| 序号 | 专利名 | 申请号 | 申请日 | 公开（公告）号 | 公开（公告）日 | 发明人 |
|---|---|---|---|---|---|---|
| 1 | 基于P偏振光的棱镜SPR传感器检测系统 | CN200910028416.3 | 2009-01-16 | CN101477045B | 2011-11-30 | 曾捷; 梁大开; 赵志远; 张晓丽; 万艳 |
| 一种基于P偏振光的棱镜SPR传感器检测系统，属于棱镜SPR传感器系统技术领域。依次由光源(1)、多模光纤(2)、棱镜SPR传感器(4)、凸透镜(5)、通过多模光纤(6)接受上述凸透镜(5)传来光线的光谱仪(7)与上述光谱仪相连的计算机(9)组成，其特征在于：在上述光源(1)与棱镜SPR传感器(4)之间还设有分光带宽为400nm-1000nm的偏振分光棱镜(3)。该方法使光谱中共振波谷半波宽度减小，更利于波长调制方法中共振波长参数的分析和检测，也有利于改善棱镜分布式测量系统检测共振光谱中各个共振波谷的粘连现象。本发明有光路简单、共振波谷窄、检测精度高等特点。 | ||||||
| 2 | 基于P偏振光的棱镜SPR传感器检测系统 | CN200910028416.3 | 2009-01-16 | CN101477045A | 2009-07-08 | 曾捷; 梁大开; 赵志远; 张晓丽; 万艳 |
| 一种基于P偏振光的棱镜SPR传感器检测系统，属于棱镜SPR传感器系统技术领域。依次由光源(1)、多模光纤(2)、棱镜SPR传感器(4)、凸透镜(5)、通过多模光纤(6)接受上述凸透镜(5)传来光线的光谱仪(7)与上述光谱仪相连的计算机(9)组成，其特征在于：在上述光源(1)与棱镜SRP传感器(4)之间还设有分光带宽为400nm－1000nm的偏振分光棱镜(3)。该方法使光谱中共振波谷半波宽度减小，更利于波长调制方法中共振波长参数的分析和检测，也有利于改善棱镜分布式测量系统检测共振光谱中各个共振波谷的粘连现象。本发明有光路简单、共振波谷窄、检测精度高等特点。 | ||||||
| 3 | 可增透P偏振光的抬头显示薄膜 | CN202321828363.5 | 2023-07-12 | CN220709461U | 2024-04-02 | 吕敬波; 王雪利; 顾豪栋; 于佩强 |
| 本实用新型公开了一种可增透P偏振光的抬头显示薄膜，用于增强P偏振光的透过率，该可增透P偏振光的抬头显示薄膜包括光偏转层、基材层、HC层和减反层。基材层设于光偏转层的一表面。HC层设于基材层的另一表面。减反层设于HC层远离基材层的一面。其中，在400‑700nm波段内，P偏振光对该可增透P偏振光的抬头显示薄膜的透过率为对入射角为25°‑45°的透过率为99.1％‑99.8％；在400‑700nm波段内，P偏振光对该可增透P偏振光的抬头显示薄膜的透过率为对入射角为25°‑45°的反射率为0.1％‑0.6％。该可增透P偏振光的抬头显示薄膜，通过在可增透P偏振光的抬头显示薄膜中设置了光偏转层，使得P偏振光能够以较高的透过率透过前挡风玻璃，并在前挡风玻璃的外侧面形成影像。 | ||||||
| 4 | 一种P-偏振光分束比可控的偏振分束器及其工作方法 | CN201610112542.7 | 2016-02-29 | CN105607274A | 2016-05-25 | 徐德刚; 严德贤; 王与烨; 钟凯; 闫超; 刘鹏翔; 石嘉; 姚建铨 |
| 本发明公开了一种P-偏振光分束比(即能量强度比值)可控的偏振分束器及其工作方法，分束器包括立方体棱镜和四分之一波片，立方体棱镜由两块四面体棱镜构成，四分之一波片设置在所述四面体棱镜之间，所述四分之一波片通过光胶与所述四面体棱镜相贴合，所述四分之一波片与所述四面体棱镜之间的角度均为45°，四分之一波片连接有外控电压模块。本发明方法通过外控电压模块改变内嵌四分之一波片的折射率，实现偏振分光比的精确调节，从而实现控制两束出射光的分束比，最终获得满足一定需求的能量分光比可控的两束正交P-偏振的纯态偏振光束输出，可以应用在空间领域，尤其是能够应用在偏振干涉测量以及偏振成像系统中。 | ||||||
| 5 | 一种P-偏振光分束比可控的偏振分束器及其工作方法 | CN201610112542.7 | 2016-02-29 | CN105607274B | 2019-01-11 | 徐德刚; 严德贤; 王与烨; 钟凯; 闫超; 刘鹏翔; 石嘉; 姚建铨 |
| 本发明公开了一种P‑偏振光分束比(即能量强度比值)可控的偏振分束器及其工作方法，分束器包括立方体棱镜和四分之一波片，立方体棱镜由两块四面体棱镜构成，四分之一波片设置在所述四面体棱镜之间，所述四分之一波片通过光胶与所述四面体棱镜相贴合，所述四分之一波片与所述四面体棱镜之间的角度均为45°，四分之一波片连接有外控电压模块。本发明方法通过外控电压模块改变内嵌四分之一波片的折射率，实现偏振分光比的精确调节，从而实现控制两束出射光的分束比，最终获得满足一定需求的能量分光比可控的两束正交P‑偏振的纯态偏振光束输出，可以应用在空间领域，尤其是能够应用在偏振干涉测量以及偏振成像系统中。 | ||||||
| 6 | 一种同时测量高反镜S和P偏振光反射率的方法 | CN201310413019.4 | 2013-09-11 | CN103471815B | 2016-07-06 | 李斌成; 祖鸿宇; 韩艳玲 |
| 本发明涉及一种同时测量高反镜对S和P偏振光反射率的方法，将光强周期性调制的连续激光注入稳定初始谐振腔，由探测器探测衰荡信号，通过双指数拟合得到初始谐振腔内S和P偏振光的衰荡时间τ0S和τ0P，计算得到腔镜S和P偏振光的平均反射率R0S和R0P；同样，在初始光学谐振腔两腔镜间根据使用角度放入待测高反镜构成测试光学谐振腔，得到测试腔S和P偏振光的衰荡时间τ1S和τ1P，计算出待测高反镜对S和P偏振光的反射率RXS和RXP。本发明优点：避免了以往测量高反镜反射率未区分S和P偏振态所引起的误差，可以应用任意偏振特性的激光器测量待测高反镜对S和P偏振光的反射率，可以不用起偏器，测量装置简单，测量精度高。 | ||||||
| 7 | 一种同时测量高反镜S和P偏振光反射率的方法 | CN201310413019.4 | 2013-09-11 | CN103471815A | 2013-12-25 | 李斌成; 祖鸿宇; 韩艳玲 |
| 本发明涉及一种同时测量高反镜对S和P偏振光反射率的方法，将光强周期性调制的连续激光注入稳定初始谐振腔，由探测器探测衰荡信号，通过双指数拟合得到初始谐振腔内S和P偏振光的衰荡时间τ0S和τ0P，计算得到腔镜S和P偏振光的平均反射率R0S和R0P；同样，在初始光学谐振腔两腔镜间根据使用角度放入待测高反镜构成测试光学谐振腔，得到测试腔S和P偏振光的衰荡时间τ1S和τ1P，计算出待测高反镜对S和P偏振光的反射率RXS和RXP。本发明优点：避免了以往测量高反镜反射率未区分S和P偏振态所引起的误差，可以应用任意偏振特性的激光器测量待测高反镜对S和P偏振光的反射率，可以不用起偏器，测量装置简单，测量精度高。 | ||||||
