首页 / 专利库 / 电气元件和设备 / 半导体 / 互补金属氧化物半导体 / Preparation of complementary semiconductor device

Preparation of complementary semiconductor device

阅读:549发布:2022-12-28

专利汇可以提供Preparation of complementary semiconductor device专利检索,专利查询,专利分析的服务。并且PURPOSE:To obtain a minute complementary metal oxide semiconductor (CMOS) device by forming isolatedly the epitaxial layers through self-alignment manner in the form of island in such a method as partly including the surface of amorphous dielectric material on the single crystal Si substrate. CONSTITUTION:The thermal oxide film 42 on the n type Si substrate 41 is selectively removed, and the smooth n type single crystal Si 43 is formed over the substrate at 950-1,100 deg.C with a pressure of 80Torr using H2 as the carrier and SiH2Cl2. After the oxide film 44 is formed, the p well 45 is formed selectively by the ordinary method, then the oxide film 46 is newly formed, the n well is then formed, and threshold voltages of these are respectively adjusted. Next, the phosphorus (P) additive poly-Si gate electrode 47 is formed and the n layer 49, p layer 50 are formed by the ion implantation selectively using the resist mask 48. After the appealing, such layers are covered with the phospho-silicate glass (PSG), the Al electrode 52 is provided and the Al-Si alloy is obtained under the H2 atmosphere, thus completing a device. According to this structure, a minute CMOS device can be obtained which remarkably reduces diffusion capacitance and moreover prevents existence of single- and poly-crystal transitional regions.,下面是Preparation of complementary semiconductor device专利的具体信息内容。

高效检索全球专利

专利汇是专利免费检索,专利查询,专利分析-国家发明专利查询检索分析平台,是提供专利分析,专利查询,专利检索等数据服务功能的知识产权数据服务商。

我们的产品包含105个国家的1.26亿组数据,免费查、免费专利分析。

申请试用

分析报告

专利汇分析报告产品可以对行业情报数据进行梳理分析,涉及维度包括行业专利基本状况分析、地域分析、技术分析、发明人分析、申请人分析、专利权人分析、失效分析、核心专利分析、法律分析、研发重点分析、企业专利处境分析、技术处境分析、专利寿命分析、企业定位分析、引证分析等超过60个分析角度,系统通过AI智能系统对图表进行解读,只需1分钟,一键生成行业专利分析报告。

申请试用

QQ群二维码
意见反馈