141 |
SYSTEM AND METHOD FOR OPTICAL CONFINEMENT OF ATOMIC PARTICLES |
US14474702 |
2014-09-02 |
US20160064108A1 |
2016-03-03 |
Mark E. Saffman; Martin T. Lichtman |
A system and method for controlling atomic particles using projected light are provided. In some aspects, a method includes providing a plurality of atomic particles, and generating light fields using frequencies shifted from at least one atomic resonance. The method also includes forming a two-dimensional (“2D”) optical array using the generated light fields, wherein the 2D optical array comprises linear segments of light, and projecting the 2D optical array on the plurality of atomic particles to control their respective locations in space. |
142 |
SYSTEMS AND METHODS FOR GENERATING COMPLEX VECTORIAL OPTICAL FIELDS |
US14742362 |
2015-06-17 |
US20160055929A1 |
2016-02-25 |
Qiwen Zhan; Wei Han; Wen Cheng |
A vectorial optical field generator includes a radiation source a modulator surface, a first quarter wave plate, a second quarter wave plate, and an output plane. The radiation source emits an input radiation along a path and the modulator surface is positioned along the path and configured to modulate a phase, an amplitude, a polarization ratio, and a retardation of the input radiation along a fourth area of the modulator surface. The output plane is positioned along the path and receives output radiation resulting from modulating the input radiation with the modulator surface, the first quarter wave plate, and the second quarter wave plate. |
143 |
METHODS AND APPARATUS FOR MONITORING INTERACTIONS BETWEEN PARTICLES AND MOLECULES USING NANOPHOTONIC TRAPPING |
US14824423 |
2015-08-12 |
US20160047944A1 |
2016-02-18 |
David Erickson; Pilgyu Kang |
A method for characterizing an interaction between a first particle and a second particle is provided. The method includes the steps of: (i) providing an optical trap system including a photonics-based trap, a light source, and a camera; (ii) optically trapping, using the photonics-based trap, the first particle; (iii) obtaining a first measurement of a trap stiffness of the photonics-based trap; (iv) introducing the second particle to the optically trapped particle; (v) incubating the first and second particles under conditions suitable for an interaction between the first and second particles; (vi) obtaining a second measurement of the trap stiffness of the photonics-based trap after the incubation; and (vii) determining, using the first measurement of trap stiffness and the second measurement of trap stiffness, a property of the interaction between the first particle and the second particle. |
144 |
System for sorting microscopic objects using electromagnetic radiation |
US14368109 |
2012-12-28 |
US09259741B2 |
2016-02-16 |
Jesper Glückstad |
There is presented a system 10,100 for sorting microscopic objects 76, 78, 80, where the system comprises a fluid channel 66 with an inlet 68 and an outlet 70, where the fluid channel is arranged for allowing the fluid flow to be laminar. The system furthermore comprises a detection system 52 which enables detecting microscopic objects in the fluid channel and furthermore enables determining their position. The system furthermore comprises a controller 67, such as a computer, which receives the positions and accordingly controls a source of light beams so as to “shoot” light beams towards selected microscopic objects so as to “push” them into a new position. The system thereby enables sorting the selected microscopic objects. In more specific embodiments, the detection system furthermore assigns different categories to different microscopic objects, so as to enable sorting based on multiple categories. |
145 |
Ultra-Cold-Matter System with Thermally-Isolated Nested Source Cell |
US14594111 |
2015-01-10 |
US20150200029A1 |
2015-07-16 |
Steven Michael Hughes; Janet Duggan; Dana Z. Anderson |
In a disclosed embodiment, an ultra-cold-matter (UCM) system includes a source cell nested within a hermetically-sealed ultra-high-vacuum (UHV) enclosure. Source particles, e.g., strontium atoms, can be generated within the source cell by heating a non-vapor-phase source material. The source cell is thermally isolated, e.g., by UHV, from the enclosure. Accordingly, heat is retained in the source cell, reducing the amount of heat that must be generated in the source cell to generate the vapor-phase source particles. Particles can exit the source cell to an UHV ultra-cold region where the source particles can be cooled to produce ultra-cold particles thermally isolated from the heat within the source cell. |
146 |
Methods of Using Near Field Optical Forces |
US14399600 |
2013-03-15 |
US20150111199A1 |
2015-04-23 |
Robert Hart; Bernardo Cordovez |
Methods of studying, interrogating, analyzing, and detecting particles, substances, and the like with near field light are described. Methods of identifying binding partners, modulators, inhibitors, and the like of particles, substances, and the like with near field light are described. In certain embodiments, the methods comprise immobilizing or trapping the particle, substance, and the like. |