| 8 | P偏振光增反膜、前挡玻璃及平视显示系统 | CN202322797011.4 | 2023-10-18 | CN220872694U | 2024-04-30 | 吕敬波; 顾豪栋; 于佩强; 王雪利 |
| 本申请公开了一种P偏振光增反膜、前挡玻璃及平视显示系统，P偏振光增反膜包括基材层；增反层，布置在所述基材层一面，包括沿背离所述基材层的方向依次设置的第一高折射率层、中折射率层、金属层、第二高折射率层和第三高折射率层；光学胶层布置在所述增反层背离所述基材层一面。本申请的P偏振光增反膜能够显著增大由第一高折射率层一面入射的P偏振光的反射率；在应用至前挡玻璃的内表面上时，在400～700nm的整个光谱范围内对62°入射角的P偏振光具有17.9％的平均反射率，能够有效增大前挡玻璃内表面对P偏振光的反射率，解决重影问题。 | ||||||
| 9 | 一种P-偏振光分束比可控的偏振分束器 | CN201620152359.5 | 2016-02-29 | CN205427340U | 2016-08-03 | 徐德刚; 严德贤; 王与烨; 钟凯; 闫超; 刘鹏翔; 石嘉; 姚建铨 |
| 本实用新型公开了一种P?偏振光分束比(即能量强度比值)可控的偏振分束器，该分束器包括立方体棱镜和四分之一波片，立方体棱镜由两块四面体棱镜构成，四分之一波片设置在所述四面体棱镜之间，所述四分之一波片通过光胶与所述四面体棱镜相贴合，所述四分之一波片与所述四面体棱镜之间的角度均为45°，四分之一波片连接有外控电压模块。本实用新型通过外控电压模块改变内嵌四分之一波片的折射率，实现偏振分光比的精确调节，从而实现控制两束出射光的分束比，最终获得满足一定需求的能量分光比可控的两束正交P?偏振的纯态偏振光束输出，可以应用在空间领域，尤其是能够应用在偏振干涉测量以及偏振成像系统中。 | ||||||
| 10 | 一种可实现p偏振光的全方位全透射的薄板结构 | CN201520598723.6 | 2015-08-10 | CN204832559U | 2015-12-02 | 郭炀; 黄成平 |
| 本实用新型提供了一种可实现p偏振光的全方位全透射的薄板结构。该薄板结构为弯曲透明的介质板，从点光源或线光源来的光到达介质板两个界面的任意点处都能以布儒斯特角入射。也就是说，通过设计介质板两个界面的形状曲线，使得光源发出的光到达第一个界面的任意点处，入射角都恰好等于布鲁斯特角。全透射的p偏振光到达第二个界面时，入射角同样也是相应的布鲁斯特角(两个界面的布鲁斯特角不同，两者互余)。本实用新型的结构不仅简单、优美，而且可实现p偏振光的全方位全透射，从而极大地抑制了光的反射损失。由于菲涅尔反射损耗的抑制，该结构可提高器件的通光效率，可用于灯罩、灯箱以及特定光学器件的设计和制作。 | ||||||
| 11 | 兼具偏振光轉換功能之高效率光源集光模組 A HIGH EFFICIENT LIGHT COLLECTING MODULE WITH P-S COVERSION | TW092109846 | 2003-04-24 | TW200422648A | 2004-11-01 | 王正 WANG, CHENG |
| 本發明係提供一兼具偏振光轉換功能之高效率光源集光模組。本模組包括一橢球燈、一反射罩、一反射型的偏振片、一半波長板。橢球燈之第二焦點與反射罩的焦點共點；而反射型的偏振片其偏極光反射面位於反射罩之焦點上，所以可將橢球燈所投射出來的光束之偏極性分開，即相同極性之光線在同一光束內。由於半波長板置於某一極性光束之前，而將此光束之極性轉換；且由於此架構可有效的減少反射罩的面積，使經由反射罩射出的光束，其面積、立體角均較一般常使用之聚光型燈源的面積、立體角為小；由此本架構即可達到兼具偏振光轉換功能之高效率光源集光模組。 | ||||||
| 12 | Image display device using P-polarized light and S-polarized light | US10575186 | 2004-10-07 | US07738179B2 | 2010-06-15 | Kenji Nishi |
| An image display device projects lights emitted from each of two two-dimensionally light emitting type photoelectric devices onto first and second light diffusing bodies, and projects and images transmitted images of the light diffusing bodies onto the retina in the respective eyeballs of the user. The display device includes one light source, a first polarization beam splitter dividing light emitted from the light source into P-polarized light and S-polarized light, and an optical system which leads each of the P-polarized light and S-polarized lights respectively to the two photoelectric devices thereby illuminating the two photoelectric devices. The optical system leads polarized light to each of the two photoelectric devices via a second polarization beam splitter and a λ/4 plate, and leads reflected lights to the relay optical system via the λ/4 plate and the second polarization beam splitter. | ||||||
| 13 | ｐ-i-n型円偏光変調発光半導体素子及びレーザ素子 | PCT/JP2006/301702 | 2006-01-26 | WO2006080548A1 | 2006-08-03 | 田中 健一郎; 宗片 比呂夫; 近藤 剛 |
