insulation film 7 is left on the side wall of the gate electrode 4 by etching the insulation film 6 by anisotropic plasma etching, and the insulation film on a diffused layer 10 is removed. A relatively deep diffused layer 11 is formed by implanting phosphorus directly into the Si substrate by using the gate electrode 4 and the insulation film 7 as a mask. Finally, an intermediate insulation film 9 is formed by lamination.,下面是Manufacture of semiconductor device专利的具体信息内容。

高效检索全球专利

专利汇是专利免费检索,专利查询,专利分析-国家发明专利查询检索分析平台,是提供专利分析,专利查询,专利检索等数据服务功能的知识产权数据服务商。

我们的产品包含105个国家的1.26亿组数据,免费查、免费专利分析。

申请试用

分析报告

专利汇分析报告产品可以对行业情报数据进行梳理分析,涉及维度包括行业专利基本状况分析、地域分析、技术分析、发明人分析、申请人分析、专利权人分析、失效分析、核心专利分析、法律分析、研发重点分析、企业专利处境分析、技术处境分析、专利寿命分析、企业定位分析、引证分析等超过60个分析角度,系统通过AI智能系统对图表进行解读,只需1分钟,一键生成行业专利分析报告。

申请试用

QQ群二维码
意见反馈