147 |
METHOD AND STRUCTURE FOR PLASMONIC OPTICAL TRAPPING OF NANO-SCALE PARTICLES |
US14209904 |
2014-03-13 |
US20140374581A1 |
2014-12-25 |
Jennifer Anne Dionne; Amr Ahmed Essawi Saleh |
Methods and article for optically trapping nano-sized objects by illuminating a coaxial plasmonic aperture are disclosed. |
148 |
SYSTEM FOR SORTING MICROSCOPIC OBJECTS USING ELECTROMAGNETIC RADIATION |
US14368109 |
2012-12-28 |
US20140367315A1 |
2014-12-18 |
Jesper Glückstad |
There is presented a system 10,100 for sorting microscopic objects 76, 78, 80, where the system comprises a fluid channel 66 with an inlet 68 and an outlet 70, where the fluid channel is arranged for allowing the fluid flow to be laminar. The system furthermore comprises a detection system 52 which enables detecting microscopic objects in the fluid channel and furthermore enables determining their position. The system furthermore comprises a controller 67, such as a computer, which receives the positions and accordingly controls a source of light beams so as to “shoot” light beams towards selected microscopic objects so as to “push” them into a new position. The system thereby enables sorting the selected microscopic objects. In more specific embodiments, the detection system furthermore assigns different categories to different microscopic objects, so as to enable sorting based on multiple categories. |
149 |
Method and device for accurately measuring the incident flux of ambient particles in a high or ultra-high vacuum environment |
US13116982 |
2011-05-26 |
US08803072B2 |
2014-08-12 |
James Lawrence Booth; David Erik Fagnan; Bruce George Klappauf; Kirk William Madison; Jicheng Wang |
An apparatus and method that can measure flux density in-situ under high vacuum conditions includes a means for confining a collection of identical, elemental sensor particles to a volume of space by initial cooling by laser or another method, then confinement in a sensor volume using externally applied magnetic and/or optical fields. |
150 |
Methods and means for manipulating particles |
US13613725 |
2012-09-13 |
US08723104B2 |
2014-05-13 |
Dong Sun; Xiaolin Wang |
The present invention is concerned with a system for sorting target particles from a flow of particles. The system has a microscope, a light source, a CCD camera, microfluidic chip device with microfluidic channels, a detection apparatus for detecting the target particles with predefined specific features, a response generating apparatus for generating a signal in response to the detection of the target particles, and an optical tweezing system for controlling movement of optical traps, the optical tweezing system is operably linked to the response signal. |
151 |
DEVICE FOR PRODUCING LASER-COOLED ATOMS |
US13603287 |
2012-09-04 |
US20140061454A1 |
2014-03-06 |
Thomas H. Loftus; Artyom Vitouchkine; Michael R. Matthews; Adam T. Black; Igor Teper; Leo W. Hollberg; Todd L. Gustavson; Brent C. Young |
The device for producing laser-cooled atoms comprises a two dimensional trap or a three-dimensional trap, or a combination of two- and three-dimensional traps. The two-dimensional trap comprises: three or more permanent magnets arranged around a perimeter of a loop, wherein a plane of the loop is perpendicular to a free axis of the two-dimensional atom trap, and the three or more permanent magnets bracket an internal volume of the two-dimensional atom trap; and one or more laser beam input ports enabling access for one or more laser beams to the internal volume of the two-dimensional atom trap. |
152 |
ADIABATIC RAPID PASSAGE ATOMIC BEAMSPLITTER USING FREQUENCY-SWEPT COHERENT LASER BEAM PAIRS |
US13688429 |
2012-11-29 |
US20130168541A1 |
2013-07-04 |
Richard E. Stoner; Joseph M. Kinast; Brian P. Timmons |
Methods and apparatus for providing coherent atom population transfer using coherent laser beam pairs in which the frequency difference between the beams of a pair is swept over time. Certain examples include a Raman pulse adiabatic rapid passage sweep regimen configured to be used as a beamsplitter and combiner in conjunction with an adiabatic rapid passage mirror sweep or a standard Raman mirror pulse in a 3-pulse interferometer sequence. |
153 |
Ultracold-matter systems |
US12600821 |
2008-05-19 |
US08405021B2 |
2013-03-26 |
Dana Z. Anderson; Evan Salim; Matthew Squires; Sterling Eduardo McBride; Steven Alan Lipp; Joey John Michalchuk |
Cold-atom systems and methods of handling cold atoms are disclosed. A cold-atom system has multiple chambers and a fluidic connection between two of the chambers. One of these two chambers includes an atom source and the other includes an atom chip. |
154 |
Optical array device and methods of use thereof for screening, analysis and manipulation of particles |
US12664340 |
2008-06-25 |
US08338776B2 |
2012-12-25 |
David R. Walt; Alexei R. Faustov |
