Measuring method for distortion at mirror peripheral part
专利汇可以提供Measuring method for distortion at mirror peripheral part专利检索，专利查询，专利分析的服务。并且PURPOSE: To measure the width size of a distortion area formed at the periphery of a mirror speedily and accurately by using an opaque thin plate type member which has a sharp corner.
CONSTITUTION: While part of the surface of the mirror is covered with the opaque thin plate member 6 which has the sharp corner, luminous flux emitted by a projector 8 nearly equivalent to a spot light source is projected on the surface of the mirror 2 and the thin plate type member 6 is moves to and away so that the sharp corner opposite the periphery of the mirror 2 to calculate the critical point where the shade of the part of the sharp corner projected on a screen 7 begins to be distorted into a round shape. Then, when the projec tion image on the screen 7 enters the critical state, the gap W' between the corner 6a of the thin plate type member 6 and the periphery of the mirror 2 is measured on a measure 10. The measured value W' is the width size of the distortion area at the periphery of the mirror 2.
COPYRIGHT: (C)1986,JPO&Japio，下面是Measuring method for distortion at mirror peripheral part专利的具体信息内容。
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