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Probe unit for electro-surgical device

阅读:306发布:2022-11-25

专利汇可以提供Probe unit for electro-surgical device专利检索,专利查询,专利分析的服务。并且A probe unit for applying high level high frequency voltages to tissues to be treated has a tubular handpiece having an operative end and a female connector fixed at the operative end and connectable to a source of high level high frequency voltage. An interchangeable plastic nose piece, which can be conical or contra-angled in shape, includes a proximal end provided with a mating male connector electrically engageable with the female connector. An elongate conductor sleeve is in electrical communication with the male connector and extends to a distal end remote from the proximal end of the nose piece. A disposable probe tip, which includes a cutting tip, is configurated so as to be receivable in the elongate sleeve of the nose piece. The probe tip has an elongate insulating cylindrical shell having two axial slots. A resilient conductive wire, which forms part of the external cutting tip, extends partially interiorly of the shell to form two spaced opposing resilient arcuate portions which pass through the respective slots and which are depressible into the shell. In this manner, insertion of the shell into the sleeve depresses the arcuate portions to thereby provide frictional engagement and electrical contact between the cutting tip and the sleeve.,下面是Probe unit for electro-surgical device专利的具体信息内容。

1. In an electro-surgical device, a probe unit for applying high level high frequency voltages to tissue to be treated, said probe unit comprising an elongate tubular handpiece having an operative end; a conductive connector element disposed at said operative end adaPted to be connected to a source of high level high frequency voltage; an elongate nose piece having a proximal end and a distal end, said proximal end being provided with a portion generally having configuration complementary to said operative end and said connector element; electrical conductor means extending between said proximal and distal ends, said conductor means including a portion at said proximal end engageable with said connector element and a conductive sleeve portion at said distal end; and a probe tip comprising an elongate insulating cylindrical shell receivable in said sleeve portion, said shell having two opposing axial slots and a narrowed axial end, and a resilient wire forming a first portion extending beyond said narrowed axial end to form an external operating tip and forming a second portion disposed inside said shell, said second portion being provided with two spaced opposing resilient arcuate portions passing through said respective slots and being depressible into said shell, whereby insertion of said shell into said sleeve portion partially depresses said arcuate portions to thereby provide frictional engagement and electrical contact between said wire and said sleeve portion.
2. A probe unit as defined in claim 1, wherein said handpiece is connected to a source of high level high frequency voltage, further comprising a switch mounted on said handpiece at said operative end, said switch being operatively connected to the source of voltage, whereby the application of voltage at said probe tip is controllable by manipulating said switch.
3. A probe unit as defined in claim 1, wherein said conductive connector element comprises a female connector, and said conductor means portion at said proximal end comprises a male connector engageable with said female connector.
4. A probe unit as defined in claim 1, wherein said operative end and said connector element together define a cylindrical end portion, said proximal end of said nose piece being provided with a cylindrical recessed portion adapted to view said cylindrical end portion.
5. A probe unit as defined in claim 4, further comprising biassing means interposed between said cylindrical and recessed portins for providing frictional retention therebetween.
6. A probe unit as defined in claim 1, wherein said nose piece proximal end is cylindrical exteriorly, said distal end being conical exteriorly tapered away from said proximal end.
7. A probe unit as defined in claim 1, wherein said nose piece is formed of synthetic resin, and said sleeve portion is embedded in and extends through said distal end of said plastic nose piece.
8. A probe unit as defined in clain 1, wherein said nose piece proximal end is cylindrical exteriorly, said distal end being contra-angle shaped and tapered away from said proximal end.
9. A probe unit as defined in claim 1, wherein said wire is a continuous section substantially doubled up with the two wire ends forming part of said second portion disposed inside said shell, and said first portion is in the form of a loop.
10. A probe unit as defined in claim 9, wherein said loop is diamond shaped.
11. A probe unit as defined in claim 9, wherein said loop defines a first plane, and wherein said second wire portion defines a second plane substantially normal to said first plane.
12. A probe tip insertable into a conductive sleeve of a probe unit utilized in conjunction with an electro-surgical device, said tip comprising an elongate insulating cylindrical shell receivable in said sleeve portion, said shell having two opposing axial slots and a narrowed axial end, and a resilient wire forming a first portion extending beyond said narrowed axial end to form an external operating tip and forming a second portion disposed inside said shell, said second portion being provided with two spaced opposing resilient arcuate portions passing through said respective slots and being depressible into said shell, whereby insertion of said shell into said sleeve Portion depresses said arcuate portions to thereby provide frictional engagement and electrical contact between said wire and said sleeve portion.
13. A probe unit as defined in claim 9, wherein said wire is a continuous section substantially doubled up with the two wire ends forming part of said second portion disposed inside said shell, and said first portion is in the form of a loop.
14. A probe unit as defined in claim 13, wherein said loop is diamond shaped.
15. A probe unit as defined in claim 13, wherein said loop defines a first plane, and wherein said second wire portion defines a second plane substantially normal to said first plane.
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