PARISON FOREIGN MATTER DETECTION SYSTEM |
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| 申请号 | US15760592 | 申请日 | 2016-07-29 | 公开(公告)号 | US20180250870A1 | 公开(公告)日 | 2018-09-06 |
| 申请人 | YACHIYO INDUSTRY CO., LTD.; | 发明人 | Masateru Takayanagi; | ||||
| 摘要 | Some embodiments are directed to a system for detecting foreign matter in a parison discharged successively from a discharge device, the system comprising: infrared cameras that detect infrared beams emitted from the parison; and a determination unit that determines whether foreign matter is present in the parison on the basis of the infrared beams detected by the infrared cameras. A determination area is set in the parison in a discharge direction of the parison, a storage unit is provided that stores an infrared threshold set for the determination area, and the determination unit compares the detected values from the infrared cameras with the threshold. | ||||||
| 权利要求 | |||||||
| 说明书全文 | |||||||
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