Digital-to-analog converter

申请号 EP82102454.4 申请日 1982-03-24 公开(公告)号 EP0061199A2 公开(公告)日 1982-09-29
申请人 Hitachi, Ltd.; 发明人 Hotta, Masao; Maio, Kenji; Nagaishi, Hiromi;
摘要 The present invention is characterized that a digital-to-analog converter (1) having ordinal accuracy and one or more current sources (11, 12, 13) are combined and the output currents (I 1 , I 2 ,I 3 ) of the current sources are accurately controlled to have a predetermined relationship with regard to the reference current (I o ) which is a full-scale value of the analog output current of DAC (1) so that the output current of the current sources designated by bits added to the superior bit of the digital input signal depending on the number of the current sources and the analog output current in response to the digital input signal with the added bits are added to produce an analog signal corresponding to the digital input signal.
权利要求 1. A digital-to-analog converter comprising a digital-to-analog converting means (1) for converting predetermined lower bits of a digital input signal into an analog current, n (n ≧ 1) numbers of current sources (11, 12, 13, 14) designated depending on the digital input signal of which said predetermined lower bits are removed, means (2) for setting the output current value of said current sources so that the value is equal to a predetermined magnitude corresponding to the maximum value of the output current of said digital-to-analog converting means, and means (101) for adding the output current of said current source designated by said digital input signal and the output current of said digital-to-analog converting means to produce the analog signal corresponding to said digital input signal.2. A digital-to-analog converter according to Claim 1 wherein said setting means (2) comprises control means for generating a control signal depending on the difference between the respective output current values of said current sources and said maximum value so that the respective output current values of said current sources become equal to said maximum value sequentially and supplying said current sources with said control signal.3. A digital-to-analog converter according to Claim 2 wherein said control means comprises current detecting means for alternately detecting the respective output current value of said n numbers of current sources and said maximum value and means for detecting a low frequency component of the output of said current detecting means, the output of which is said control signal.4.. A digital-to-analog converter according to Claim 3 wherein said current detecting means comprises a timing signal generating circuit (22) for generating a predetermined timing signal, a first switch circuit (4) including (n+1) numbers of first terminals composed of n numbers of terminals (P1, P21 P3) connected to said n numbers of current sources and a terminal (P ) connected to said digital-to-analog converting means and two second terminals (Q1, Q2), and first and second resistance circuit (5; 51, 52) connected to said two second terminals, respectively, said timing signal being supplied to said first switch circuit to sequentially select one of said n numbers of terminals every predetermined time period within a cycle time determined by said timing signal and to alternately connect the selected one of said n numbers of terminals and said terminal connected to said digital-to-analog converting means with said two second terminals, respectively, in each time period, whereby said first switch circuit sets up the above connecting pattern between said (n+1) numbers of first terminals and said two second terminals.5. A digital-to-analog converter according to Claim 4 wherein said means for detecting the low frequency component is means for detecting a low frequency component of a signal obtained from said first resistance circuit (51) as a voltage drop.6. A digital-to-analog converter according to Claim 4 or 5 wherein said means for detecting said low frequency component comprises a capacitor (60) connected to one of said second terminals, an amplifier circuit (6) connected to said capacitor, a phase sensitive detector (7) connected to said amplifier circuit, n numbers of low-pass filter circuits (8; 81, 82, 83) connected to said n numbers of current sources, respectively, and a second switch circuit (31, 32, 33) for selectively connecting between said phase sensitive detector and said n numbers of low-pass filter circuits, said timing signal being supplied to said second switch circuit from said timing signal generating circuit to connect the low-pass filter circuit connected to the current source connected to said selected first terminal and said phase sensitive detector.7. A digital-to-analog converter according.to Claim 1 wherein said setting means (2) comprises control means for producing a control signal so that the respective output current values of said current sources become sequentially equal to said maximum value of the binary weighted current value on the basis of the difference between sums of the output current value of one of said n numbers of current sources and said maximum value or said maximum value and the output current value of at least one of said current sources to supply said current source with said control signal.8. A digital-to-analog converter according to Claim 7 wherein said control means comprises current detecting means for alternately detecting the respective output current values of said n numbers of current sources and said maximum value of the binary weighted current value and means for detecting a low frequency component of the output of said current detecting means, of which an output signal being said control signal.9. A digital-to-analog converter according to Claim 8 wherein said current detecting means comprises a timing signal generating circuit (22) for generating a predetermined timing signal, a first switch circuit (4) including (n+1) numbers of first terminals (P1' P2, P3) composed of n numbers of terminals connected to said n numbers of current sources respectively and a terminal (P ) connected to said digital-to-analog converting means (1) and two second terminals (Qll Q2), and first and second resistance circuits connected to said two second terminals, respectively, said timing signal being supplied to said first switch circuit to sequentially select one of said n numbers of terminals within a cycle time determined by said timing signal, to alternately connect each of the selected first terminal and the first terminals connected to said digital-to-analog converting means with each of said second terminals within each time period, and to connect the input terminal selected prior to said selected input terminal with the same output terminal as the first terminal connected to said digital-to-analog converting means within said cycle time, whereby said first switching circuit sets up the above connecting pattern between said (n+1) numbers of first terminals and said two second terminals.10. A digital-to-analog converter according to Claim 9 wherein said means for detecting low frequency component is means for detecting a low frequency component of the signal obtained from said first resistance circuit (51) as a voltage drop.11. A digital-to-analog converter according to Claim 9 or 10 wherein said means for detecting said low frequency component comprises a capacitor (60) connected to one of said second terminals, an amplifier circuit (6) connected to said capacitor, a phase sensitive detector (7) connected to said amplifier circuit (8; 81, 82, 83), n numbers of low-pass filter circuits connected to said n numbers of current sources, and a second switch circuit (31, 32, 33) for selectively connecting between said phase sensitive detector and said n numbers of low-pass filter circuit, the timing signal being supplied to said second switch circuit from said timing signal generating circuit to connect said low-pass filter circuit connected to the current source connected to the selected first terminal and said phase sensitive detector within each predetermined time period.12. A digital-to-analog converter according to Claim 1 wherein said setting means (2) comprises a first switch circuit (4; 40, 41, 42, 43) including (n+1) numbers of first terminals (Po' P1' P2' P3) composed of n numbers of first terminals (PI, P2' P3) connected to said n numbers of current sources, respectively, and a first terminal (P ) connected to said digital-to-analog converting means (1) and two second terminals (Ql, Q2), first and second resistance circuit (5; 51, 52) connected to said two second terminals, and a feedback circuit for controlling the respective output current values of said current sources on the basis of the signal obtained from said first resistance circuit as a voltage drop, said timing signal being supplied to said first switch circuit (4; 40, 41, 42, 43) from said timing signal generating circuit (22) to establish a predetermined connecting pattern between said (n+1) numbers of first terminals (Po' P1, P21 P3) and said two second terminals (Q1, Q2)'13. A digital-to-analog converter according to Claim 12 wherein said feedback circuit comprises means for detecting the low frequency component of the signal obtained from said first resistance circuit as a voltage drop.14. A digital-to-analog converter according to Claim 12 or 13 wherein said timing signal generating circuit supplies said first switch circuit with the timing signal for sequentially selecting one of said n numbers of first terminals every predetermined time period within the cycle time determined by the timing signal and for constituting a connecting pattern that each of said selected first terminal and the first terminal connected to said digital-to-analog converting means is alternately connected to each of said second terminals within each time period.15. A digital-to-analog converter according to Claim 12 or 13 wherein said timing signal generating circuit (22) supplies said first switch circuit (4; 40, 41, 42, 43) with the timing signal for sequentially selecting one of said n numbers of first terminals every predetermined time period within the cycle time determined by the timing signal and for constituting a connecting pattern that each of said selected first terminal and the first terminals connected to said digital-to-analog converting means is alternately connected to each of said second terminals within each time period while the input terminal selected prior to said selected input terminal is connected to the same output terminal as the first terminal connected to said digital-to-analog converting means within said cycle time.16. A digital-to-analog converter according to Claim 15 wherein said first resistance circuit (51) comprises n numbers of first resistors (511, 512, 513) having a predetermined resistance ratio and switching means (501, 502, 503) for sequentially select one of said resistors.17. A digital-to-analog converter according to Claim l6.wherein said feedback circuit amplifier means (6) for amplifying the signal obtained as said voltage drop and means for controlling the amplification degree of said amplifier means in response to the value of said first resistor selected by said switching means (501, 502, 503).18.. A digital-to-analog converter according to Claim 17 wherein said means for controlling the amplification degree comprises n numbers of second resistors (541, 542, 543) having a predetermined resistance ratio and switching means (531, 532, 533) for sequentially selecting one of said second resistors and connecting said selected second resistor and the input of said amplifier means (6).19. A digital-to-analog converter according to Claim 16 wherein said current sources (11, 12, 13) include a predetermined mutual conductance proportional to the magnitude of the output current (Il, I2, I3) thereof.20. A digital-to-analog converter according to any one of Claims 4 - 6 and 9 - 19, further including synchronizing means for synchronizing the switching timing of said first switch circuit (4) and the change timing of said digital input signal and sample-hold means (110) for sampling and holding said analog signal, operation of said sample-hold means being controlled by the output of said synchronizing means.21. A digital-to-analog circuit according to Claim 20 wherein said cynchronizing means (9) comprises means for dividing the clock synchronized with said digital input signal, operation of said timing signal generating circuit (22) being controlled by using the output signal of said dividing means.22. A digital-to-analog converter according to Claim 20 wherein said synchronizing means comprises means (210, 211, 212) for detecting the change timing of said digital input signal, operation of said timing signal generating circuit (22) being controlled by using the output of said detecting means.23. A digital-to-analog converter according to Claim 22 wherein said synchronizing means comprises a clock generating circuit (213), operation of said timing signal generating circuit (22) being controlled by using the clock from said clock generating circuit and the output of said means (210, 211, 212) for detecting the timing.
说明书全文

