Inter-atomic force microscope and its probe
专利汇可以提供Inter-atomic force microscope and its probe专利检索，专利查询，专利分析的服务。并且PURPOSE: To facilitate probe replacement and to obtain reproducible data by forming 1st and 2nd probes integrally with a cantilever, and manufacturing at least one of them by using a physical film forming method.
CONSTITUTION: The cantilever 106 is arranged between a sample 104 and a cantilever displacement reference conductor 108 on the inter-atomic force microscope and displaced with the mutual operating force between the sample 104 and 1st probe 105. The 2nd probe 107 is formed on the opposite side of the lever 106. A tunnel current detecting circuit 112 detects a tunnel current which flows to the probe 107 with a bias applied to the probe 107 from a bias circuit 111. Then the output of the circuit 112 is processed by an image data processing circuit 115 to output a sample image on a monitor 116. Thus, the probes 104 and 107 are formed on the cantilever 106. At the time of replacing the lever 106 replaced, the probes 105 and 107 are already positioned and need not be positioned again.
COPYRIGHT: (C)1991,JPO&Japio，下面是Inter-atomic force microscope and its probe专利的具体信息内容。
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