Pattern meter
专利汇可以提供Pattern meter专利检索，专利查询，专利分析的服务。并且PURPOSE: To make it possible to easily measure complex patterns by calculating the characteristic quantity of the patterns to be measured with the use of a suitable program of a computer.
CONSTITUTION: The patterns to be measured, i.e., the patterns on the sensor 201 of a TV camera or the like are decomposed into picture elements in two-dimentional coordinates, and the respective picture elements are converted by a binary circuit 202 into binary signals. These signals are stored in a pattern memory 203 in response to the address signals of a clock generator 204. Then, the content of the memory 203 is read out by a measuring circuit 206 under the control of a computer (or microcomputer) 208 and is converted into data which can be easily processed. Then, the data processing is performed by the computer 208 so that the characteristics of the patterns are extracted for discrimination and judgement. Since the changes in the characteristics to be extracted can be effected by the change in the software of the computer, it is possible to provide a meter which can measure complex patterns and find wide applications.
COPYRIGHT: (C)1980,JPO&Japio，下面是Pattern meter专利的具体信息内容。
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