The present inventoin relates to a digital-to-analog converter (hereinafter referred to as DAC) with high accuracy and which is suitable for an integrated circuit in its monolithic form.

In the prior art DAC, there is generally used a constitution that the currents weighted by a weighted network such as a R-2R resistance ladder network are selected in response to the digital input signal and added each other to obtain an analog output signal depending on the digital input signal.

However, in the case where such a DAC is formed of the integrated circuit in its monolithic form, the accuracy (although it is also called linearity, it is hereinafter referred to as accuracy) of DAC is limited to about 9 - 10 bits due to linearity error of the weight network on the basis of dispersion of resistance elements in the ladder network. In order to further increase the accuracy, the dispersion of the resistance elements has been narrowed by using a technique such as trimming. However, there is a drawback that manufacturing stages of DAC are complicated since a new trimming stage is added and consequently the achievable accuracy of DAC is limited to 14-16 bits.

Therefore, it is an object of the present invention to provide a digital-to-analog converter with high accuracy of 18 bits or more and which is suitable for the integrated circuit in its monolithic form, without the technique such as trimming.

In order to achieve the object, the circuit of the present invention is so constituted that DAC having ordinary accuracy and one or more current sources are combined and the output current of said current sources are accurately controlled to maintain a predetermined relationship with the reference current which is equal to the full-scale value of the output current of the DAC having the ordinary accuracy so as to add the output current of the current sources designated by bits added to the superior bit of the digital input signal depending to the number of the current sources and the analog output current depending on the digital input signal without the bits added to the superior bit.

Consequently, the accuracy of DAC is improved by the number of the bits added to the superior bit.

Fig. 1 is a circuit block diagram for showing the principle of the present invention. The principle of the present invention will be explained with reference to the circuit diagram.