Methods and devices are provided for the trapping, including optical trapping; analysis; and selective manipulation of particles on an optical array. A device parcels a light source into many points of light transmitted through a microlens optical array and an Offner relay to an objective, where particles may be trapped. Preferably the individual points of light are individually controllable through a light controlling device. Optical properties of the particles may be determined by interrogation with light focused through the optical array. The particles may be manipulated by immobilizing or releasing specific particles, separating types of particles, etc. |
155 |
Optical Array Device and Methods of Use Thereof for Screening, Analysis and Manipulation of Particles |
US12664340 |
2008-06-25 |
US20110089315A1 |
2011-04-21 |
David R. Walt; Alexei R. Faustov |
Methods and devices are provided for the trapping, including optical trapping; analysis; and selective manipulation of particles on an optical array. A device parcels a light source into many points of light transmitted through a microlens optical array and an Offner relay to an objective, where particles may be trapped. Preferably the individual points of light are individually controllable through a light controlling device. Optical properties of the particles may be determined by interrogation with light focused through the optical array. The particles may be manipulated by immobilizing or releasing specific particles, separating types of particles, etc. |
156 |
Ultracold-Matter Systems |
US12600821 |
2008-05-19 |
US20100200739A1 |
2010-08-12 |
Dana Z. Anderson; Evan Salim; Matthew Squires; Sterling Eduardo McBride; Steven Alan Lipp; Joey John Michalchuk |
Cold-atom systems and methods of handling cold atoms are disclosed. A cold-atom system has multiple chambers and a fluidic connection between two of the chambers. One of these two chambers includes an atom source and the other includes an atom chip. |
157 |
Optical trapping with a semiconductor |
US11525518 |
2006-09-22 |
US07745788B2 |
2010-06-29 |
David C. Appleyard; Matthew J. Lang |
A method and apparatus are disclosed for forming an optical trap with light directed through or above a semiconductor material. A preferred embodiment selected light-trapping wavelengths that have lower absorption by the semiconductor. A preferred embodiment provides for an optical trapping through semiconductor employing a thin silicon (Si) wafer as a substrate. Further embodiments of the invention provide for microchannel fabrication, force probe measurement, sorting, switching and other active manipulation and assembly using an optical trap. |
158 |
Method of optical manipulation of small-sized particles |
US11946966 |
2007-11-29 |
US07696473B2 |
2010-04-13 |
Romain Roger Quidant; Maurizio Righini |
Method and system of optical manipulation of micrometer-sized objects, which comprises the steps of placing a pattern (2) of a certain material on a surface (1), wherein said material is capable of sustaining surface plasmons; placing a solution (4) comprising micrometer-sized objects in contact with said surface (1) and said pattern (2); applying at least one optical beam (5) at a certain wavelength and with a certain incident angle (Φ) to said surface (1) for certain time interval, thereby creating surface plasmons forces at said surface (1), in such a way that said micrometer-sized objects are trapped by the pattern (2) in a stable and selective way. Optical trap and use thereof as a tool for optically driven lab-on-a-chip. |
159 |
OPTICAL-BASED CELL DEFORMABILITY |
US12167136 |
2008-07-02 |
US20090026387A1 |
2009-01-29 |
Jeff Squier; David W.M. Marr; Robert Applegate; Tor Vestad; Justin Chichester |
A system, method, and device for re-orienting and/or deforming cells and other objects is provided. The system, method, and device may include a high-throughput setup that facilitates the ability to orient, deform, analyze, measure, and/or tag objects at a substantially higher rate than was previously possible. A relatively large number of cells and other objects can be deformed, by optical forces for example, as the cells and other objects a flowed through the system. |
160 |
Atomic device |
US10548903 |
2004-03-12 |
US07459673B2 |
2008-12-02 |
Hidetoshi Katori |
A trapping position 30 is defined on a substrate 1, and an electrode pattern 2 is formed on the substrate 1, having a first pair of electrodes 21 including electrodes 22 and 23 formed at positions opposite each other with the trapping position 30 placed therebetween along a diagonal x-axis, and a second pair of electrodes 26 including electrodes 27 and 28 formed at positions opposite each other with the trapping position 30 placed therebetween along a y-axis orthogonal to the x-axis. The atomic device alternately switches between a first state and a second state to trap a neutral atom at the trapping position 30; in the first state, the electrode 22 of the first pair of electrodes 21 is set at a positive potential +V0 with respect to a reference potential and the electrode 23 is set at a negative potential −V0, and in the second state, the electrode 27 of the second pair of electrodes 26 is set at the positive potential +V0 and the electrode 28 is set at the negative potential −V0. This allows for realizing an atomic device which can facilitate integration of atomic circuits and reduce disturbances or the like. |