非磁性半導体層からなる量子井戸構造と、該構造の障壁層に近接、又は、隣接して、バンドギャップの小さい磁性半導体層を備え、外部印加電圧により、円偏光度（右回りと左回り）を高速で変調して、円偏光を出力できることを特徴とするｐ−ｉ−ｎ型円偏光変調発光半導体素子。 |
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| 14 | Projection display device and optical system modulating separated P-polarized light and S-polarazed light | US12289943 | 2008-11-07 | US08251516B2 | 2012-08-28 | Makoto Yoshimura |
| An optical system attaining a nearly double resolving power in spite of one projector and also eliminating a convergence device is provided. The system includes an 1:1 relay lens in place of a projector lens of a RGB split-combine projection system, and a quarter-wave plate for P-S polarization separation. In operation, once-modulated RGB composite light is divided into a P-polarized light and a S-polarized light by a PS separation wire grid. The S-polarized light is modulated by a luminance signal Y1 at a Y1 device. The P-polarized light is modulated by a luminance signal Y2 at a Y2 device. The lights modulated by the Y1/Y2 devices are combined with each other at a PS composite wire grid to project a synthetic light on a screen. | ||||||
| 15 | 반도체 절연막의 불순물 농도 측정방법 | KR1020030038018 | 2003-06-12 | KR1020040107138A | 2004-12-20 | 김성수 |
| PURPOSE: A method of measuring impurity concentration of a semiconductor insulating layer is provided to measure exactly the concentration of boron regardless of the roughness of a backside of a wafer by preventing the reflection of incident light and minimizing the scattering of transmitted light using P-polarized light as the incident light and the Brewster's angle as an incident angle. CONSTITUTION: A silicon wafer with an insulating layer(2f) formed on its front surface is provided. A P-polarized IR(Infrared Ray) beam with the Brewster's angle is irradiated on a rear surface of the silicon wafer, so that the reflection of the IR beam is restrained. The IR beam is transmitted through the insulating layer and captured. At this time, impurity concentration of the insulating layer is measured according to the intensity of the transmitted IR beam. The insulating layer is made of a BPSG(BoroPhosphorSilicate Glass) film. | ||||||
| 16 | Bill or security discriminating apparatus using P-polarized and S-polarized light | US874761 | 1997-06-13 | US5892239A | 1999-04-06 | Mitsuhiro Nagase |
| A bill or security discriminating apparatus includes at least one irradiating device for irradiating a surface of a bill or security at a predetermined angle with the surface thereof, at least one polarization separating device for receiving light reflected by the surface of the bill or security and separating the received light into P-polarized light and S-polarized light, at least one first light detector for photoelectrically detecting the P-polarized light separated by the at least one polarization separating device and