Method of correcting photoelectric microscopes
专利汇可以提供Method of correcting photoelectric microscopes专利检索，专利查询，专利分析的服务。并且A method of correcting a photoelectric microscope adapted to generate a photoelectric signal for detecting the end face position of a specimen in which the photoelectric signal is supplied to a pilot meter such, for example, as a conventional voltmeter or ammeter. The pilot meter has a scale with a level for generating the detecting pulse from a wave form shaping circuit marked thereon. The gain of the photoelectric signal is adjusted such that the ratio of the amplitude from the dark level to the level for generating the detecting pulse to the amplitude from the level for generating the detecting pulse to the bright level is made equal to a value defined by the change in the distribution of the quantity of light rays near the end face of the specimen. The level of the photoelectric signal may also be adjusted to obtain the same result. It is preferable to effect the adjustment of both the level and the gain of the photoelectric signal to obtain the ratio equal to the defined value. The desired ratio can be obtained by observing the deflection of an indication needle of the pilot meter. The specimen is moved to be scanned by a slit and a correct detecting pulse is generated at each instant when each edge of the end face of the specimen passes the center of the slit irrespective of possible change of the quantity of light near the end face of the specimen resulting from changes in configuration of and reflecting power at the specimen and in contrast, illumination, etc.，下面是Method of correcting photoelectric microscopes专利的具体信息内容。
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