Apparatus for measuring the spatial response of optical systems
阅读：439发布：2023-05-24
专利汇可以提供Apparatus for measuring the spatial response of optical systems专利检索，专利查询，专利分析的服务。并且To measure the spatial response characteristics of optical systems, control circuitry is provided to electrically generate a predetermined one-dimensional spatial waveform (e.g., sinusoidal) on the display screen of a cathode ray tube. The optical system to be tested (e.g., a television system) is placed between the spatial waveform display and a suitable detector which comprises a mask having a narrow slit followed by a photomultiplier. The output of the latter is then displayed on an oscilloscope, or measured in some other known fashion. A linear light modulation is achieved for the spatial waveform display by gating a linearly scanned electron beam with constant amplitude, constant duration, variable duty cycle pulses. Appropriate waveforms can be selected to evaluate the spatial frequency response, transient response, linearity, or steady state response of the optical system under test.，下面是Apparatus for measuring the spatial response of optical systems专利的具体信息内容。
1. Apparatus for measuring the spatial response characteristics of an optical system comprising a cathode ray tube, means for electrically generating on the display screen of said cathode ray tube a predetermined spatial waveform whose intensity varies in one-dimension and is linearly related to the signal electrically generating the same, said generating means including means for varying the periodicity of said spatial waveform, a mask having a sMall aperture, the optical system under test being disposed between said mask and cathode ray tube and serving to relay an image of a segment of said spatial waveform to the aperture in said mask, a photo-detector disposed behind said mask, means coupled to the output of said photo-detector for providing for the measurement of the light intensity detected by said photodetector, and means for causing a slow scan of the spatial waveform image with respect to said aperture.
2. Apparatus for measuring the spatial response characteristics of an optical system comprising a cathode ray tube, means for electrically generating a one-dimensional spatial waveform on the display screen of said cathode ray tube with the luminosity of said cathode ray display bearing a linear proportional relationship to the signal electrically generating the same, said generating means including means for varying the periodicity of said spatial waveform, an opaque mask having a small aperture therein, the optical system under test being disposed between said mask and cathode ray tube and serving to image a small segment of the spatial waveform display upon said aperture, a photo-detector disposed behind said opaque mask, means coupled to the output of said photo-detector for providing for the measurement of the spatial response of the optical system under test, and means for causing a slow drift of the one-dimensional spatial waveform relative to said aperture.
3. Apparatus as defined in claim 2 wherein said electrical generating means serves to generate a one-dimensional sinusoidal spatial waveform of n sine waves.
4. Apparatus as defined in claim 3 wherein said sinusoidal spatial waveform is frequency modulated.
5. Apparatus as defined in claim 2 wherein said electrical generating means serves to generate a spatial waveform comprising n triangular spatial waves.
6. Apparatus as defined in claim 2 wherein said electrical generating means serves to generate a spatial waveform comprising n spatial square waves.
7. Apparatus for measuring the spatial response of optical systems comprising a cathode ray tube, means for linearly scanning the electron beam of said cathode ray tube in one given direction, means for gating the linearly scanned electron beam with constant amplitude, constant duration, variable duty cycle pulses so as to generate on the display screen of said cathode ray tube a predetermined one-dimensional spatial waveform whose luminosity is linearly related to the duty cycle of the gating pulses, means for varying the duty cycle of the gating pulses in a selected manner, an opaque mask having a narrow slit therein, the optical system under test being disposed between said mask and the cathode ray tube and serving to relay an image of a small segment of the spatial waveform display to said slit, a photo-detector disposed behind said opaque mask, means coupled to the output of said photo-detector for providing for the measurement of the light intensity detected by said photo-detector, and means for causing a slow drift of the one-dimensional spatial waveform relative to the slit in said mask.
8. Apparatus as defined in claim 7 wherein the duty cycle of said gating pulses is varied sinusoidally so as to generate a one-dimensional sinusoidal spatial waveform of n spatial sine waves.
9. Apparatus as defined in claim 8 wherein the sinusoidal variation of said duty cycle is carried out at a linearly varying rate so as to provide a linearly varying sinusoidal spatial waveform display.
10. Apparatus as defined in claim 7 wherein the duty cycle of the gating pulses is varied in a manner such as to achieve a spatial waveform display of n triangular spatial waves.
11. Apparatus as defined in claim 7 wherein the duty cycle of the gating pulses is varied in a manner such as to achieve a spatial waveform display of n spatial square waves.
