专利汇可以提供Manufacture of semiconductor device专利检索,专利查询,专利分析的服务。并且PURPOSE:To contrive the improvement in safety and in operating efficiency of an ion implanter by a method wherein an LLD structure is formed by twice of phosphorus ion implantation. CONSTITUTION:A gate oxide film 2 and a field oxide film 3 are formed on a P type Si substrate 1 by thermal oxidation. After a polycrystalline Si film is formed on these films 2 and 3, a gate electrode 4 is formed by etching the polycrystalline film. The region unmasked with the gate electrode 4 is removed by etching. Next, an N type impurity of phosphorus is diffused into the Si substrate 1 by using the gate electrode 4 and the field oxide film 3 as a mask, resulting in the formation of source and drain regions 10. An insulation film 6 such as an oxide film is formed. Then, an insulation film 7 is left on the side wall of the gate electrode 4 by etching the insulation film 6 by anisotropic plasma etching, and the insulation film on a diffused layer 10 is removed. A relatively deep diffused layer 11 is formed by implanting phosphorus directly into the Si substrate by using the gate electrode 4 and the insulation film 7 as a mask. Finally, an intermediate insulation film 9 is formed by lamination.,下面是Manufacture of semiconductor device专利的具体信息内容。
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