In Fig. 1, in order to increase the accuracy of DAC 1 having the accuracy of about 9 bits (explanation will be hereinafter made to DAC which has the accuracy of 9 bits) by N bits substantially, current circuits composed of predetermined numbers of current sources 11, 12, ..., 14 depending on N and switches 31, 32, ..., 34 connected in series to the respective current sources are connected in parallel with the DAC 1 and the output currents I1, I2, ..., I4 of the respective current sources is accurately controlled by a control circuit 2 to have a predetermined value with regard to the maximum output current I of the DAC 1 so that the switches 31, 32, ..., 34 are opened or closed by the superior N bits;of the digital input signal. Consequently, an analog output current IA with regard to the digital input signal composed of (N+9) bits can be obtained from a terminal 101 as a sum of the output current of DAC 1 and the output currents of the current sources selected by the switches.

According to the present invention, DAC with high accuracy and which is suitable for the integrated circuit in its monolithic form can be realized with a simple circuit constitution, producing large effect.

The present invention will be described in detail with reference to the accompanying drawings in which:

  • Fig. 1 is a circuit block diagram for illustrating a principle of DAC of the present invention;
  • Fig. 2a is a circuit block diagram of DAC according to a first embodiment of the present invention;
  • Fig. 2b illustrates an output waveform of a current source in DAC of Fig. 2a;
  • Fig. 3 is a practical circuit diagram of DAC of Fig. 2a;
  • Fig. 4 is a circuit diagram of DAC according to a second embodiment of the present invention;
  • Fig. 5 is a timing chart of timing signals used in DAC of Fig. 4;
  • Fig. 6 is a circuit diagram of DAC according to a third embodiment of the present invention;
  • Fig. 7 is a timing chart of timing signals used in DAC of Fig. 6;
  • Fig. 8 is a model diagram which exemplifies one application of the present invention;
  • Fig. 9 is a circuit diagram of DAC according to a fourth embodiment of the present invention;
  • Fig. 10 is a circuit diagram of DAC according to a fifth embodiment of the present invention;
  • Fig. 11 is a partial circuit diagram of DAC according to a sixth embodiment of the present invention;
  • Fig. 12 is a partial circuit diagram of DAC according to a seventh embodiment of the present invention;
  • Fig. 13 is a circuit diagram of DAC according to an eighth embodiment of the present invention;
  • Fig. 14 is a partial circuit diagram of DAC according to a nineth embodiment of the present invention;
  • Fig. 15 is a timing chart for explaining DAC of Fig. 14;
  • Fig. 16 is a partial circuit diagram of DAC according to a tenth embodiment of the present invention; and
  • Fig. 17 is a partial circuit diagram of DAC according to an eleventh embodiment of the present invention.

The present invention will now be described in detail with reference to the embodiments.

Referring to Fig. 2a in which a circuit diagram of DAC according to the first embodiment of the present invention is shown, one current source 11 is connected in parallel with DAC 1 as shown in Fig. 1. A control circuit 2 is controlled so that an output current I1 of the current source 11 is equal to a maximum output current Io of DAC 1. There is realized a DAC having improved accuracy by N (=1) bits as compared with a single DAC 1.

In Fig. 2a, when a superior bit of a digital input signal is a logic "1", a switch 31 is connected to a terminal a and the output current I1 of the current source 11 is supplied to a change-over switch circuit 4 through a terminal 101 and the switch 31. When the superior bit is a logic "0", the output current I1 of the current source 11 is supplied to the change-over switch circuit 4 through a terminal 102 and a terminal b of the switch 31. The two output currents I .and I1 are supplied to input terminals P0 and P1 of the change-over switch circuit 4, respectively. The change-over switch circuit 4 further contains two output terminals Q1 and Q2 connects between the input terminals P0 and P1 and the output terminals Q1 and Q2 alternately. The change-over switch circuit 4 is provided with two change-over switches 40 and 41 connected to the input terminals P0 and P1, respectively. A terminal a of the change-over switch 40 and a terminal b of the change-over switch 41 are commonly connected to the output terminal Q1. A terminal b of the change-over switch 40 and a terminal a of the change-over switch 41 are commonly connected to the output terminal Q2. The change-over switches 40 and 41 in the change-over switch circuit 4 are turned by a predetermined timing signal generated from a timing signal generating circuit 22 in the control circuit 2 to connect between the input terminals P0 and P1 and the output terminals Q1 and Q2 alternately. Thus, each of the output currents I0 and I1 is alternately supplied to a current detecting resistor 51 or 52 in a resistor circuit 5 through the output terminal Q1 or Q2,

Suppose that the resistance value of the resistor 51 is R. When both the change-over switches 40 and 41 are connected to the respective terminal a, the current I0 is supplied to the resistor 51 through the output terminal Q1 to produce a voltage R·I0 at the terminal Q1 and the current I1 is supplied to the resistor 52 through the output terminal Q2. When both the change-over switches 40 and 41 are connected to the respective terminal b, the current I1 is supplied to the resistor 51 through the output terminal Q1 to produce a voltage R·I1 at the terminal Q1 and the current I0 is supplied to the resistor 52 through the output terminal Q1.

If I0 ≠ I1, a difference is caused between the voltages R·I0 and R·I1 as shown in Fig. 2b.

In the embodiment shown in Fig. 2a, the current I1 is accurately controlled so that it becomes equal to the current I which is the reference current.

Actually, the voltage signal produced at the terminal Q1 and shown in Fig. 2b is amplified by an alternating current amplifier circuit 6 to be synchronously rectified by a phase sensitive detector 7 and a low-frequency component of the voltage signal is detected by a low-pass filter circuit 8 composed of, for example, a resistor and a capacitor so that the output current I1 of the current source 11 is changed by the detected low-frequency component and controlled to be equal to the current I .