generating an electrical signal in accordance with intensity of the detected light, at least one second light detector for photoelectrically detecting the S-polarized light separated by the at least one polarization separating device and generating an electrical signal in accordance with intensity of the detected light, and a discriminator for discriminating the bill or security in accordance with the intensity of the P-polarized light and S-polarized light based on the electrical signals input from the at least one first light detector and the at least one second light detector. According to the thus constituted bill or security discriminating apparatus, it is possible to discriminate bills or securities with high accuracy even if they are damaged or wrinkled. | ||||||
| 17 | Photosensitive composition for volume hologram recording, p-polarized light diffraction type polarized light separation element, and liquid crystal volume hologram element | JP2010089853 | 2010-04-08 | JP2011221256A | 2011-11-04 | KURASHIGE MAKIO; TAKANOKURA TOMOE; ZHAO YING-JI |
| PROBLEM TO BE SOLVED: To provide a photosensitive composition for volume hologram recording that can be favorably used for a liquid crystal volume hologram element and a p-polarized light diffraction type polarized light separation element which are excellent in structural stability of recorded interference fringes, weatherability of material itself, and long-term reliability.SOLUTION: A photosensitive composition for volume hologram recording includes (A) a polypropylene glycol derivative with a specific structure, (B) a photopolymerizable siloxane, (C) a non-polymerizable liquid crystal compound, (D) a (meta) acrylic resin (E) a reaction initiator, and (F) a sensitizing dye. A p-polarized light diffraction type polarized light separation element has a hologram recording layer having a fixedly-shaped photosensitive composition for volume hologram recording which is interference exposed. A liquid crystal volume hologram element has a hologram recording layer having a photosensitive composition for volume hologram recording, encapsulated between transparent substrates with transparent electrodes thereon, which is interference exposed. | ||||||
| 18 | P-i-n-type circularly polarized light modulation light emitting element and laser element | JP2005020427 | 2005-01-27 | JP2006210626A | 2006-08-10 | TANAKA KENICHIRO; MUNEKATA HIROO; KONDO TAKESHI |
| PROBLEM TO BE SOLVED: To provide a circularly polarized modulation light emitting element which is capable of outputting circularly polarized light, modulating its circular degree of polarization (right-handed rotation and left-handed rotation) at a high speed by an externally applied voltage, and to provide a circularly polarized light emitting laser element whose resonant structure is configured on the structure of the above circularly polarized light emitting semiconductor element. SOLUTION: The p-i-n-type circularly polarized light modulating light emitting semiconductor element is equipped with a quantum well structure formed of a non-magnetic semiconductor layer, and a magnetic semiconductor layer which has a small band gap and is provided adjacent or adjoining to the barrier layer of the quantum well structure. COPYRIGHT: (C)2006,JPO&NCIPI | ||||||
