首页 / 国际专利分类库 / 电学 / 基本电子电路 / 一般编码、译码或代码转换 / 单个数字表示形式的转换 / Concurrent code checker and hardware efficient high- speed I/O having built- in self- test and debug features

Concurrent code checker and hardware efficient high- speed I/O having built- in self- test and debug features

申请号 EP07250229.7 申请日 2007-01-19 公开(公告)号 EP1814234A3 公开(公告)日 2007-08-08
申请人 Silicon Image, Inc.; 发明人 Sul, Chinsong; Choi, Hoon; Ahn, Gijung;
摘要 Method, device, and system for testing for errors in high-speed input/output systems. System and device may include a concurrent code checker for checking for errors in encoded data packets through data packets static properties and dynamic properties of the data stream including the packets. Method may involve detecting invalid encoded packets using the data packets static properties and the dynamic properties of the data stream including the packets. Method for optimizing a design of a concurrent code checker logic using don't-care conditions, and concurrent code checker circuit having reduce logic element and semiconductor area requirements.
权利要求
说明书全文
QQ群二维码
意见反馈