Lead inspecting method and lead measuring apparatus used in said method and lead inspecting apparatus
专利汇可以提供Lead inspecting method and lead measuring apparatus used in said method and lead inspecting apparatus专利检索，专利查询，专利分析的服务。并且PURPOSE: To make it possible to measure the position relation automatically without human working by facing an electronic device having a package with a mirror surface, sensing the real images and the virtual images of the lead group, and processing the image signals.
CONSTITUTION: A QFP IC 1 having a quad flat package is made to face a mirror surface 90 in parallel. Light is projected from a lighting device 100. The real images and the virtual images of a lead group are picked up with TV cameras 93 in a plurality of directions. An image processing part 96 measures the central position, the position of the tip of the real image and the position of the tip of the virtual image for each lead 3 based on the image signals. Furthermore, the pitch of the leads, the interval between the tip of the real image and the tip of the virtual image and the differences between the tip positions of the real image and the virtual images and a reference position are obtained for each lead 3. In a judging part 98, the quality of each lead is automatically judged from the data for three directions of X, Y and Z.
COPYRIGHT: (C)1991,JPO&Japio，下面是Lead inspecting method and lead measuring apparatus used in said method and lead inspecting apparatus专利的具体信息内容。
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