| 19 | Surface inspection using the ratio of intensities of s- and p-polarized light components of a laser beam reflected a rough surface | US81924501 | 2001-03-28 | US6433877B2 | 2002-08-13 | WATANABE MASAO; OKUBO AKIKO |
| A surface inspection device irradiates a laser beam onto the surface of a sample, scans the surface two-dimensionally, and detects the intensities of the s-polarized light component and p-polarized light component of the reflected laser beam. RR (reflectance ratio), which is the ratio of the reflective intensities of the s- and p-polarized light components, is calculated for each position of the surface of the sample, and the two-dimensional distribution of RR on the surface of the sample is detected. The distribution width of this measured RR is compared with the natural width for a clean sample, and the surface of the sample is determined to be contaminated when, as the result of comparison, the RR distribution width diverges from the natural width. The absence or presence of contamination on the microscopically rough surface of a sample can therefore be quickly and easily determined based on the RR of the reflective intensities of the s- and p-polarized light components. | ||||||
| 20 | Surface inspection using the ratio of intensities of s—and p-polarized light components of a laser beam reflected a rough surface | US09820052 | 2001-03-28 | US06376852B2 | 2002-04-23 | Masao Watanabe; Akiko Okubo |
| A surface inspection device irradiates a laser beam onto the surface of a sample, scans the surface two-dimensionally, and detects the intensities of the s-polarized light component and p-polarized light component of the reflected laser beam. RR (reflectance ratio), which is the ratio of the reflective intensities of the s- and p-polarized light components, is calculated for each position of the surface of the sample, and the two-dimensional distribution of RR on the surface of the sample is detected. The distribution width of this measured RR is compared with the natural width for a clean sample, and the. surface of the sample is determined to be contaminated when, as the result of comparison, the RR distribution width diverges from the natural width. The absence or presence of contamination on the microscopically rough surface of a sample can therefore be quickly and easily determined based on the RR of the reflective intensities of the s- and p-polarized light components. | ||||||
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