Suppose that the gains of the alternating current amplifier circuit 6, the phase sensitive detector 7 and the low-pass filter circuit 8 are A, a and β, respectively, and the output voltage of the low-pass filter circuit 8 is Vg. The output voltage Vg is given by:

The current I1 is composed of the fixed part (I ) which is independent of Vg and the change part (Gm.Vg) caused by Vg. The current II is given by:

From the equations (1) and (2), the relative difference (ΔI/I0) of I0 and I1 which is expressed by the ratio of ΔI = I1 = I0 to I0 is approximately given by:

Taking the accuracy of elements in the integrated circuit into consideration, (Is/I0 - 1) can be about 10-3 (0.1%) and (A·α·β· gm ·R) can be about 103. Therefore, the value of the equation (2) is as follows:

Accordingly, the current I1 can be theoretically controlled to be equal to the current I0 with accuracy of about 20 bits.

Fig. 3 exemplifies a practical circuit diagram of the current source 11, the change-over switch circuit 4 and the phase sensitive detector 7 in Fig. 2a according to the embodiment of the present invention.

In Fig. 3, the circuits corresponding to each circuit block of Fig. 2a are given like reference numbers of Fig. 2a, respectively. Vcc and VEE are direct current bias voltages.

The current source 11 contains an NPN transistor 111, a PNP transistor 112 and a variable resistor 113 connected between both emitters of the transistors 111 and 112.

With such a constitution, there can be realized the floating current source for the load side of the switch circuit 31 which is turned on and off by the digital input signal and the side of the change-over switch circuit 4.

In this case, the output current I1 can be changed by varying the resistance value of the variable resistor 113. The variable resistor can be realized by utilizing the stray MOS effect of the diffused resistance of an integrated circuit where the diffused resistance is coupled through an oxide layer to an electrode to which the output voltage of the low-pass filter 8 is applied to change its resistance value depending on the voltage value of the output value or by utilizing the resistivity change caused by island potential leak in the resistance. Furthermore, a FET may be used instead of the resistor.

A circuit 20 for driving the current source 11 comprises transistors 201 and 202 having the same characteristics, respectively, as the transistors 111 and 112 of the current source 11 and a resistor 203 connected between both emitters of the transistors 201 and 202. The circuit 20 is connected to a current source 21 in series so as to supply the transistors 111 and 112 with a constant current independently of variation of the voltage between the base and the emitter of the transistors 111 and 112.

When either gate 310 or 311 of the switch circuit 31 is turned on depending on a polarity of one superior bit (D1) of the digital input signal, the output current I1 of the current source 11 is supplied to the change-over switch circuit 4 through a terminal 101 or 102.

The change-over switch circuit 4 is composed of a switching circuit 41 including transistors 411 and 412 which are turned on and off by timing signals φ and φ generated from a timing signal generating circuit 22 and a switching circuit 40 including transistors 401 and 402 which are also.turned on and off by the timing signals and φ. The emitters of the transistors 401 and 402 are commonly connected to the input terminal P0 and the emitters of the transistors 411 and 412 are also commonly connected to the input terminal P1. The collectors of the transistors 401 and 412 are connected to the output terminal Q1 and the collectors of the transistors 402 and 411 are connected to the output terminal Q2. The timing signal φ is supplied to the bases of the transistors 402 and 412 while the timing signal φ is supplied to the bases of the transistors 401 and 411, Consequently, the transistors are turned on and off depending on the polarity of the timing signals d and so that each of the input terminals P0 and P1 is alternately connected to each of the output terminals Q1 and Q2. Thus, the currents I0 and I1 are alternately supplied to resistors 51 and 52. A voltage drop generated across the resistor 51 is supplied to the alternating current amplifier circuit 6 through a capacitor 60.

The phase sensitive detector 7 is composed of a serial resistor 71 connected between the input and the output of the phase sensitive detector and a MOS transistor 72 connected between the output and the ground and turned on and off by the timing signal φ.

In Fig. 3, the PNP transistors used in the current source 11 and the change-over switch circuit 4 may be substituted with P channel FETs while the NPN transistors may be also substituted with N channel FETs.

Although Figs. 2 and 3 show the embodiment where one current is controlled to be equal to the reference current, another embodiment will be described where the n (n > 2) numbers of currents are controlled to be equal to the reference current.

For clarification of explanation, the embodiment in the case of n = 3 will be described. However, it may be achieved in the same manner in the case of n = 2 and n > 3.

Fig. 4 shows a circuit diagram according to a second embodiment of the present invention which corresponds to the circuit in the case of n = 3.

The change-over switch circuit 4 includes an input terminal P0 supplied with the output current I0 of DAC 1, three input terminals P1, P2 and P3 supplied with the output currents I1, I2 and I3 of three current sources 11, 12 and 13, respectively, and two output terminais Q1 and Q2 connected to the resistors 51 and 52 in the resistor circuit 5, respectively. The change-over switch circuit is composed of four switching circuits 40 - 43 connected to the input terminals Po - P3, respectively. The terminal a of each switching circuit is commonly connected to the output terminal Q1 while the terminal b is also commonly connected to the output terminal Q2.

These switching circuits are switched by the timing signals φ1 - φ4 from the timing signal generating circuit 22 and establishes a connecting pattern between the input terminals Po - P3 and the output terminals Ql and Q2.

Fig. 5 shows a timing chart of the timing signals φ1 - φ7 generated by the timing signal generating circuit 22. Operation of Fig. 4 will be described by using Fig. 5.

In Fig. 4, the switching circuits 40 - 43 of the change-over switch circuit 4 are connected to the terminals a, respectively, when the timing signals φ1 - φ4 are in the logic "1" and connected to the terminals b, respectively, when the timing signals are in the logic "0". Switches 91 - 93 which are disposed between the phase sensitive detector 7 and each low-pass filter circuit 81, 82 or 83 are closed when the timing signals φ57 are in the logic "1" and are opened when the timing signals φ5 - φ7 are in the logic "O".

During the time period T1 when the timing signal φ5 of Fig. 5 is in the logic "1", the switch 91 is closed to select the low-pass filter circuit 81. The switching circuits 40 and 41 are alternately connected to the terminals a and b, respectively, depending on the polarity of the timing signals φ1 and φ2 so that each of the input terminals Po and P1 is alternately connected to each of the output terminals Ql and Q2. Consequently, the reference current I0 and the output current I1 of the current source 11 alternately flow through the resistors 51 and 52 in the resistance circuit 5, respectively. The voltage drop across the resistor 51 is fed back to the current source 11 through the feedback circuit composed of the capacitor 60, the phase sensitive detector 7 and the low-pass filter circuit 81 so that the variable resistor in the current source 11 is so controlled that the current I1 becomes equal to the current I0.

