首页 / 专利库 / 电脑零配件 / 固件 / 基本输入输出系统 / Master slice type semiconductor integrated circuit device and its manufacture

Master slice type semiconductor integrated circuit device and its manufacture

阅读:402发布:2022-05-18

专利汇可以提供Master slice type semiconductor integrated circuit device and its manufacture专利检索,专利查询,专利分析的服务。并且PURPOSE:To obtain a device which is provided with a wiring pattern to by-pass a wiring-failure pattern, and can be easily manufactured in a short term, by forming a first layer wiring in a basic cell region as a fixed wiring, and forming a second layer wiring as a variable wiring capable of alternation according to the input-output circuit system applied to said basic cell region. CONSTITUTION:The title master slice type LSI is provided with the following; a master chip containing a basic cell region in which a plurality of basic cell rows 106 are arranged in a specified direction, and an input-output cell region, a first layer wiring and a second layer wiring. The first layer wiring 8 in the basic cell region is a fixed wiring formed on the master chip side. The second layer wiring in the basic cell region is a variable wiring capable of alternation according to the input-output circuit system applied to said basic cell region. A plurality of basic cells 104, 105 are arranged in the longitudinal direction of a master chip in the basic cell region, at specified intervals. A by-pass wiring region 40 having a previously set fixed-pattern is formed on a first layer between the basic cells 104, 105.,下面是Master slice type semiconductor integrated circuit device and its manufacture专利的具体信息内容。

高效检索全球专利

专利汇是专利免费检索,专利查询,专利分析-国家发明专利查询检索分析平台,是提供专利分析,专利查询,专利检索等数据服务功能的知识产权数据服务商。

我们的产品包含105个国家的1.26亿组数据,免费查、免费专利分析。

申请试用

分析报告

专利汇分析报告产品可以对行业情报数据进行梳理分析,涉及维度包括行业专利基本状况分析、地域分析、技术分析、发明人分析、申请人分析、专利权人分析、失效分析、核心专利分析、法律分析、研发重点分析、企业专利处境分析、技术处境分析、专利寿命分析、企业定位分析、引证分析等超过60个分析角度,系统通过AI智能系统对图表进行解读,只需1分钟,一键生成行业专利分析报告。

申请试用

QQ群二维码
意见反馈