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Fine interval measuring method

阅读:396发布:2022-10-20

专利汇可以提供Fine interval measuring method专利检索,专利查询,专利分析的服务。并且PURPOSE:To take a precise measurement of the fine interval between a magnetic recording medium and an electromagnetic converting element by combining a dummy recording medium and a head, or a recording medium and a dummy head, and utilizing the interference of transmitted monochromatic light with the head surface or medium surface. CONSTITUTION:A mirror having the reflecting film, protection film, etc., modified for infrared rays is used. The incident beam angle theta1 and reflected beam angle theta2 of, specially, the mirror are set to, for example, about 5 deg. while theta1=theta2, realizing a total reflection type. The theta1 is less that the critical angle where a beam is not reflected totally by the surface of a dummy disk. Light emitted from a light source is reflected totally by a total reflecting mirror 7 and transmitted through a disk 8 at the incidence angle theta1 to reach a head 9. The light reflected by the head 9 at the reflection angle theta2 is photodetected by a photodetection camera 10 to monitor its image on a monitor 11. For measuring operation, the wavelength lambda1 of light interference at an optional point is found after the light irradiation from the light source to a body to be measured, and the wavelength of a monochrometer is varied continuously at the same point to find wavelength lambda2 when (j) (normally one) interference fringes shift in position. Then, S (floating amount) is calculated from the obtained values lambda1 and lambda2.,下面是Fine interval measuring method专利的具体信息内容。

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