专利汇可以提供Logic analyzer专利检索,专利查询,专利分析的服务。并且PURPOSE: To confirm the mutual relation of pattern signals at a glance by displaying pattern signals with not only characters and symbols but also waveforms.
CONSTITUTION: A signal to be tested taken in by probes 7AW7D is judged to be in the high level or the low level synchronously with the clock of a logic analyzer by a waveform shaping circuit 1A and is taken into a high-speed memory 1B while being normalized. The program which operates a data taking-in device 1, a pattern generator 2, and a display device 9 in a prescribed order is stored in a ROM3B, and pattern data for pattern generation (the polarity of the pattern signal, the delay time from a reference timing, and width information) and microcodes are stored in a RAM3C. Data of the pattern, the delay time, and the width taken into the RAM3C are transferred to the device 9; and on a basis of individual data, not only set numerical values, a symbol indicating the polarity, etc. but also the waveform of the pattern signal determined by them are displayed. Pattern data is converted to waveform display data by a microcomputer 3.
COPYRIGHT: (C)1985,JPO&Japio,下面是Logic analyzer专利的具体信息内容。
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