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Semiconductor storage device

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专利汇可以提供Semiconductor storage device专利检索,专利查询,专利分析的服务。并且PURPOSE:To reduce the cost for inspection in storage element manufacturing processes, by providing means which diagnose the quality of operation of each memory address of semiconductor storage elements to be tested and write the addresses in failure to areas not belonging to the elements to be tested. CONSTITUTION:The quality of operation of each memory address for semiconductor storage elements to be tested is diagnosed and addresses in failure are written in areas not belonging to the said elements. For example, when power is supplied, the interpretation of a read only memory ROM is started with an operation processing unit CPU, and the transmission/reception of data between an external data source B and random access memories RAMi to be tested is stopped. The CPU sequentially diagnoses whether or not all the addresses of the RAMi are normally operated. As a result of the diagnosis, if incorrect addresses exist, the address are avoided and the address number in the RAMi to store external data is added, and the transfer of the external data can be done between the addresses in the numbered RAMi only.,下面是Semiconductor storage device专利的具体信息内容。

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