During the time period T2 when the timing signal φ6 of Fig. 5 is in the logic "1" after the time period Tl, the switch 92 is closed to select the low-pass filter circuit 82. The switch circuits 40 and 42 are alternately connected to the terminals a and b, respectively, depending on the polarity of the timing signals φ1 and φ3 so that each of the input terminals P0 and P2 is alternately connected to each of the output terminals Q1 and Q2. Consequently, the currents I0 and 12 alternately flow through the resistors 51 and 52, respectively. In the same manner as described above, the variable resistor in the current source 12 is so controlled that the current I2 becomes equal to the current I .

During the time period T3 when the timing signal φ7 of Fig. 5 is in the logic "1" after the time period T2, the switch 93 is closed to select the low-pass filter circuit 83. The switching circuit 40 and 43 is alternately connected to the terminals a and b, respectively, depending on the polarity of the timing signals φ1 and φ4 so that each of the input terminal Po and P3 is alternately connected to each of the output terminals Ql and Q2. Consequently, the currents I0 and I3 alternately flow through the resistors 51 and 52, respectively, so that the variable resistor in the current source 13 is so controlled that the current I3 becomes equal to the current I0 in the same manner as described above. One complete cycle has been completed at the end of the time period T3. Next, the cycle will be returned to the first state and be repeated in the same manner as described above.

Therefore, in the above embodiment, the change-over switch circuit 4 sequentially selects one terminal Pi (i = 1, 2 and 3) from the three terminals P1, P2 and P3 connected to the three current sources 11, 12 and 13, respectively, in response to the time period T1, T2 or T3 determined by the timing signals φ5, φ6 and within the cycle time. Further, the change-over switch circuit 4 alternatively connects each of the selected input terminal Pi and the input terminal P0 connected to DAC 1 with the two output terminals, within each time period T1, T2 or T3. Accordingly, the change-over switch circuit 4 sets up the above connecting patterns between the four input terminals P0 - P3 and the two output terminals Q1 and Q2.

Further, it is necessary to hold the output of the low-pass filter circuit 81 during the time period Tab until the low-pass filter circuit 81 is selected again after the low-pass filter circuit 81 is selected in the time period T1 of Fig. 5. Therefore, it is necessary to sufficiently reduce the leak through the switch 91 and the current source 11 of the charge accumulated in the capacitor 811 of the low-pass filter circuit 81. For this purpose, the time period Tab is required to be sufficiently small as compared with the discharge time constant of the capacitor 811.

The change-over switches 40 - 43 and the current sources 11 - 13 can be realized with the same constitution as that of Fig. 3.

With the constitution of Fig. 4, from DAC 1 having accuracy of 9 bits, there can be realized a DAC having accuracy of 9 + 2 = 11 bits in view of from the output terminal 101.

The switches 31, 32 and 33 are connected to the terminal a or b in response to the polarity of the digital input signal of which predetermined lower bits (for example, 9 bits) supplied to DAC 1 are removed so that the output currents T1, I2 and I3 of the current sources 11, 12 and 13 are supplied to the change-over switch circuit 4 through the terminal 101 or 102.

In order to improve the accuracy by N bits by using the method as described in Fig. 4, n = (2N-1) numbers of current sources are required. By way of example, in order to a DAC with accuracy of 18 bits by increasing accuracy of the DAC 1 by 9 bits, 29-1 = 511 numbers of current sources are required and there may be a problem with regard to mounting thereof.

Fig. 6 shows a circuit diagram of a third embodiment according to the present invention in which the above problem in the embodiment of Fig. 4 is solved.

Although the circuit constitution of the embodiment in Fig. 6 is the same as that of the embodiment in Fig. 4, the output currents of the current sources 11, 12 and 13 are controlled so that the binary weighted currents of I1, 2Il and 22I1 are obtained as the output currents of the current sources 11, 12 and 13, respectively. Consequently, the accuracy of DAC 1 can be increased by 3 bits while using the three current sources. Therefore, accoding to this method, when N numbers of current sources are used and the output currents of the current sources are controlled to be equal to I1, 2I1, 22I1, ..., and 2N-1I1, respectively, the accuracy of DAC I can be increased by N bits. For example, 511 numbers of current sources are required in the case of the embodiment of Fig. 4 in order to increase the accuracy by N bits, while only 9 numbers of current sources are required in the case of the embodiment of Fig. 6.

Fig. 7 shows a timing chart of the timing signals φ1 - φ7 produced by the timing signal generating circuit 22 in Fig. 6. Operation of the circuit in Fig. 6 will be described with reference to Fig. 7.

In Fig. 6, relationship between operation of change-over switches 40 - 43 and switches 91 - 93 and the polarity of the timing signals φ1 - φ7 is the same as that of Fig. 4.

In the same manner as in the case of Figs. 4 and 5, switches 31, 32 and 33 are connected to the terminal a or..b, respectively, in response to the polarlity of the digital input signal. During the time period T1 of Fig. 7, the switch 91 is closed to select the low-pass filter circuit 81. The change-over switches 40 and 41 are alternately connected to the terminal a or b depending on the polarity of the timing signals φ1 and φ2 so that each of the input terminals P0 and P1 is alternately connected to each of the output terminals Q1 and Q2. Consequently, the reference current Io and the output current I1 of the current source 11 are alternately detected as a terminal voltage of the resistor 51. The terminal voltage is fed back to the current source 11 through a feedback circuit composed of the capacitor 60, the phase sensitive detector 7 and the low-pass filter circuit 81, so that the variable resistor in the current source 11 is so controlled that the output current I1 is equal to the reference current I .

The output of the low-pass filter circuit 81 is held over the time period Tab after the time period T1 of Fig. 7.