12. Apparatus as defined in claim 7 wherein the electron beam scanning means is operated at a non-synchronous offset frequency with respect to a sub-multiple of the operating frequency of the duty cycle varying means so as to effect a slow drift in the spatial waveform display.
13. Apparatus for measuring the spatial frequency response of an optical system comprising a cathode ray tube, means for linearly scanning the electron beam of said cathode ray tube in one given direction, means for gating the linearly scanned electron beam with constant amplitude, constant duration, variable duty cycle pulses so as to generate on the display screen of said cathode ray tube a one-dimensional spatial waveform whose luminosity is linearly related to the duty cycle of the gating pulses, means for sinusoidally varying the duty cycle of said gating pulses, an opaque mask having a narrow slit therein, the optical system under test being disposed between said mask and the cathode ray tube and serving to relay an image of a finite segment of the spatial waveform display to said slit, a photo-detector disposed behind said opaque mask, oscilloscope means connected to the output of said photo-detector for providing a visual indication of the instantaneous light intensity detected by said photo-detector, and means for causing a slow drift in the one-dimensional sinusoidal spatial waveform displayed on said display screen.
14. Apparatus as defined in claim 13 wherein the sinusoidal variation of said duty cycle is carried out in a linear frequency modulated fashion so as to provide a linear frequency modulated sinusoidal spatial waveform display.
15. A spatial waveform display for use in making spatial response measurements off optical systems comprising a cathode ray tube, means for linearly scanning the electron beam of said cathode ray tube in one given direction, means for gating the linearly scanned electron beam with constant amplitude, constant duration, variable duty cycle pulses so as to generate on the display screen of said cathode ray tube a predetermined one-dimensional spatial waveform whose luminosity is linearly related to the duty cycle of the gating pulses, means for varying the duty cycle of the gating pulses in a selected manner, and means for causing a slow drift in the spatial waveform generated on the display screen of said cathode ray tube.
16. Apparatus as defined in claim 15 wherein the duty cycle of said gating pulses is varied sinusoidally so as to generate a one-dimensional sinusoidal spatial waveform of n spatial sine waves on said display screen.
17. Apparatus as defined in claim 16 including means for linearly varying the frequency of the sinusoidal variations of said duty cycle so as to provide a linearly varying sinusoidal spatial waveform display.
18. Apparatus as defined in claim 15 wherein the duty cycle of the gating pulses is varied in a manner such as to achieve a spatial waveform display of n triangular spatial waves.
19. Apparatus as defined in claim 15 wherein the duty cycle of the gating pulses is varied in a manner such as to achieve a spatial waveform display of n spatial square waves.
20. Apparatus as defined in claim 15 wherein the electron beam scanning means is operated at a non-synchronous frequency which is offset with respect to a sub-multiple of the operating frequency of the duty cycle varying means so as to effect the slow drift in the spatial waveform display.
| 标题 | 发布/更新时间 | 阅读量 |
|---|---|---|
| 一种具有透镜组的锗酸铋闪烁晶体辐射探测器 | 2020-05-15 | 0 |
| 一种DCS响应时间测试装置及方法 | 2021-03-28 | 3 |
| 使用气态进样的等离子体原子发射光谱分析方法和装置 | 2021-03-09 | 0 |
| 激光诱导击穿光谱原位分析仪 | 2021-03-15 | 3 |
| 一种IVD体外检测设备的DNA样本检测系统 | 2020-07-31 | 4 |
| 一种基于反符合技术的β测量装置 | 2020-07-23 | 3 |
| 一种荧光爆炸物探测仪的荧光信号检测装置 | 2020-08-18 | 2 |
| Method and apparatus for measuring amino peroxide | 2022-07-19 | 3 |
| 一种紫外分光仪 | 2021-01-10 | 2 |
| 一种伽玛仪器减震探头 | 2021-01-16 | 2 |
高效检索全球专利专利汇是专利免费检索,专利查询,专利分析-国家发明专利查询检索分析平台，是提供专利分析，专利查询，专利检索等数据服务功能的知识产权数据服务商。
我们的产品包含105个国家的1.26亿组数据，免费查、免费专利分析。
分析报告
专利汇分析报告产品可以对行业情报数据进行梳理分析，涉及维度包括行业专利基本状况分析、地域分析、技术分析、发明人分析、申请人分析、专利权人分析、失效分析、核心专利分析、法律分析、研发重点分析、企业专利处境分析、技术处境分析、专利寿命分析、企业定位分析、引证分析等超过60个分析角度，系统通过AI智能系统对图表进行解读，只需1分钟，一键生成行业专利分析报告。
QQ群二维码
意见反馈
意见反馈