首页 / 专利库 / 信号处理 / 频谱分析仪 / Beryllium monitor means utilizing an electric arc and spectrum analyzer

Beryllium monitor means utilizing an electric arc and spectrum analyzer

阅读:158发布:2022-01-09

专利汇可以提供Beryllium monitor means utilizing an electric arc and spectrum analyzer专利检索,专利查询,专利分析的服务。并且,下面是Beryllium monitor means utilizing an electric arc and spectrum analyzer专利的具体信息内容。

1. APPARATUS FOR THE QUANTITATIVE ANALYSIS OF A SELECTED SOLID CONTAMINATING ELEMENT IN PARTICULATE FORM IN A GAS COMPRISING A SPECTRUM ANALYSIS CHAMBER, AN ARC CHAMBER, A PAIR OF SPACED ELECTRODES LOCATED IN THE ARC CHAMBER AND DEFINING AN ARC THEREBETWEEN, MEANS TO PASS SAID GAS CONTAINING THE SOLID CONTAMINATING ELEMENT THROUGH SAID ARC CHAMBER AND SAID ARC TO PRODUCE RADIATION, MEANS TO MEASURE THE RATE OF FLOW OF SAID GAS, A WINDOW IN SAID ARC CHAMBER POSITIONED TO ENABLE PASSAGE OF THE RADIATION FROM SAID ARC TO THE SPECTRUM ANALAYSIS CHAMBER, AN IMAGE SLIT IN SAID SPECTRUM ANALYSIS CHAMBER ALIGNED WITH SAID WINDOW AND SAID ARC, MEANS TO FORM A SPECTRUM OF THE RADIATIONS ENTERING SAID IMAGE SLIT, A FIRST OBJECT SLIT POSITIONED TO ADMIT A SELECTED LINE IN SAID SPECTRUM, IN A SECOND OBJECT SLIT POSITIONED TO ADMIT BACKGROUND RADIATION ADJACENT SAID LINE, AND MEANS TO COMPARE THE RELATIVE INTENSITIES OF RADIATION ADMITTED BY SAID TWO OBJECT SLITS.
说明书全文
高效检索全球专利

专利汇是专利免费检索,专利查询,专利分析-国家发明专利查询检索分析平台,是提供专利分析,专利查询,专利检索等数据服务功能的知识产权数据服务商。

我们的产品包含105个国家的1.26亿组数据,免费查、免费专利分析。

申请试用

分析报告

专利汇分析报告产品可以对行业情报数据进行梳理分析,涉及维度包括行业专利基本状况分析、地域分析、技术分析、发明人分析、申请人分析、专利权人分析、失效分析、核心专利分析、法律分析、研发重点分析、企业专利处境分析、技术处境分析、专利寿命分析、企业定位分析、引证分析等超过60个分析角度,系统通过AI智能系统对图表进行解读,只需1分钟,一键生成行业专利分析报告。

申请试用

QQ群二维码
意见反馈