In the following time period T2, the switch 91 is opened and the switch 92 is closed to select the low-pass filter circuit 82. The output of the phase sensitive detector 7 is disconnected from the low-pass filter circuit 81 and connected to only the low-pass filter circuit 82 so that the output current I2 (= 2I1) of the current source 12 is controlled to be equal to I0 + I1 = 2I0. In the other words, since the output of the low-pass filter circuit 81 is held in the time period T2 from the preceding time period T1, the output current II of the current source 11 is maintained to be equal to the reference current Io. While a condition where when the timing signals φ1 and φ2 in phase are in the logic "1" (at this time, the timing signal φ3 is in the logic "0") the change-over switches 40 and 41 are connected to the terminal a and the input terminals Po and P1 are connected to the output Q1 so that the current of Io + I1 = 2Io is supplied to the resistor 51 and a condition where when the timing signal φ3 is in the logic "1" (at this time, the timing signals φ1 and φ2 are in the logic "0") the change-over switch 42 is connected to the terminal a and the input terminal P2 is connected to the output terminal Q1 so that the output current I2 (= 2I1) of the current source 12, is supplied to the resistor 51 are alternately repeated, the terminal voltage of the resistor 51 is fed back to the current source 12 in the same manner as described above and the variable resistor in the current source 12 is controlled so that the output current I2 (= 2I1) is equal to 2Io.

The output of the low-pass filter circuit 82 is held during the time until the timing signal φ6 will become to the logic "1" after the time period T2 of Fig. 7.

Furthermore, during the following time period T3, the switches 91 and 92 are opened and the switch 93 is closed to select the low-pass filter circuit 83. The output of the phase sensitive detector 7 is disconnected from the low-pass filter circuit 82 and connected to the low-pass filter circuit 83. The output current I3 (=22I1) of the current source 13 is controlled to be equal to the value of Io + I1 + 2I1 = 22Io.

In the time period T3, since the outputs of the low-pass filter circuits 81 and 82 are held from the time periods T1 and T2, respectively, the output current I1 of the current source 11 is equal to Io and the output current I2 of the current source 12 is equal to 2Io, continuously. Therefore, while a condition where the change-over switches 40, 41 and 42 are connected to the respective terminals a and the input terminals Po, P1 and P2 are connected to the output terminal Q1 so that the current of Io + I1 + 2I1 = 22Io flows through the resistor 51 when the timing signals φ1, φ2 and φ3 in phase are in the logic "1" (at this time, φ4 is in the logic "0") and a condition where the change-over switch 43 is connected to the terminal a and the input terminal P3 is connected to the output terminal Q1 so that the output current I3 (= 22I1) of the current source 13 is supplied to the resistor 51 when the timing signal φ4 is in the logic "1" (at this time, φ1, φ2 and φ3 are in the logic "0") are alternately repeated, the terminal voltage of the resistor 51 is fed back to the current source 13 in the same manner as described above and the variable resistor in the current source 13 is controlled so that the output current I3 (= 22I1) is equal to 22Io. One complete cycle period is composed of the time periods T1, T2 and T3.

As described above, in the present embodiment, the change-over switch circuit 4 sequentially selects one input terminal Pi (i = 1, 2, 3) from the three input terminals P1, P2 and P3 in response to the time period T1, T2 or T3 determined by the timing signal φ5, φ6 or φ7, respectively, in the cycle time. Further, the change-over switch circuit 4 alternately connects each of the selected input terminal Pi and the input terminal Po with each of the output terminals Q1 and Q2 within each time period and connects the input terminal Pi-1 which is selected prior to the selected input terminal Pi within the cycle time with the same output terminal as the output terminal to which the input terminal P0 is connected. Accordingly, the change-over switch circuit 4 sets up the above connecting pattern between the input terminals Po - P3 and the output terminals Q1 and Q2.

By expanding the method of Fig. 6, it is easy to obtain the binary weighted current which is equal to 2N-1 times of current by using N (N > 3) numbers of current sources.

Further, in order to obtain the output current of 2NT1, the resistance value corresponding to the variable resistor 113 in the current source 11 may be 1/2 N with regard to the output current of 2NI1.

When the method of Figs. 4 and 6 is utilized, as shown in Fig. 8, the output current Io of the current source CS0 is the reference current and if the output currents I1 of (n-1) numbers of current sources CS1, CS2, ...' CS3 is sequentially controlled to be equal to I , respectively, n numbers of current sources of which output currents are equal to each other can be obtained.

Further, in order to obtain nI1 = nIo where the output currents for m numbers of current sources CS4, CS5, ..., CS6 are given by nI1 on the basis of the above results; the total sum of Io + Io + ..... + Io = nIo for the output currents of the current sources CSo - CS3 is obtained to supply the current sources CS4, CS5, ..., CS6 with the signal corresponding to nIo and the variable resistor in the respective current sources CS4, CS5, ..., CS6 may be controlled so that the respective output currents are equal to nIo.

In the above embodiment shown in Fig. 6, since the resistor 51 for comparing the currents is constant, the terminal voltage of the resistor 51 changes from IoR to 2N-1 IoR. However, there are problems that the resistance value of the resistor 51 can not be too small in order to maintain the detecting accuracy of the current and the voltage of the power supply must be high in order to maintain the normal operation if the voltage drop of 2N-1IoR is produced across the resistor 51. It is desirable to solve such problems since they are not desirable in view of the withstanding voltage or the maximum voltage and the power consumption when realized by the integrated circuits.

Further embodiments of the present invention where such problems are solved and operation is made in low voltage and low power consumption will be explained with reference to Figs. 9 - 12.

These embodiments may be achieved by changing the value of the resistor for detecting current in response to the magnitude of the compared currents, so that the terminal voltage of the resistor is maintained substantially constant and the voltage may be small even if comparing large currents.

For clarification of explanation, the following embodiments will show in the case where the binary weighted current up to N = 3 or 22Io. However, it can be achieved in the same manner in the case of N = 2 and N > 3.

