Atomic force microscope
专利汇可以提供Atomic force microscope专利检索，专利查询，专利分析的服务。并且PURPOSE: To correctly position the monitoring position of a sample and a probe by providing a cantilever having a marker at a position corresponding to an end of said probe.
CONSTITUTION: A cantilever 1 is moved within the view field of an optical microscope by a pulse motor 7 and a tripod 6. A mark on the lever 1 is agreed with a crossing point of a cross on a reticle. The position of the lever 1 is stored by a pulse counter of the motor 7 or the like. In the case of using a TV camera 43, the mark is adjusted to a cross cursor on a TV monitor. Thereafter, the lever 1 is moved outside the view field of the optical microscope by the motor 7, and a roughly moving stage 13 is moved through an eye lens 42 and the camera 43 to adjust a position to be measured of a sample 9 to which the focus of the optical microscope is adjusted with the crossing point of the cross. Then, the mark of the lever 1 is agreed with the crossing point of the cross by the motor 7 and tripod 6 again, and an end of a probe 2 of the lever 1 is adjusted to the measuring position of the simple 9.
COPYRIGHT: (C)1991,JPO&Japio，下面是Atomic force microscope专利的具体信息内容。
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