Fig. 9 shows a circuit diagram of a fourth embodiment according to the present invention, which corresponds to the case of N = 3. In Fig. 9, like reference numbers as those of Fig. 6 indicate like constituents or parts. A current detecting resistance circuit (corresponding to the resistor 51 of Fig. 6) connected to the output terminal Q1 of the change-over switch circuit 4 is composed of a predetermined number of switches 501 - 503 corresponding to N (3 in Fig. 9) and resistors 511 - 513 connected in series to the respective switches. The resistors 511 - 513 have values of R, ½R and ½R, respectively. The switches 501, 502 and 503 are opened and closed depending to the polarity of the timing signals φ5, φ6 and φ7, respectively. Other circuit constitution is the same as that of Fig. 6. Since the currents Io and I1 alternately flow through the current detecting resistor circuit when the switch 91 is closed by the timing signal φ5 in the time period T1, the switch 501 is closed to connect the resistor 511 having a value of R as a detecting resistor. In the following time period T2, since the switch 92 is closed by the timing signal φ6 to compare the currents Io,+ I1 and I2 (= 2I1), the switch 502 is closed by φ6 to connect the detecting resistor 512 having a value of 2 R. Further, in the following time period T3, since the switch 93 is closed by φ7 to compare the currents Io + I1 + I2 and I3 (= 22I1), the switch 503 is closed by φ7 to connect the detecting resistor 513 having a value of R. In such a manner, selection of the resistance value of the detecting resistor depending on the value of the compared current cause all the voltage drop to be IoR. Although the embodiment shows the case of N = 3, it can be expanded to obtain the binary weighted current up to 2N-1 while maintaining the voltage drop of the detecting resistor constant if N numbers of resistors each having a value of 1 R (n = 1, 2, ..., N) are provided. If the dummy resistor 52 has a smaller value than 2N-1 R, there is no problem about the voltage drop due to this resistor. Since the voltage drop is constant in the circuit constitution of Fig. 9, the constant accuracy for the current ratio can be assured and the detecting accuracy is not reduced.

Furthermore, when the output resistances of the current sources 11 - 13 are not enough large and there is probability that the current sources 11 - 13 are affected by the load of the detecting resistor or the dummy resistor, as shown in Fig. 10, the terminals b of the change-over switches 40 - 43 in the change-over switches 40 - 43 in the change-over switch circuit 4 are not commonly connected to each other and separately connected to the respective dummy resistors 520 - 523, which have values of R, R, and (generally R and R (where n = 1, 2, ..., N)), respectively.

In.Figs. 9 and 10, N numbers of resistors having a resistance value of R (where n = 1, 2, ..., N) are used and connected in parallel with each other through the switches so that the voltage drops are maintained constant. However, it will be apparent to obtain the same effect by providing sevially connected resistors, as shown in Fig. 11, having terminals of R, R, R, ..., , between which switches 301 - 304 are disposed in parallel with the resistors to selectively short-circuit the resistors.

In this case, the relative error ΔIi/Ii of the i-th current Ii is given by the equation (5), if Ii is composed of a fixed part (Isi) independent on the output voltage Vgi of the low-pass filter circuits 81 - 83 and a changing part (gmi·V gi ) due to the output voltage Vgi as given by the equation (4):where A, a and a are gains of the alternating current amplifier circuit 6, the phase sensitive detector 7 and the low-pass filter circuits 81 - 83, respectively, and Ri is the value of the detecting resistor. Since Ri changes to R depending on the magnitude of the binary weighted current Ii, the equation (5) is given by:If the matching degree (1 - Isi/Ii) with no feedback is always constant, the relative error is maximum at the most significant bit MSB or In having a maximum weight. It is desirable to design A-α-β-gmi so that the relative error is sufficiently small at MSB.

However, since the open loop gain becomes large unnecessarily in order to enlarge Ri when the compared current is small, there is possibility that the stability of the feedback circuit and the saturation of the alternating current amplifier 6 due to noise cause trouble.

Fig. 12 shows a partial circuit diagram of a further embodiment according to the present invention, where the above problem are solved.

Fig. 12 shows a circuit diagram of the alternating current amplifier only. Other circuit constitutions is the same as in Fig. 9 or 10. In this embodiment, the gain of the amplifier 6 is changed depending on the magnitude of the detecting resistor Rio A predetermined number of switches 531 - 533 corresponding to N and resistors 541 - 543 connected in series to the respective switches and which have resistance values of Rin, ½ Rin and Rin (generally Rin; i = 1 - N), respectively, are connected in parallel between the capacitor 60 and the amplifier 6. The switches 531 - 533 are operated depending on the magnitude of the detecting resistor Ri so that the gain of the amplifier is equal to Ai = 2i-1·RF/Rin when Ii is detected. The switches 531 - 533 are controlled by the timing signals φ5 - φ7 for controlling the switches 501-503. By using such a circuit constitution, the open loop gain A·α·β·gmi becomes constant as RF·α·β·gmi·R/Rin.

Further, the mutual conductance gmi of the current source 11 - 13 may be given binary weight instead of changing the gain of the amplifier 6. Namely, if the mutual conductance gmi of the current source for Ii is given by:the open loop gain becomes constant as follows:

As described above, addition of the resistors and the switches can make constant the voltage drop across the resistor for detecting the binary weighted current with high accuracy while maintaining the detecting accuracy of the current constant. Therefore, DAC with high accuracy is realized and suitable for the integrated circuits with low supply voltage and low power consumption.

In DAC according to the present invention, since the currents are switched by the change-over switch circuit 4, the switching noise appears on the output terminal 101, resulting in reduction of accuracy.

Thus, operation will be made to a further embodiment where the influence of the switching noise is reduced. In order to reduce the influence of the switching noise, it can be achieved by simultaneously switching the change-over switch circuit 4 for switching the current to detect the difference and the switch 31 which is switched by the digital input signal and completing the switching operation of the switches in the change-over switch circuit 4 until the output 101 of DAC becomes steady. The switching noise of the switch 31 which is switched by the digital input signal, or what is generally called as glitch, can be reduced by adding a sample-and-hold circuit to the output terminal 101 to maintain the sample-and-hold circuit in the hold mode during a certain period (until the glitch disappears) from just before the swtich 31 is switched. Switching of the switches in the change-over switch circuit 4 may be also controlled when the sample-and-hold circuit added to the output terminal 101 is in the hold mode.

Fig. 13 shows a further embodiment of the present invention in which the switching noise is reduced and a clock signal synchronized with the digital input signal is added. In Fig. 13, the reference number 100 designates a basic part of DAC according to the present invention. The basic part in Fig. 13 is depicted with the circuit constitution of the embodiment of Fig. 2a. However, it may be attained with any circuit constitution in the above-described embodiments. This is the same as in the following embodiments. Since the clock CL is in synchronism with the digital input signal in the embodiment in Fig. 13, the output of the clock CL is divided by a counter 9 having a proper frequency dividing ratio into a frequency suitable for switching of the switches in the change-over switching circuit 4 to operate the timing signal generating circuit 22. Thus, when the switches in the change-over switch circuit are switched, the switch 31 is switched by the digital input signal, namely the output of DAC is changed. The noise at this time can be removed by making the sample-hold circuit 110 as deglitcher added to the output terminal 101 in the hold mode.

Further, Fig. 14 shows a further embodiment in which the synchronous clock as shown in the embodiment of Fig. 13 is not added. , This is achieved by switching the switches in the change-over switch circuit in synchronism with the timing when the digital input signal is switched. If the digital input signal does not change for a long time, it may be complemented by the internal clock.

Fig. 15 shows a timing chart of each portion of Fig. 14. The digital input signal is supplied to DAC 100. When the digital signal is changed by input signal change detecting circuits 210-212 (by way of example, a combination circuit of a delay circuit, AND circuits and NOR circuits are shown) provided in each bit of the digital input signal, namely when the output of DAC 100 changes, a signal B is produced to make the sample-hold circuit 110 in the hold mode. Once the signal B pases through an inhibit-signal generator 220 (by way of example, this circuit is composed of a delay circuit 221 such as a counter or a multivibrator and an AND circuit), the signal B is inhibited by a signal c to pass through the circuit during a certain period. A signal D is produced by the signal B caused by the switching of the first digital signal after release of the inhibition to set or reset a flip-flop 230 the output signal F of which operates the timing signal generating circuit 22. Consequently, since the error detecting switches in DAC 100 is switched, the time when the switches are switched is coincident with the time when the output of DAC 100 is changed by the change of the digital input signal. On the other hand, when the output of DAC is changed, the sample-hold circuit 110 becomes in the hold mode by the signal B to remove the switching noise.

Further, the digital input signal does not change for a long time, the signal D is produced from the inhibit-signal generator by the output signal A of a clock generating circuit 213 (by way of example, this circuit is composed of an oscillating circuit 10, a delay circuit and an AND circuit) to operate the flip-flop 230 and the timing signal generating circuit 22. Consequently, although the switching noise is produced since the error detecting swtiches operate, this influence is avoided by making the sample-hold circuit 110 to the hold mode by the signal E during this period. In Fig. 14, the reference number 222 is a circuit for converting a narrow pulse (signal D) generated from the inhibit-signal generator into a wide pulse having the same width as the control signal of the sample-hold circuit. If the digital input signal changes just after this time since the inhibit-signal generator operates at this time, the flip-flop 230 and the timing signal generating circuit 22 do not operate during a certain period and the timing signal generating circuit operates at a substantially constant interval. By suitably selecting the inhibit period of the inhibit-signal generator 220, the switching frequency of the switches can be suitable for the feedback circuit system. Although the switching frequency changes, there is no problem if the gain of the feedback system is large.

Next, Fig. 16 shows an embodiment where the sample-hold circuit is made to the sample mode to sample the output value of DAC just after the digital input signal changes and otherwise the sample-and-hold circuit is made to the hold mode. The change of the digital input signal is detected by the detecting circuits 210 - 212 when the signal is switched, and when the change is detected, the signal is delayed by a delay circuit 240 later than the switching time. When the output of DAC becomes steady, the sample-hold circuit 110 is made to the sample mode to sample the output of DAC 100. On the other hand, the switching of the error detecting switches is made by operating the timing signal generating circuit 22 by the pulse generating circuit 213 for generating pulses at a certain period. However, the output of the pulse generating circuit 213 is not supplied to the timing signal generating circuit 22 by a monostable multivibrator 241 or the like during the time when the sample-hold circuit is in the sample mode so that the switching of the switches is not made. Since the swiching of the error detecting switches in DAC 100 is made only when the sample-hold circuit 110 is in the hold mode, the influence does not appear on the output.

In the embodiment shown in Fig. 16, when the sample-hold circuit 110 is in the sample mode, the switching of the error detecting switches is not made until the next pulse generation of the pulse generating circuit 213. Fig. 17 shows a further embodiment where the switching of the switches is made just after the sample-circuit becomes in the hold mode when the switching timing of the switches coincides to the sample mode. Namely, when the output of the pulse generating circuit 213 coincides to the output of the monostable multivibrator 241 which indicates a constant period (from the time when the sample-hold circuit 110 becomes to the sample mode to the time when it returns to the hold mode) just after the digital input signal changes, RS flip-flop 242 is . set and when the sample-circuit 110 becomes to the hold mode a pulse is supplied to the timing signal generating circuit 22 by the monostable multivibrator 243 so that the switching of the error detecting switches is made. On the other hand, at this time, RS flip-flop 242 is reset. Other constitution and operation are the same as those in Fig.16.

As described above, the timing when the noise of the switches for comparing two or more currents appears on the output is synchronized with the timing when the output of DAC is changed by the digital input signal or coincides to the hold period of the sample-hold circuit added to the output terminal of DAC, so that the switching noise does not appear on the output seemingly and the D-A converter with higher accuracy can be realized.

QQ群二维码
意见反馈